Generations of Mobile Standards

3GPP TDocs (written contributions) at meeting

Meeting: R5-90-e - 2021-02-22 to 2021-03-05, Online

meeting id: R5-90-e (click id for more info on this meeting)

Click on the Tdoc to open its file.

TDoc Title Source Remarks
R5‑210000 Agenda - opening session WG Chairman imported from 3GU
R5‑210001 RAN5#90-e E-Meeting Timelines, Scope, Process WG Chairman imported from 3GU
R5‑210002 RAN5 Leadership Team WG Chairman imported from 3GU
R5‑210003 RAN5#89-e WG Minutes ETSI Secretariat imported from 3GU
R5‑210004 RAN5#89-e WG Action Points ETSI Secretariat imported from 3GU
R5‑210005 Latest RAN Plenary notes WG Chairman imported from 3GU
R5‑210006 Latest RAN Plenary draft Report WG Chairman imported from 3GU
R5‑210007 Post Plenary Active Work Item update ETSI Secretariat imported from 3GU
R5‑210008 RAN5 SR to RP#90-e WG Chairman imported from 3GU
R5‑210009 TF160 SR to RP#90-e WG Chairman imported from 3GU
R5‑210010 RAN5#90-e LS Template WG Chairman imported from 3GU
R5‑210011 Meeting schedule for 2021-22 WG Chairman imported from 3GU
R5‑210012 WI Progress and Target Completion Date Review WG Chairman imported from 3GU
R5‑210013 Review deadlines for next quarter WG Chairman imported from 3GU
R5‑210014 LS on nominal channel spacing calculation for two carriers at band n41 with 40MHz and 80MHz channel bandwidths TSG WG RAN4 imported from 3GU
R5‑210015 LS on OTA LTE UE TRP and TRS Requirements MSG TFES imported from 3GU
R5‑210016 Test methods for over-the-air TRP field measurements of unwanted emissions from IMT radio equipment utilizing active antennas ITU-R imported from 3GU
R5‑210017 LS on Use of Inclusive Language in 3GPP TSG SA imported from 3GU
R5‑210018 dummy LS1 ETSI Secretariat imported from 3GU
R5‑210019 dummy LS2 ETSI Secretariat imported from 3GU
R5‑210020 dummy LS3 ETSI Secretariat imported from 3GU
R5‑210021 dummy doc ETSI Secretariat imported from 3GU
R5‑210022 Correction to NR MAC test case 7.1.1.4.2.5 Keysight Technologies UK Ltd imported from 3GU
R5‑210023 Clean up editors note Anritsu imported from 3GU
R5‑210024 Correction to test cases 22.3.1.6a, 22.3.1.9 and 22.3.2.7 ROHDE & SCHWARZ imported from 3GU
R5‑210025 Update release applicability of RRC TC 8.1.1.2.4 NTT DOCOMO INC. imported from 3GU
R5‑210026 Addition of new 5GS NAS test case to test handling of extended octets NTT DOCOMO INC. imported from 3GU
R5‑210027 Update of test case 8.2.1.1.1 to support Inter-RAT handover from NR to EN-DC China Telecommunications imported from 3GU
R5‑210028 Update test case 8.1.5.1.1 to add UE capability nr-HO-ToEN-DC-r16 China Telecommunications imported from 3GU
R5‑210029 Addition of new MDT test case 8.1.6.1.2.1 ZTE Corporation imported from 3GU
R5‑210030 Addition of new MDT test case 8.1.6.1.2.2 ZTE Corporation imported from 3GU
R5‑210031 Addition of new MDT test case 8.1.6.1.2.3 ZTE Corporation imported from 3GU
R5‑210032 Addition of new MDT test case 8.1.6.1.2.4 ZTE Corporation imported from 3GU
R5‑210033 Addition of new MDT test case 8.1.6.1.2.5 ZTE Corporation imported from 3GU
R5‑210034 Addition of new MDT test case 8.1.6.1.2.6 ZTE Corporation imported from 3GU
R5‑210035 Addition of new MDT test case 8.1.6.1.2.7 ZTE Corporation imported from 3GU
R5‑210036 Addition of new MDT test case 8.1.6.1.2.8 ZTE Corporation imported from 3GU
R5‑210037 Addition of new MDT test case 8.1.6.1.2.9 ZTE Corporation imported from 3GU
R5‑210038 Addition of new MDT test case 8.1.6.1.2.10 ZTE Corporation imported from 3GU
R5‑210039 Addition of new MDT test case 8.1.6.1.2.11 ZTE Corporation imported from 3GU
R5‑210040 Addition of new MDT test case 8.1.6.1.2.12 ZTE Corporation imported from 3GU
R5‑210041 Addition of new MDT test case 8.1.6.1.2.13 ZTE Corporation imported from 3GU
R5‑210042 Editorial TC BT measurement collection in Immediate MDT to the correct subclause CMCC imported from 3GU
R5‑210043 Editorial TC BT measurement collection in Logged MDT to the correct subclause CMCC imported from 3GU
R5‑210044 Editorial TC BT measurement collection in RLF logging to the correct subclause CMCC imported from 3GU
R5‑210045 Editorial TC WLAN measurement collection in RLF logging to the correct subclause CMCC imported from 3GU
R5‑210046 Editorial TC BT measurement collection in CEF logging to the correct subclause CMCC imported from 3GU
R5‑210047 Editorial TC WLAN measurement collection in CEF logging to the correct subclause CMCC imported from 3GU
R5‑210048 Update of TC WLAN measurement collection in Immediate MDT for specific sys infos CMCC imported from 3GU
R5‑210049 Update of TC WLAN measurement collection in Logged MDT for specific sys infos CMCC imported from 3GU
R5‑210050 Update of LTE_MDT_BT_WLAN test cases for PICS definition CMCC imported from 3GU
R5‑210051 Corrections for support of multiple GPS signals Spirent Communications imported from 3GU
R5‑210052 Corrections for support of multiple signals in a GNSS Spirent Communications imported from 3GU
R5‑210053 Addition of support for BDS B1C signal Spirent Communications imported from 3GU
R5‑210054 Addition of support for BDS B1C signal Spirent Communications imported from 3GU
R5‑210055 Corrections to generic test procedures for IMS ROHDE & SCHWARZ imported from 3GU
R5‑210056 Corrections to A.5 on MT Voice Call ROHDE & SCHWARZ imported from 3GU
R5‑210057 Corrections to test case 6.3 ROHDE & SCHWARZ, Anritsu, Keysight, Qualcomm imported from 3GU
R5‑210058 Update Generic Test Procedure for IMS MO speech call Ericsson imported from 3GU
R5‑210059 Voiding A.1.9 ROHDE & SCHWARZ imported from 3GU
R5‑210060 Voiding generic procedures for text call ROHDE & SCHWARZ imported from 3GU
R5‑210061 Voiding SigComp test cases ROHDE & SCHWARZ imported from 3GU
R5‑210062 Correction to NR Idle mode test case 6.4.1.1 Keysight Technologies UK imported from 3GU
R5‑210063 Correction to NR MAC test case 7.1.1.8.1 Keysight Technologies UK imported from 3GU
R5‑210064 Correction to NR MAC test case 7.1.1.9.1 Keysight Technologies UK, Qualcomm imported from 3GU
R5‑210065 Correction to NR MAC test case 7.1.1.4.2.5 Keysight Technologies UK imported from 3GU
R5‑210066 Correction to NR5GC IRAT test case 8.1.4.2.1.1 Keysight Technologies UK imported from 3GU
R5‑210067 Correction of NR RRC test case 8.1.4.1.5 Keysight Technologies UK imported from 3GU
R5‑210068 Correction to NR CA testcases 8.2.4.1.1.x Keysight Technologies UK imported from 3GU
R5‑210069 Correction to Table 4.5.2.2-4: NR RRC_IDLE Extension Keysight Technologies UK imported from 3GU
R5‑210070 Correction to generic procedure for UE-requested PDU session modification after S1 to N1 change Keysight Technologies UK imported from 3GU
R5‑210071 Correction to emergency bearer service over S1 for eCall test cases Keysight Technologies UK, Qualcomm imported from 3GU
R5‑210072 Addition of IMS over 5GS test case 7.25 ROHDE & SCHWARZ imported from 3GU
R5‑210073 Addition of new test case 9.6.1.1_A.6 DEKRA imported from 3GU
R5‑210074 Addition of new test case 9.6.1.2_A.6 DEKRA imported from 3GU
R5‑210075 Addition of new test case 9.1.72 DEKRA imported from 3GU
R5‑210076 Addition of new test case 9.2.59 DEKRA imported from 3GU
R5‑210077 Update of EN-DC inter-band configurations in clause 4.3.1 China Telecommunications imported from 3GU
R5‑210078 Update of UE capabilities for EN-DC configurations China Telecommunications imported from 3GU
R5‑210079 Addition of applicabilities for new IMS over 5GS test cases ROHDE & SCHWARZ imported from 3GU
R5‑210080 New WID on UE Conformance Test Aspects for NR RF Requirement Enhancements for FR2 Nokia, Nokia Shanghai Bell imported from 3GU
R5‑210081 Introduction of Additional capabilities for NR Band n53 Nokia, Nokia Shanghai Bell imported from 3GU
R5‑210082 Introduction of FR2 DL 256QAM Nokia, Nokia Shanghai Bell imported from 3GU
R5‑210083 Conclusion of some Rel-16 inter-band EN-DC configurations Nokia, Nokia Shanghai Bell imported from 3GU
R5‑210084 Introduction of spurious emission TP analysis for Rel-16 EN-DC configuration DC_7A_n3A Nokia, Nokia Shanghai Bell imported from 3GU
R5‑210085 Introduction of spurious emission TP analysis for Rel-16 EN-DC configuration DC_8A_n3A Nokia, Nokia Shanghai Bell imported from 3GU
R5‑210086 Introduction of spurious emission TP analysis for Rel-16 EN-DC configuration DC_20A_n1A Nokia, Nokia Shanghai Bell imported from 3GU
R5‑210087 Introduction of Rel-16 EN-DC configuration DC_7A_n3A to spurious emission test case 6.5B.3.3.2 Nokia, Nokia Shanghai Bell imported from 3GU
R5‑210088 Introduction of Rel-16 EN-DC configuration DC_8A_n3A to spurious emission test case 6.5B.3.3.2 Nokia, Nokia Shanghai Bell imported from 3GU
R5‑210089 Introduction of Rel-16 EN-DC configuration DC_20A_n1A to spurious emission test case 6.5B.3.3.2 Nokia, Nokia Shanghai Bell imported from 3GU
R5‑210090 Updated TP analysis for 7.3B Reference sensitivity for EN-DC in FR1 Nokia, Nokia Shanghai Bell imported from 3GU
R5‑210091 Introduction of DC_7A_n3A to reference sensitivity test Nokia, Nokia Shanghai Bell imported from 3GU
R5‑210092 Introduction of DC_8A_n1A and DC_8A_n3A to reference sensitivity test Nokia, Nokia Shanghai Bell imported from 3GU
R5‑210093 Introduction of DC_7A-20A_n3A to reference sensitivity test Nokia, Nokia Shanghai Bell imported from 3GU
R5‑210094 Corrections and extensions to applicability statements of IMS over 5GS test cases ROHDE & SCHWARZ imported from 3GU
R5‑210095 Corrections to test case 6.4 ROHDE & SCHWARZ imported from 3GU
R5‑210096 SR - Rel-16 IIOT after RAN5#90-e CMCC imported from 3GU
R5‑210097 WP - Rel-16 IIOT after RAN5#90-e CMCC imported from 3GU
R5‑210098 SR - NR_Rel-16_CA_DC after RAN5#90-e CMCC imported from 3GU
R5‑210099 WP - NR_Rel-16_CA_DC after RAN5#90-e CMCC imported from 3GU
R5‑210100 Checklist - NR_Rel-16_CA_DC for RAN5#89-e CMCC, BV imported from 3GU
R5‑210101 SR - Rel-16 HST after RAN5#90-e CMCC imported from 3GU
R5‑210102 WP - Rel-16 HST after RAN5#90-e CMCC imported from 3GU
R5‑210103 Revised WID on UE Conformance Test Aspects for NR HST CMCC imported from 3GU
R5‑210104 New WID on UE Conformance Test Aspects for Enhancement of Network Slicing China Mobile, China Telecom, China Unicom imported from 3GU
R5‑210105 New SID on 5G NR UE supporting Network Slicing Conformance Testing China Mobile, China Unicom imported from 3GU
R5‑210106 New Study Item on 5G NR UE supporting Network Slicing Conformance Testing CMCC imported from 3GU
R5‑210107 5G Smart Devices Supporting Network Slicing CMCC imported from 3GU
R5‑210108 Addition of Abbreviations and References for R16 NR HST in 3.3 and References CMCC imported from 3GU
R5‑210109 Addition of Applicability of different requirements for R16 NR HST in 5.1.1.7 CMCC imported from 3GU
R5‑210110 Addition of HST-DPS Channel Profile in B.3.3 CMCC imported from 3GU
R5‑210111 Addition of HST-SFN Channel Profile in B.3.2 CMCC imported from 3GU
R5‑210112 Update of Applicability of requirements for mandatory UE features with capability signalling for R16 NR HST in 5.1.1.4 CMCC imported from 3GU
R5‑210113 Update of Applicability of requirements for optional UE features for R16 NR HST in 5.1.1.3 CMCC imported from 3GU
R5‑210114 Update of Combinations of channel model parameters for R16 NR HST in B.2.2 CMCC imported from 3GU
R5‑210115 Update of Reference measurement channels for PDSCH performance requirements for R16 NR HST in A.3.2 CMCC imported from 3GU
R5‑210116 Update of Single Tap Channel Profile for R16 NR HST in B.3.1 CMCC imported from 3GU
R5‑210117 Editorial addition of editor’s notes in 6.3B.8.1.4, 6.3B.8.2.4 and 6.3B.8.3.4 CMCC imported from 3GU
R5‑210118 Addition of IMS over 5GS test case 7.27 ZTE Corporation imported from 3GU
R5‑210119 Addition of IMS over 5GS test case 7.28 ZTE Corporation imported from 3GU
R5‑210120 Addition of IMS over 5GS test case 7.29 ZTE Corporation imported from 3GU
R5‑210121 Addition of IMS over 5GS test case 7.30 ZTE Corporation imported from 3GU
R5‑210122 Addition of IMS over 5GS test case 7.31 ZTE Corporation imported from 3GU
R5‑210123 Addition of IMS over 5GS test case 7.32 ZTE Corporation imported from 3GU
R5‑210124 Addition of IMS over 5GS test case 7.33 ZTE Corporation imported from 3GU
R5‑210125 Addition of IMS over 5GS test case 7.34 ZTE Corporation imported from 3GU
R5‑210126 SR - NR_SON_MDT-UEConTest after RAN5#90-e CMCC, Ericsson imported from 3GU
R5‑210127 WP - NR_SON_MDT-UEConTest after RAN5#90-e CMCC, Ericsson imported from 3GU
R5‑210128 Addition of new test case 8.1.6.1.1.1 for NR Immediate MDT CMCC imported from 3GU
R5‑210129 Addition of new test case 8.1.6.1.1.2 for NR L2 measurement CMCC imported from 3GU
R5‑210130 Applicability statement for new test cases for NR Immediate MDT CMCC imported from 3GU
R5‑210131 Correction of NR CA TC 8.1.4.1.7.x MediaTek Inc., Keysight Technologies imported from 3GU
R5‑210132 Correction of NR CA TC 8.1.4.1.9.x MediaTek Inc., Keysight Technologies imported from 3GU
R5‑210133 Update of power level tables for Multilayer EPSFB TC 11.1.x MediaTek Inc. imported from 3GU
R5‑210134 Update of first preamble power for EN-DC TC 4.3.2.2.1 and 4.3.2.2.2 MediaTek Inc. imported from 3GU
R5‑210135 Update of first preamble power for SA TC 6.3.2.2.1 and 6.3.2.2.2 MediaTek Inc. imported from 3GU
R5‑210136 Update of UE initial state for SA RLM TC 6.5.1.x MediaTek Inc. imported from 3GU
R5‑210137 Update of process delay for SFTD measurement TC 8.4.1.x MediaTek Inc. imported from 3GU
R5‑210138 Update of cell frequency for TC 6.7.2.2.2 MediaTek Inc. imported from 3GU
R5‑210139 PRD-17 on Guidance to Work Item Codes (post RAN#91-e version) Samsung (Rapporteur) imported from 3GU
R5‑210140 TS 36.523-1 Tracker status before RAN5#90-e Samsung (Rapporteur) imported from 3GU
R5‑210141 TS 36.523-1 Tracker status after RAN5#90-e Samsung (Rapporteur) imported from 3GU
R5‑210142 Editorial updates of TS 36.523-1 Section 6 Samsung imported from 3GU
R5‑210143 Editorial updates of TS 36.523-1 Section 7.1 Samsung imported from 3GU
R5‑210144 Editorial updates of TS 36.523-1 Sections 8.1 and 8.2 Samsung imported from 3GU
R5‑210145 Editorial updates of TS 36.523-1 Section 8.3 Samsung imported from 3GU
R5‑210146 Editorial updates of TS 36.523-1 Section 8.4 Samsung imported from 3GU
R5‑210147 Editorial updates of TS 36.523-1 Section 9 Samsung imported from 3GU
R5‑210148 Editorial updates of TS 36.523-1 Sections 10 to 13 Samsung imported from 3GU
R5‑210149 Editorial updates of TS 36.523-1 Sections 15, 17 and 19 Samsung imported from 3GU
R5‑210150 Editorial updates of TS 36.523-1 Sections 22 and 24 Samsung imported from 3GU
R5‑210151 Aligning content of 36.523-2 with 36.523-1 Samsung imported from 3GU
R5‑210152 Adding missing applicability for TC 8.2.2.14.1 Samsung imported from 3GU
R5‑210153 Update to TC 13.1.22 MCPTT / Attach / Call setup CO Samsung imported from 3GU
R5‑210154 Adding applicability for TC 13.1.22 MCPTT / Attach / Call setup CO Samsung imported from 3GU
R5‑210155 TS 38.523-1 Tracker status before RAN5#90-e Samsung (Rapporteur) imported from 3GU
R5‑210156 TS 36.523-1 Tracker status after RAN5#90-e Samsung (Rapporteur) imported from 3GU
R5‑210157 Editorial changes to 38.523-1 Section 6 Samsung imported from 3GU
R5‑210158 Editorial changes to 38.523-1 Section 7 Samsung imported from 3GU
R5‑210159 Editorial changes to 38.523-1 Section 8 Samsung imported from 3GU
R5‑210160 Editorial changes to 38.523-1 Sections 9-12 Samsung imported from 3GU
R5‑210161 Aligning content of 38.523-2 with 38.523-1 Samsung imported from 3GU
R5‑210162 Adding missing applicability for TC 6.1.2.7 and 8.1.5.2.2 Samsung imported from 3GU
R5‑210163 Update of TC for IMS emergency TC 11.4.10 5GMM-REGISTERED.NORMAL-SERVICE N26 interface not supported N1 to S1 Samsung imported from 3GU
R5‑210164 Update to indication of Max nr cells in emergency test cases being active during test execution Samsung imported from 3GU
R5‑210165 Introduction of new IMS emergency TC 11.4.11 5GMM-REGISTERED.NORMAL-SERVICE N26 interface not supported S1 to N1 Samsung imported from 3GU
R5‑210166 Adding applicability for new IMS emergency TC 11.4.11 Samsung imported from 3GU
R5‑210167 MR-DC Ericsson imported from 3GU
R5‑210168 New RAN5 PRD-19 on RAN5 WP Template Samsung, Ericsson imported from 3GU
R5‑210169 Addition of TC 7.3A.0.3.2.4 RIB,c for four bands CMCC imported from 3GU
R5‑210170 Update of TC 7.7A.3 CMCC imported from 3GU
R5‑210171 Editorial update of SS-RSRP for TC 6.7.1.2.1 MediaTek Inc. imported from 3GU
R5‑210172 Update of RRC message for TC 6.3.1.4, 6.3.1.5 and 6.3.2.3.2 MediaTek Inc. imported from 3GU
R5‑210173 Update of RRC message for TC 6.4.3.1 and 6.5.2.1 MediaTek Inc. imported from 3GU
R5‑210174 Update of Scell activation and CSI reporting time for EN-DC TC 4.5.3.1 MediaTek Inc. imported from 3GU
R5‑210175 Update of CSI reporting time for SA TC 6.5.3.1 MediaTek Inc. imported from 3GU
R5‑210176 Update of Scell activation and CSI reporting time for EN-DC TC 5.5.3.1 MediaTek Inc. imported from 3GU
R5‑210177 Update of CSI reporting time for SA TC 7.5.3.1 and 7.5.3.2 MediaTek Inc. imported from 3GU
R5‑210178 Update of PRACH configuration for SA TC 7.3.2.2.2 MediaTek Inc. imported from 3GU
R5‑210179 Update of PRACH configuration for EN-DC TC 4.5.5.3 and 4.5.5.4 MediaTek Inc. imported from 3GU
R5‑210180 Update of PRACH configuration for EN-DC TC 5.5.5.x MediaTek Inc. imported from 3GU
R5‑210181 Update of PRACH configuration for SA TC 6.5.5.3 and 6.5.5.4 MediaTek Inc. imported from 3GU
R5‑210182 Update of PRACH configuration for SA TC 7.5.5.x MediaTek Inc. imported from 3GU
R5‑210183 Update of prach-ConfigurationIndex for FR1 PRACH configuration 4 in A.7 MediaTek Inc. imported from 3GU
R5‑210184 Update of applicability for RRC TC 8.1.3.1.21 and 8.1.4.2.1.2 MediaTek Inc. imported from 3GU
R5‑210185 SST and NG.116 Ericsson imported from 3GU
R5‑210186 Update global conditions Ericsson imported from 3GU
R5‑210187 Editorial update IE PhysicalCellGroupConfig Ericsson imported from 3GU
R5‑210188 New References ZTE Corporation imported from 3GU
R5‑210189 Update test case 7.4, 7.5, 7.6 and 7.7 ZTE Corporation imported from 3GU
R5‑210190 Update of 5G-NR test cases applicability Qualcomm Incorporated imported from 3GU
R5‑210191 Correction of NR test case 9.1.5.1.8 Qualcomm Incorporated, ANRITSU LTD imported from 3GU
R5‑210192 MCC TF160 Status Report MCC TF160 imported from 3GU
R5‑210193 RAN5 PRD12 version 6.5 MCC TF160 imported from 3GU
R5‑210194 Correction to test procedure 4.9.7 MCC TF160 imported from 3GU
R5‑210195 Corrections to test procedure 4.9.19 MCC TF160 imported from 3GU
R5‑210196 Corrections to SMS test case 9.5 MCC TF160 imported from 3GU
R5‑210197 Corrections to RLC test case 7.1.2.3.8 MCC TF160 imported from 3GU
R5‑210198 Corrections to test case 11.3.1 MCC TF160 imported from 3GU
R5‑210199 5G Test Models updates MCC TF160 imported from 3GU
R5‑210200 Corrections to test case 8.1.4.2.1.2 MCC TF160 imported from 3GU
R5‑210201 MCPTT Packet Filter MCC TF160 imported from 3GU
R5‑210202 Corrections to SMS test case 18.b1, Annexes A.7.2 and A.7.8 MCC TF160 imported from 3GU
R5‑210203 Routine maintenance for TS 34.229-3 MCC TF160 imported from 3GU
R5‑210204 Addition of a generic procedure for MCPTT radio bearer establishment for use of pre-established session MCC TF160 imported from 3GU
R5‑210205 Correction to Generic Test Procedure for MCPTT CT group call establishment, manual commencement MCC TF160 imported from 3GU
R5‑210206 Correction to generic test procedure for MCPTT pre-established session establishment MCC TF160 imported from 3GU
R5‑210207 New MCPTT generic test procedures MCC TF160, NIST, UPV/EHU, Nemergent Solutions imported from 3GU
R5‑210208 Update to Default HTTP message - POST MCC TF160 imported from 3GU
R5‑210209 Update to Default Message Content - Floor Ack, Connect, Disconnect, Acknowledge MCC TF160 imported from 3GU
R5‑210210 Update to Default Message Content - INVITE MCC TF160 imported from 3GU
R5‑210211 Update to Default Message Content - Pidf MCC TF160 imported from 3GU
R5‑210212 Update to Default Message Content - REFER and Resource-List MCC TF160 imported from 3GU
R5‑210213 Update to Default Message Content - SDP MCC TF160 imported from 3GU
R5‑210214 Update to Default Message Content - SIP 200 (OK) MCC TF160 imported from 3GU
R5‑210215 Update to Default Message Content - UPDATE MCC TF160 imported from 3GU
R5‑210216 Update to Default Message Content AFFILIATION-COMMAND MCC TF160 imported from 3GU
R5‑210217 Update to Default Message Content MIKEY-SAKKE I_MESSAGE MCC TF160 imported from 3GU
R5‑210218 Update to Default Message Content SIP 180 (Ringing) and SIP 183 (Session progress) MCC TF160 imported from 3GU
R5‑210219 Update to Default Message Content SIP MESSAGE MCC TF160 imported from 3GU
R5‑210220 Update to Default Message Content SUBSCRIBE MCC TF160 imported from 3GU
R5‑210221 Update to the MCS GKTP document MCC TF160 imported from 3GU
R5‑210222 Correction to MCPTT Test Case 5.1 MCC TF160 imported from 3GU
R5‑210223 Correction to MCPTT Test Case 5.3 MCC TF160 imported from 3GU
R5‑210224 Correction to MCPTT Test Case 5.4 MCC TF160 imported from 3GU
R5‑210225 Correction to MCPTT Test Case 6.1.1.1 MCC TF160 imported from 3GU
R5‑210226 Correction to MCPTT Test Case 6.1.1.10 MCC TF160, NIST, UPV/EHU, Nemergent Solutions imported from 3GU
R5‑210227 Correction to MCPTT Test Case 6.1.1.11 MCC TF160 imported from 3GU
R5‑210228 Correction to MCPTT Test Case 6.1.1.12 MCC TF160 imported from 3GU
R5‑210229 Correction to MCPTT Test Case 6.1.1.13 MCC TF160 imported from 3GU
R5‑210230 Correction to MCPTT Test Case 6.1.1.14 MCC TF160 imported from 3GU
R5‑210231 Correction to MCPTT Test Case 6.1.1.2 MCC TF160 imported from 3GU
R5‑210232 Correction to MCPTT Test Case 6.1.1.3 MCC TF160 imported from 3GU
R5‑210233 Correction to MCPTT Test Case 6.1.1.5 MCC TF160 imported from 3GU
R5‑210234 Correction to MCPTT Test Case 6.1.1.8 MCC TF160 imported from 3GU
R5‑210235 Correction to MCPTT Test Case 6.1.1.9 MCC TF160 imported from 3GU
R5‑210236 Correction to MCPTT Test Case 6.1.2.10 MCC TF160 imported from 3GU
R5‑210237 Correction to MCPTT Test Case 6.1.2.11 MCC TF160 imported from 3GU
R5‑210238 Correction to MCPTT Test Case 6.1.2.12 MCC TF160 imported from 3GU
R5‑210239 Correction to MCPTT Test Case 6.1.2.7 MCC TF160 imported from 3GU
R5‑210240 Correction to MCPTT Test Case 6.1.2.8 MCC TF160 imported from 3GU
R5‑210241 Correction to MCPTT Test Case 6.1.2.9 MCC TF160 imported from 3GU
R5‑210242 Correction to MCPTT Test Case 6.2.1 MCC TF160 imported from 3GU
R5‑210243 Correction to MCPTT Test Case 6.2.14 MCC TF160 imported from 3GU
R5‑210244 Correction to MCPTT Test Case 6.2.15 MCC TF160 imported from 3GU
R5‑210245 Correction to MCPTT Test Case 6.2.16 MCC TF160 imported from 3GU
R5‑210246 Correction to MCPTT Test Case 6.2.17 MCC TF160 imported from 3GU
R5‑210247 Correction to MCPTT Test Case 6.2.2 MCC TF160 imported from 3GU
R5‑210248 Correction to MCPTT Test Case 6.2.3 MCC TF160 imported from 3GU
R5‑210249 Correction to MCPTT Test Case 6.2.4 MCC TF160 imported from 3GU
R5‑210250 Correction to MCPTT Test Case 6.2.5 MCC TF160 imported from 3GU
R5‑210251 Correction to MCPTT Test Case 6.2.6 MCC TF160 imported from 3GU
R5‑210252 Correction to MCPTT Test Case 6.2.7 MCC TF160 imported from 3GU
R5‑210253 Correction to MCPTT Test Case 6.2.8 MCC TF160 imported from 3GU
R5‑210254 Addition of missing MCX PICS MCC TF160 imported from 3GU
R5‑210255 Routine maintenance for TS 36.579-5 MCC TF160 imported from 3GU
R5‑210256 Handling of optional KMS request security MCC TF160 imported from 3GU
R5‑210257 Issues with pre-established sessions MCC TF160 imported from 3GU
R5‑210258 Definition of values for epdu fields PCTEST Engineering Laboratory imported from 3GU
R5‑210259 Corrections to A.11 ROHDE & SCHWARZ imported from 3GU
R5‑210260 Corrections and clarifications to default MBS, WLAN and Sensor assistance data in clause 5.4.1 PCTEST Engineering Laboratory imported from 3GU
R5‑210261 Deletion of PICS for wlan-AP-Identifier PCTEST Engineering Laboratory imported from 3GU
R5‑210262 Add support for new CA combos to Table 7.4A.8.4.1-1 and Table 7.4A.8.4.2-1 C Spire Wireless imported from 3GU
R5‑210263 Editorial update IE PhysicalCellGroupConfig Ericsson imported from 3GU
R5‑210264 Update IE FailureInformation Ericsson imported from 3GU
R5‑210265 Addition of NR-DC RRC TC 8.2.5.3.2 Qualcomm CDMA Technologies imported from 3GU
R5‑210266 Addition of NR-DC RRC TC 8.2.5.4.2 Qualcomm CDMA Technologies imported from 3GU
R5‑210267 Correction to 5GC NAS TC 9.1.5.2.9 Qualcomm CDMA Technologies imported from 3GU
R5‑210268 Correction to EPS Fallback Test Case 11.1.1 Qualcomm CDMA Technologies imported from 3GU
R5‑210269 Correction to procedure EPS Fallback for Voice Call Qualcomm CDMA Technologies imported from 3GU
R5‑210270 Correction to IMS over 5GS TC 6.2 Qualcomm CDMA Technologies imported from 3GU
R5‑210271 Correction to IMS over 5GS TC 7.2 Qualcomm CDMA Technologies imported from 3GU
R5‑210272 Correction to IMS over 5GS TC 7.11 Qualcomm CDMA Technologies imported from 3GU
R5‑210273 WP UE Conformance Test Aspects - Rel-16 Private Network Support for NG-RAN Qualcomm CDMA Technologies imported from 3GU
R5‑210274 SR UE Conformance Test Aspects - Rel-16 Private Network Support for NG-RAN Qualcomm CDMA Technologies imported from 3GU
R5‑210275 WP UE Conformance Test Aspects - Rel-16 Optimisations on UE radio capability signalling – NR/E-UTRA Qualcomm CDMA Technologies imported from 3GU
R5‑210276 SR UE Conformance Test Aspects - Rel-16 Optimisations on UE radio capability signalling – NR/E-UTRA Qualcomm CDMA Technologies imported from 3GU
R5‑210277 Discussion paper for RRC Segmentation in Rel-16 RACS Qualcomm CDMA Technologies imported from 3GU
R5‑210278 Revised WID - Rel-16 Optimisations on UE radio capability signalling – NR/E-UTRA Qualcomm CDMA Technologies imported from 3GU
R5‑210279 Addition of minimum conformance requirements for R16 NR HST cell re-selection in 6.1.1.0 CMCC imported from 3GU
R5‑210280 Addtion of new test case 6.1.1.7 for R16 NR HST CMCC imported from 3GU
R5‑210281 Addition of minimum conformance requirements for R16 NR HST measurement in 6.6.1.0 CMCC imported from 3GU
R5‑210282 Addtion of new test case 6.6.1.7 for R16 NR HST CMCC imported from 3GU
R5‑210283 Update of Annex H.2.1-3 for R16 NR HST CMCC imported from 3GU
R5‑210284 Addtion of cell configuration mapping in Annex E for R16 NR HST CMCC imported from 3GU
R5‑210285 Addition of common ICS in A.4.3.11 for Rel-16 HST CMCC imported from 3GU
R5‑210286 Discussion about n259 OBW relaxation DOCOMO Communications Lab. imported from 3GU
R5‑210287 Revised WID on UE Conformance Test Aspects for SON and MDT support for NR CMCC, Ericsson imported from 3GU
R5‑210288 Introduction of definition of common environment for R16 NR Immediate MDT CMCC, ZTE imported from 3GU
R5‑210289 Introduction of common implementation conformance statements for R16 NR SON and MDT CMCC, ZTE imported from 3GU
R5‑210290 Clarification of uplink power measurement uncertainty in test case 6.3.4.3 Keysight Technologies UK Ltd imported from 3GU
R5‑210291 Message exceptions definition in test case 6.2.2 Keysight Technologies UK Ltd imported from 3GU
R5‑210292 Clarifications for ON/OFF time mask for UL MIMO test case Keysight Technologies UK Ltd imported from 3GU
R5‑210293 New FR2 Common Uplink Configurations definition in section 6 Keysight Technologies UK Ltd imported from 3GU
R5‑210294 ACS FR2 test case update Keysight Technologies UK Ltd imported from 3GU
R5‑210295 IBB FR2 test case update Keysight Technologies UK Ltd imported from 3GU
R5‑210296 MU and TT definition for REFSENS FR2 CA test cases Keysight Technologies UK Ltd imported from 3GU
R5‑210297 Editorial corrections in Occupied bandwidth test procedure Keysight Technologies UK Ltd imported from 3GU
R5‑210298 Spectrum emissions mask for intra-band non-contiguous EN-DC Test Definition Keysight Technologies UK Ltd imported from 3GU
R5‑210299 Correction of LTE frequency for 19-n79 combo in 7.3B.2.3 Keysight Technologies UK Ltd imported from 3GU
R5‑210300 Correction in Refsens test case 7.3B.2.3_1.1 for DC_1A-7A_n78A combo Keysight Technologies UK Ltd, Ericsson imported from 3GU
R5‑210301 Completion of OBW intra-band non-contiguous test 6.5B.1.2 Keysight Technologies UK Ltd imported from 3GU
R5‑210302 Addition of new test case 6.5B.1.4D OBW for inter-band EN-DC FR2 UL MIMO Keysight Technologies UK Ltd imported from 3GU
R5‑210303 ACLR for intra-band non-contiguous EN-DC Test Definition Keysight Technologies UK Ltd imported from 3GU
R5‑210304 Updates on configured Output Power Level for EN-DC test cases 6.2B.4.1.1.x Keysight Technologies UK Ltd imported from 3GU
R5‑210305 MU definition for UE MOP for Inter-Band EN-DC including FR2 (3CCs) Keysight Technologies UK Ltd imported from 3GU
R5‑210306 MU and TT defintion for REFSENS EN-DC including FR2 up to 5CCs Keysight Technologies UK Ltd imported from 3GU
R5‑210307 Adjacent Channel Selectivity FR2 MU definition in 38.903 Keysight Technologies UK Ltd imported from 3GU
R5‑210308 In-band Blocking FR2 MU definition in 38.903 Keysight Technologies UK Ltd imported from 3GU
R5‑210309 TP analysis for 38.521-3 test case 6.5B.2.2.1 SEM Intra-band non-contiguous Keysight Technologies UK Ltd imported from 3GU
R5‑210310 TP analysis for 38.521-3 test case 6.5B.2.2.3 ACLR Intra-band non-contiguous Keysight Technologies UK Ltd imported from 3GU
R5‑210311 On ACS and IBB FR2 MU definition Keysight Technologies UK Ltd imported from 3GU
R5‑210312 On minimum requirements for Transmit ON/OFF time mask in UL MIMO FR1 Keysight Technologies UK Ltd imported from 3GU
R5‑210313 LS on minimum requirements for Transmit ON/OFF time mask in UL MIMO FR1 Keysight Technologies UK Ltd imported from 3GU
R5‑210314 Updating Contents of RRC messages for Logged MDT test cases ZTE Corporation, CMCC imported from 3GU
R5‑210315 Adding applicability for new logged MDT test cases ZTE Corporation, CMCC imported from 3GU
R5‑210316 Updae UE Positioning test mode procedures and UE Positioning messages ZTE Corporation imported from 3GU
R5‑210317 Discussion paper on IMS over 5GS test case 7.3 regarding flexible use of preconditions ROHDE & SCHWARZ imported from 3GU
R5‑210318 Correction to E-UTRA link setup for NSA testing ROHDE & SCHWARZ imported from 3GU
R5‑210319 Update to references clause MCC TF160 imported from 3GU
R5‑210320 Correction to NR Idle mode test cases Keysight Technologies UK imported from 3GU
R5‑210321 Correction to UL-SCH TBS selection test cases common clause 7.1.1.4.2.0 Keysight Technologies UK imported from 3GU
R5‑210322 Correction to 5GMM Initial Registration test cases Keysight Technologies UK imported from 3GU
R5‑210323 Correction to annexure A.3.1 Keysight Technologies UK, MCC TF160 imported from 3GU
R5‑210324 Clarification of conditions used in INVITE for eCall setup Keysight Technologies UK, MCC TF160 imported from 3GU
R5‑210325 Editorial update IE DLDedicatedMessageSegment Ericsson imported from 3GU
R5‑210326 Editorial update DLDedicatedMessageSegment message Ericsson imported from 3GU
R5‑210327 Update FailureInformation message Ericsson imported from 3GU
R5‑210328 Editorial update RRCReconfiguration message Ericsson imported from 3GU
R5‑210329 Addition of UE power saving test case 7.1.1.12.2 CATT imported from 3GU
R5‑210330 Addition of new test cases 7.1.1.12.4, 7.1.1.12.5 and 7.1.1.12.6 for UE power saving in NR CATT imported from 3GU
R5‑210331 Adding scell dormancy indication outside active time to physical layer baseline implementation capabilities CATT imported from 3GU
R5‑210332 Addition of test applicabilities for UE power saving in NR CATT imported from 3GU
R5‑210333 Correction test purpose to MAC test case 7.1.1.12.1 CATT imported from 3GU
R5‑210334 Work plan: UE Conformance Test Aspects for NR Positioning Support CATT imported from 3GU
R5‑210335 SR UE Conformance Test Aspects - NR Positioning Support CATT imported from 3GU
R5‑210336 Work plan: B1C Signal in BDS Positioning System Support for LTE and NR CATT imported from 3GU
R5‑210337 SR UE Conformance Test Aspects - B1C Signal in BDS Positioning System Support for LTE and NR CATT imported from 3GU
R5‑210338 Work plan: UE Conformance Test Aspects – UE power saving in NR CATT imported from 3GU
R5‑210339 SR UE Conformance Test Aspects - UE power saving in NR CATT imported from 3GU
R5‑210340 WP UE Conformance Test Aspects – Further NB-IoT enhancements CATT imported from 3GU
R5‑210341 SR UE Conformance Test Aspects - Further NB-IoT enhancements CATT imported from 3GU
R5‑210342 Correction to NB-IoT Common contents of system information messages CATT, TDIA imported from 3GU
R5‑210343 Corrections and extensions to test case 7.4 ROHDE & SCHWARZ imported from 3GU
R5‑210344 Introduction of a new test case for voice fallback indication under EPS Fallback with handover CATT, TDIA imported from 3GU
R5‑210345 Update to applicabilities for the EPS fallback test cases CATT, TDIA imported from 3GU
R5‑210346 Adding NG.114 dependencies and PICS for test case 7.4 ROHDE & SCHWARZ imported from 3GU
R5‑210347 Adding NG.114 dependencies to Annex A.2.1 ROHDE & SCHWARZ imported from 3GU
R5‑210348 Adding NG.114 dependencies to Annex A.4 ROHDE & SCHWARZ imported from 3GU
R5‑210349 Addition of 3 band EN-DC Test Frequency (DC_1A-8A_n78A, DC_3A-8A_n78A) KT Corp. imported from 3GU
R5‑210350 Addition of 4 band EN-DC Test Frequency (DC_1A-3A-8A_n78A) KT Corp. imported from 3GU
R5‑210351 Correction of MSD test point on Table 7.3B.2.0.3.5.2-1 (DC_1A-8A_n78A) KT Corp. imported from 3GU
R5‑210352 Update of 7.3B.2.3_1.1 RefSens(DC_3A-8A_n78A) KT Corp. imported from 3GU
R5‑210353 Update of Table A.4.3.2B.2.3.2-2 (DC_1A-8A_n78A, DC_3A-8A_n78A) KT Corp. imported from 3GU
R5‑210354 Update of Table A.4.3.2B.2.3.3-2 (DC_1A-3A-8A_n78A) KT Corp. imported from 3GU
R5‑210355 Guidelines on test execution for bands n14 and n53 MCC TF160 imported from 3GU
R5‑210356 Corrections to test case 11.3.1 ROHDE & SCHWARZ, MCC TF160 imported from 3GU
R5‑210357 Editorial corrections to TS 34.229-5 ROHDE & SCHWARZ imported from 3GU
R5‑210358 Addition of new test case 7.3B.4 for EIS Spherical Coverage ROHDE & SCHWARZ imported from 3GU
R5‑210359 Editorial update SidelinkUEInformationNR message Ericsson imported from 3GU
R5‑210360 Correction to NR5G PDCP TC 7.1.3.1.1 and 7.1.3.1.2 Qualcomm CDMA Technologies imported from 3GU
R5‑210361 Correction to NR5G RRC TC 8.1.1.3.3 Qualcomm CDMA Technologies imported from 3GU
R5‑210362 Correction to NR5G TCs 8.1.X on SINR reporting Qualcomm CDMA Technologies imported from 3GU
R5‑210363 Correction to NR5G Idle mode TCs Qualcomm CDMA Technologies imported from 3GU
R5‑210364 Correction to NR5G UAC TC 11.3.4 Qualcomm CDMA Technologies imported from 3GU
R5‑210365 Correction to NR-DC RRC TC 8.2.5.1.2 Qualcomm CDMA Technologies imported from 3GU
R5‑210366 Correction to NR-DC RRC TC 8.2.5.2.2 Qualcomm CDMA Technologies imported from 3GU
R5‑210367 Correction to NR5G RRC IRAT TC 8.1.4.2.1.1 Qualcomm CDMA Technologies imported from 3GU
R5‑210368 Correction to IMS over 5GS TC 7.3 Qualcomm CDMA Technologies imported from 3GU
R5‑210369 Addition of IMS over 5GS TC 7.14 Qualcomm CDMA Technologies imported from 3GU
R5‑210370 Addition of RACS RRC TC 8.1.5.9.1 Qualcomm CDMA Technologies imported from 3GU
R5‑210371 Updates to SIB1 and SIB10 for Rel-16 NPN Qualcomm CDMA Technologies imported from 3GU
R5‑210372 Addition of UAI test function Qualcomm CDMA Technologies imported from 3GU
R5‑210373 Addition of System information combination for Rel-16 NPN Qualcomm CDMA Technologies imported from 3GU
R5‑210374 Addition of NID information for Rel-16 NPN Qualcomm CDMA Technologies imported from 3GU
R5‑210375 Updates to NAS messages for Rel-16 NPN Qualcomm CDMA Technologies imported from 3GU
R5‑210376 Addition of test function Set UE Capability Info Qualcomm CDMA Technologies imported from 3GU
R5‑210377 Correction of TRS numeric symbol Intertek imported from 3GU
R5‑210378 Update of RRC TC 8.2.3.12.1 Intertek imported from 3GU
R5‑210379 Update of RRC TC 8.1.5.6.5.1 Intertek imported from 3GU
R5‑210380 Update of 7.5A.3 Adjacent channel selectivity for 4DL CA China Telecommunications imported from 3GU
R5‑210381 Update of 7.5A.3 Adjacent channel selectivity for 4DL CA China Telecommunications imported from 3GU
R5‑210382 Update of 7.5A.3 Adjacent channel selectivity for 4DL CA China Telecommunications imported from 3GU
R5‑210383 Correct a tpyo of 6.3A.4.2 Guangdong OPPO Mobile Telecom. imported from 3GU
R5‑210384 Add TT to power control for UL CA Guangdong OPPO Mobile Telecom. imported from 3GU
R5‑210385 Update MU/TT on power control for UL CA Guangdong OPPO Mobile Telecom. imported from 3GU
R5‑210386 Update Test description of 6.5B.1.1 Guangdong OPPO Mobile Telecom. imported from 3GU
R5‑210387 Correction to EN-DC OoB emissions ROHDE & SCHWARZ imported from 3GU
R5‑210388 Correction to 11.4.2 and 11.4.3 MediaTek Inc. imported from 3GU
R5‑210389 Correction to MR-DC test case 8.2.3.2.1 Guangdong OPPO Mobile Telecom. imported from 3GU
R5‑210390 Correction to MR-DC test case 8.2.3.6.1a and 8.2.3.6.1b Guangdong OPPO Mobile Telecom. imported from 3GU
R5‑210391 Correction to MR-DC test case 8.2.3.7.1 Guangdong OPPO Mobile Telecom. imported from 3GU
R5‑210392 Correction to MR-DC test case 8.2.3.9.1 Guangdong OPPO Mobile Telecom. imported from 3GU
R5‑210393 Addition and update of PICS Lenovo, Motorola Mobility, Qualcomm imported from 3GU
R5‑210394 Editorial update UEAssistanceInformation message Ericsson imported from 3GU
R5‑210395 SR UE Conformance Test Aspects - Additional LTE bands for UE category M2 and/or NB2 in Rel-16 Ericsson imported from 3GU
R5‑210396 WP UE Conformance Test Aspects - Additional LTE bands for UE category M2 and/or NB2 in Rel-16 Ericsson imported from 3GU
R5‑210397 Correction to NR-DC Test case 8.2.2.8.2 ANRITSU LTD imported from 3GU
R5‑210398 Correction to NR5GC NAS test cases for handling additional PDN ANRITSU LTD imported from 3GU
R5‑210399 Inclusion of SK-Counter IE in RRCConnectionReconfiguration ANRITSU LTD imported from 3GU
R5‑210400 FR2 Measurement Uncertainty (MU) and Test Tolerances (TT) Target Completion Update AT&T imported from 3GU
R5‑210401 Correction to NR Idle mode test case 6.1.1.6 Keysight Technologies UK imported from 3GU
R5‑210402 Correction to RRC IDLE procedures Keysight Technologies UK, Qualcomm imported from 3GU
R5‑210403 Addition of the definition of CA capability with 6DL and 7DL CCs LG Electronics imported from 3GU
R5‑210404 Introduction of FDD PDSCH Closed Loop Multi Layer Spatial Multiplexing 4x2 for CA (7DL CA) LG Electronics imported from 3GU
R5‑210405 Introduction of FDD PDSCH Open Loop Spatial Multiplexing 2x2 for CA (7DL CA) LG Electronics imported from 3GU
R5‑210406 Introduction of FDD PDSCH Single Antenna Port Performance for CA (7DL CA) LG Electronics imported from 3GU
R5‑210407 Update to Applicability and test rules for different CA configurations for 6DL CA test cases LG Electronics imported from 3GU
R5‑210408 Update to applicability TDD FDD 7DL CA Peformance test cases LG Electronics imported from 3GU
R5‑210409 Update to TDD FDD 7DL CA PDSCH Closed Loop Multi Layer Spatial Multiplexing 4x2 Performance test cases LG Electronics imported from 3GU
R5‑210410 Update to TDD FDD 7DL CA PDSCH Open Loop Spatial Multiplexing 2x2 Performance test cases LG Electronics imported from 3GU
R5‑210411 Update to TDD FDD 7DL CA Single Antenna Port Performance test cases LG Electronics imported from 3GU
R5‑210412 Addition of a new test case for 5G-SRVCC from NG-RAN to 3GPP UTRAN CATT, TDIA imported from 3GU
R5‑210413 Addition of the applicability for new test case for 5G-SRVCC from NG-RAN to 3GPP UTRAN CATT, TDIA imported from 3GU
R5‑210414 Update UECapabilityEnquiry message Ericsson imported from 3GU
R5‑210415 Addition of new test case 6.4B.2.4.3_1.1 In-band Emissions for inter-band EN-DC including FR2 with 3 CCs LG Electronics imported from 3GU
R5‑210416 Addition of new test case 6.4B.2.4.3_1.2 In-band Emissions for inter-band EN-DC including FR2 with 4 CCs LG Electronics imported from 3GU
R5‑210417 Addition of new test case 6.4B.2.4.3_1.3 In-band Emissions for inter-band EN-DC including FR2 with 5 CCs LG Electronics imported from 3GU
R5‑210418 Update of minimum conformance requirements for 4Rx FDD FR1 PDSCH in TC 5.2.3.1.1_1 LG Electronics imported from 3GU
R5‑210419 Addition of new test case 6.4E.2.2.1 Error Vector Magnitude for V2X for non-concurrent operation LG Electronics imported from 3GU
R5‑210420 Discussion on equal PSD and PCC prioritization for UL CA test Guangdong OPPO Mobile Telecom. imported from 3GU
R5‑210421 Addition of Cell configurations for 5G-SRVCC from NG-RAN to UTRAN CATT, TDIA imported from 3GU
R5‑210422 Addition of 6.5E.2.2.1 Guangdong OPPO Mobile Telecom. imported from 3GU
R5‑210423 Addition of 6.5E.2.2.1D Guangdong OPPO Mobile Telecom. imported from 3GU
R5‑210424 Addition of 6.5E.2.3.1 Guangdong OPPO Mobile Telecom. imported from 3GU
R5‑210425 Addition of 6.5E.2.3.1D Guangdong OPPO Mobile Telecom. imported from 3GU
R5‑210426 Addition of 6.5E.2.4.1 Guangdong OPPO Mobile Telecom. imported from 3GU
R5‑210427 Addition of 6.5E.2.4.1D Guangdong OPPO Mobile Telecom. imported from 3GU
R5‑210428 Addition of 6.5E.3.2.1 Guangdong OPPO Mobile Telecom. imported from 3GU
R5‑210429 Addition of 6.5E.3.2.1D Guangdong OPPO Mobile Telecom. imported from 3GU
R5‑210430 Addition of new NAS Test case 9.1.9.2 for testing RACS UE Configuration Update Tech Mahindra Limited imported from 3GU
R5‑210431 Test tolerance analysis for 7.4.3.1 and 5.4.3.1 ROHDE & SCHWARZ imported from 3GU
R5‑210432 Update 5.4.3.1 with TT analysis results ROHDE & SCHWARZ imported from 3GU
R5‑210433 Update Annex F for 5.4.3.1 and 7.4.3.1 with TT analysis results ROHDE & SCHWARZ imported from 3GU
R5‑210434 Correct cell mapping for 5.4.3.1 ROHDE & SCHWARZ imported from 3GU
R5‑210435 Test tolerance analysis for 4.5.7.1 ROHDE & SCHWARZ imported from 3GU
R5‑210436 Complete RRM 4.5.7.1 including TT analysis results ROHDE & SCHWARZ imported from 3GU
R5‑210437 Annex E and F 4.5.7.1 PSCell addition test ROHDE & SCHWARZ imported from 3GU
R5‑210438 Update TT analyses for FR2 iRAT measurement accuracy test cases ROHDE & SCHWARZ imported from 3GU
R5‑210439 Complete FR2 iRAT measurement accuracy test cases ROHDE & SCHWARZ imported from 3GU
R5‑210440 Update of TT analysis results in Annex F for FR2 iRAT test cases ROHDE & SCHWARZ imported from 3GU
R5‑210441 Update SS-RSRP measurement accuracy TT analyses for SNR uncertainty change ROHDE & SCHWARZ imported from 3GU
R5‑210442 Update TT results for SS-RSRP measurement accuracy test cases chapter 4 ROHDE & SCHWARZ imported from 3GU
R5‑210443 Update TT results for SS-RSRP measurement accuracy test cases chapter 6 ROHDE & SCHWARZ imported from 3GU
R5‑210444 Update TT results for SS-RSRP measurement accuracy test cases Annex F ROHDE & SCHWARZ imported from 3GU
R5‑210445 Update SS-RSRQ measurement accuracy TT analyses for SNR uncertainty change ROHDE & SCHWARZ imported from 3GU
R5‑210446 Update TT results for SS-RSRQ measurement accuracy test cases chapter 4 ROHDE & SCHWARZ imported from 3GU
R5‑210447 Update TT results for SS-RSRQ measurement accuracy test cases chapter 6 ROHDE & SCHWARZ imported from 3GU
R5‑210448 Update TT results for SS-RSRQ measurement accuracy test cases Annex F ROHDE & SCHWARZ imported from 3GU
R5‑210449 Correct 6.3.1.1 TT analysis ROHDE & SCHWARZ imported from 3GU
R5‑210450 Update TT results for 6.3.1.1 ROHDE & SCHWARZ imported from 3GU
R5‑210451 Update TT results for 6.3.1.1 Annex F ROHDE & SCHWARZ imported from 3GU
R5‑210452 On the DL AWGN MTSU for RRM ROHDE & SCHWARZ imported from 3GU
R5‑210453 Update DL AWGN MU for RRM FR2 ROHDE & SCHWARZ imported from 3GU
R5‑210454 Update RRM MU values for FR2 ROHDE & SCHWARZ imported from 3GU
R5‑210455 Update text in permitted test setups for RRM FR2 ROHDE & SCHWARZ imported from 3GU
R5‑210456 Update Annex I to TS 38.533 ROHDE & SCHWARZ imported from 3GU
R5‑210457 Update NR frequency band groups for FR1 ROHDE & SCHWARZ imported from 3GU
R5‑210458 Correction RLM config for event triggered test cases ROHDE & SCHWARZ imported from 3GU
R5‑210459 Correction EN-DC FR1 timing tests ROHDE & SCHWARZ imported from 3GU
R5‑210460 Corrections to 5.4.1.1 ROHDE & SCHWARZ imported from 3GU
R5‑210461 Editorial rework of the conditions for CSI-FrequencyOccupation ROHDE & SCHWARZ imported from 3GU
R5‑210462 Align TDD UL DL Common for RRM with TS 38.533 ROHDE & SCHWARZ imported from 3GU
R5‑210463 Addition of Serving Cell Config for RRM timing test cases ROHDE & SCHWARZ imported from 3GU
R5‑210464 Corrections NR SA FR1 timing test cases ROHDE & SCHWARZ imported from 3GU
R5‑210465 Editorial correction of title of clause 6 ROHDE & SCHWARZ imported from 3GU
R5‑210466 Corrections to 6.3.2.2.1 and 6.3.2.2.2 ROHDE & SCHWARZ imported from 3GU
R5‑210467 Corrections to 4.3.2.2.2 ROHDE & SCHWARZ imported from 3GU
R5‑210468 Add new SIB combination for RRM tests with single cell ROHDE & SCHWARZ imported from 3GU
R5‑210469 Changes to RRM default message contents ROHDE & SCHWARZ imported from 3GU
R5‑210470 Clarification on SSB Index to use in the PUxCH-PowerControl for RRM tests with more than one SSB ROHDE & SCHWARZ imported from 3GU
R5‑210471 Clarification on SSB Index to use in the PUxCH-PowerControl for RRM tests with more than one SSB - EN-DC ROHDE & SCHWARZ imported from 3GU
R5‑210472 Editorial: correct title of PRACH test cases to match RRM work plan - EN-DC FR1 ROHDE & SCHWARZ imported from 3GU
R5‑210473 Editorial: correct title of PRACH test cases to match RRM work plan - SA FR1 ROHDE & SCHWARZ imported from 3GU
R5‑210474 Editorial: correct title of PRACH test cases to match RRM work plan - SA FR2 ROHDE & SCHWARZ imported from 3GU
R5‑210475 Editorial: correct title of PRACH test cases to match RRM work plan - Annexes ROHDE & SCHWARZ imported from 3GU
R5‑210476 Editorial: correct title of PRACH test cases to match RRM work plan - Applicability ROHDE & SCHWARZ imported from 3GU
R5‑210477 Add SSB Index table for RRM with SECOND_SSB condition ROHDE & SCHWARZ imported from 3GU
R5‑210478 Align Annex A with TS 38.133 ROHDE & SCHWARZ imported from 3GU
R5‑210479 Correct reportOffsetList in CSI-ReportConfig ROHDE & SCHWARZ imported from 3GU
R5‑210480 Specify CSI-SSB-ResourceSet ROHDE & SCHWARZ imported from 3GU
R5‑210481 Correction of applicability definition for 2Rx related test cases to exclude category 1bis UEs equipped with single Rx antenna CAICT, Spreadtrum Communications imported from 3GU
R5‑210482 Addition of the Additional Information for some RF test cases in 9.6.1 CAICT imported from 3GU
R5‑210483 Correction of core spec Ref. for 4 Rx antenna ports Capabilities CAICT imported from 3GU
R5‑210484 Addition of PUSCH HalfPi BPSK capability in FR2 CAICT imported from 3GU
R5‑210485 Correction of test purpose for 6.3.2 and 6.3D.2 CAICT imported from 3GU
R5‑210486 Correction of test frequencies for NR band n28 30MHz test channel bandwidth of CA SUL and UL MIMO test cases in section 6 CAICT imported from 3GU
R5‑210487 Editorial correction for error in Table 7.6.4.4.1-1 CAICT imported from 3GU
R5‑210488 Correction of test frequencies for NR band n28 30MHz test channel bandwidth of CA SUL and UL MIMO test cases in section 7 CAICT imported from 3GU
R5‑210489 Correction of test purpose for 6.3.2 Transmit OFF power CAICT imported from 3GU
R5‑210490 Addition of new test case 6.3D.2 Transmit OFF power for UL MIMO CAICT imported from 3GU
R5‑210491 Correction of test applicability and test description for 7.4 Maximum input level CAICT imported from 3GU
R5‑210492 Addition of new test cases for 7.4A Maximum input level for CA CAICT imported from 3GU
R5‑210493 Addition of new test case 7.4D Maximum input level for UL MIMO CAICT imported from 3GU
R5‑210494 Removal of brackets for MU of EIS spherical coverage CAICT imported from 3GU
R5‑210495 Correction of Annex P for Modified MPR behaviour CAICT imported from 3GU
R5‑210496 Correction of definition for EIS CAICT imported from 3GU
R5‑210497 Correction of test frequencies for NR band n28 30MHz test channel bandwidth of 6.2B.1.3 CAICT imported from 3GU
R5‑210498 Addition of editor note to the incomplete test cases CAICT imported from 3GU
R5‑210499 Correction of test applicability of 6.5B.5.3 CAICT imported from 3GU
R5‑210500 Correction of test configuration tables in section 6 CAICT imported from 3GU
R5‑210501 Completion of 7.6B.2.3_1.3 Inband blocking for EN-DC within FR1 5 CCs CAICT imported from 3GU
R5‑210502 Correction of test frequencies for NR band n28 30MHz test channel bandwidth of 7.6B.3.3 CAICT imported from 3GU
R5‑210503 Editorial correction for errors in 7.6B.4.3_1 CAICT imported from 3GU
R5‑210504 Correction of test configuration tables in section 7 CAICT imported from 3GU
R5‑210505 Correction of applicability definitions for PUSCH HalfPi BPSK related test cases CAICT imported from 3GU
R5‑210506 Correction of applicability definitions for long DRX cycle related test cases CAICT imported from 3GU
R5‑210507 Correction of test applicability for long DRX cycle related test cases in section 4 CAICT imported from 3GU
R5‑210508 Correction of test applicability for long DRX cycle related test cases in section 5 CAICT imported from 3GU
R5‑210509 Correction of test applicability for long DRX cycle related test cases in section 6 CAICT imported from 3GU
R5‑210510 Correction of test applicability for long DRX cycle related test cases in section 7 CAICT imported from 3GU
R5‑210511 Correction of test applicability for long DRX cycle related test cases in section 8 CAICT imported from 3GU
R5‑210512 Introduction of test point analysis for SA FR2 7.4A Maximum input level for CA CAICT imported from 3GU
R5‑210513 Addition of applicability for new NAS Test case 9.1.9.2 Tech Mahindra Limited imported from 3GU
R5‑210514 New WID on UE Conformance Test Aspects for 2-step RACH for NR ZTE Corporation, China Telecom imported from 3GU
R5‑210515 Discussion on test issue of ONOFF time mask for UL MIMO Guangdong OPPO Mobile Telecom. imported from 3GU
R5‑210516 Adding Inter-band EN-DC combination within FR1 KDDI Corporation imported from 3GU
R5‑210517 Update to EN-DC Reference Sensitivity ROHDE & SCHWARZ imported from 3GU
R5‑210518 Clarification of DRB identity in CLOSE UE TEST LOOP message in 36.509 Anritsu imported from 3GU
R5‑210519 Clarification of DRB identity in CLOSE UE TEST LOOP message in 38.509 Anritsu imported from 3GU
R5‑210520 Correction to SR config for TDD PDSCH Type A performance test cases Anritsu imported from 3GU
R5‑210521 Correction to test applicability for LTE-NR coexistence performance test cases Anritsu imported from 3GU
R5‑210522 Correction to wideband CQI reporting under fading test cases Anritsu imported from 3GU
R5‑210523 Addition of 8.3.2.2.1 2Rx TDD FR2 Single PMI with 2TX TypeI-SinglePanel Codebook Anritsu imported from 3GU
R5‑210524 Correction to test time for Subband CQI test case Anritsu imported from 3GU
R5‑210525 Correction to DCI bit size for PDSCH Type B performance and LTE coexistence tests Anritsu imported from 3GU
R5‑210526 Correction to LB setup DRB in CLOSE UE TEST LOOP message Anritsu imported from 3GU
R5‑210527 Clarification of SNR for 4RX UE in RLM Test Cases Anritsu imported from 3GU
R5‑210528 Correction to test procedure in test case 6.5.1.4 Anritsu imported from 3GU
R5‑210529 Correction to Interruptions during measurements on deactivated NR SCC test cases Anritsu imported from 3GU
R5‑210530 Correction to message configuration for NSA CSI-RS-based RLM RS test cases Anritsu imported from 3GU
R5‑210531 Correction to NR SA RLM out-of-sync test cases Anritsu imported from 3GU
R5‑210532 Correction to NR SA FR1 RRC Re-establishment test cases Anritsu imported from 3GU
R5‑210533 Correction to 4.5.1.2 and 6.5.1.2 PDCCH Aggregation Level Anritsu imported from 3GU
R5‑210534 Correction to NR SA FR1 E-UTRA RRC connection release with redirection Anritsu imported from 3GU
R5‑210535 Correction to FR1 NSA SS-SINR measurement test cases Anritsu imported from 3GU
R5‑210536 Correction to L1-RSRP test cases Anritsu imported from 3GU
R5‑210537 Correction to the procedure to add a step for establishing SRB2 and DRB Anritsu imported from 3GU
R5‑210538 Update of DRX configuration in FR1 Event-triggered Test cases Anritsu imported from 3GU
R5‑210539 Introduction 4CA Reference Sensitivity test 7.3A.3 WE Certification Oy, DISH Network imported from 3GU
R5‑210540 Introduction 4CA Maximum Input Level test 7.4A.3 WE Certification Oy, DISH Network imported from 3GU
R5‑210541 Introduction 4CA In-Band Blocking test 7.6A.2.3 WE Certification Oy, DISH Network imported from 3GU
R5‑210542 Corrections to MAC RACH Beam Failure test case Lenovo, Motorola Mobility, MCC TF160 imported from 3GU
R5‑210543 FR2 UL CA Frequency error test cases update Keysight Technologies UK Ltd imported from 3GU
R5‑210544 Update of test point analysis for FR2 UL CA frequency error test cases Keysight Technologies UK Ltd imported from 3GU
R5‑210545 EN-DC FR2 UL CA Frequency error test cases update Keysight Technologies UK Ltd imported from 3GU
R5‑210546 Update of test point analysis for FR2 MPR, SEM and ACLR test cases Keysight Technologies UK Ltd, Ericsson, CAICT imported from 3GU
R5‑210547 FR2 MPR, ACLR and SEM test cases update as per TP analysis update Keysight Technologies UK Ltd, Ericsson, CAICT imported from 3GU
R5‑210548 Default message exceptions for LTE carriers in EN-DC Keysight Technologies UK Ltd imported from 3GU
R5‑210549 Adding subPRB allocation to test case 6.2.3EC, Maximum Power Reduction (MPR) for UE category M2 Ericsson imported from 3GU
R5‑210550 Core spec alignment, adding missing note in test case 8.11.1.2.3.1 Ericsson imported from 3GU
R5‑210551 MCPTT Info Corrections UPV/EHU, Nemergent Solutions, MCC TF160 imported from 3GU
R5‑210552 Adding subPRB allocation to 6.5.2.1EA.2, PUSCH-EVM with exclusion period for UE category M1 Ericsson imported from 3GU
R5‑210553 Adding subPRB allocation to 6.5.2.2EA and 6.5.2.2EC Ericsson imported from 3GU
R5‑210554 Adding references ROHDE & SCHWARZ imported from 3GU
R5‑210555 New RAN5 PRD-19 on RAN5 WP Template Samsung, Ericsson imported from 3GU
R5‑210556 Adding specs to References in TS 36.523-1 Samsung imported from 3GU
R5‑210557 On the QoQZ standard deviation for ETC testing ROHDE & SCHWARZ imported from 3GU
R5‑210558 Adding subPRB allocation to 6.6.2.1EC, Spectrum Emission Mask for UE category M2 Ericsson imported from 3GU
R5‑210559 Adding subPRB allocation to 6.6.2.3EC, Adjacent Channel Leakage power Ratio for UE category M2 Ericsson imported from 3GU
R5‑210560 Adding subPRB allocation to 6.6.3EA.1, Transmitter Spurious emissions for UE category M1 Ericsson imported from 3GU
R5‑210561 Correction to EN-DC test case 8.2.4.3.1.3 ANRITSU LTD imported from 3GU
R5‑210562 Adding band 7,42, 43 to Rx test cases for cat M2 Ericsson imported from 3GU
R5‑210563 New note added for band n71 Ericsson imported from 3GU
R5‑210564 Introduction of applicability for SRVCC from NG-RAN to 3GPP UTRAN CATT, TDIA, Huawei, Hisilicon imported from 3GU
R5‑210565 Update of waveform to be used during Rx peam peak search in Annex K.1.2 Keysight Technologies UK Ltd imported from 3GU
R5‑210566 Update on manufacturer declaration required for Receiver Beam Peak Search Keysight Technologies UK Ltd imported from 3GU
R5‑210567 Corrections to DL SPS test case Lenovo, Motorola Mobility, MCC TF160 imported from 3GU
R5‑210568 Corrections to UL configured grant type 1 test case Lenovo, Motorola Mobility, MCC TF160 imported from 3GU
R5‑210569 Corrections to UL configured grant type 2 test case Lenovo, Motorola Mobility, MCC TF160 imported from 3GU
R5‑210570 Update test case applicability for 6.2.3.9 MediaTek (Chengdu) Inc. imported from 3GU
R5‑210571 Correction to 11.4.8 MediaTek Inc. imported from 3GU
R5‑210572 Removing test case 9.1.5.2.9 MediaTek (Chengdu) Inc. imported from 3GU
R5‑210573 Correction to Tracking area updating / Inter-system change from S1 mode to N1 mode in 5GMM/EMM-IDLE MediaTek (Chengdu) Inc. imported from 3GU
R5‑210574 Correction to test case 6.1.1.3 MediaTek (Chengdu) Inc. imported from 3GU
R5‑210575 Corrections to NR5G MAC TC 7.1.1.1.3 Qualcomm CDMA Technologies, Keysight Technologies UK Ltd., MCC TF160 imported from 3GU
R5‑210576 Correction to test case 6.1.2.8 MediaTek (Chengdu) Inc. imported from 3GU
R5‑210577 Correction to test case 6.4.1.2 MediaTek (Chengdu) Inc. imported from 3GU
R5‑210578 Update test case applicability for 6.2.3.9 MediaTek (Chengdu) Inc. imported from 3GU
R5‑210579 Add capability for I-RAT cell counting MediaTek (Chengdu) Inc. imported from 3GU
R5‑210580 Discussion paper to remove test case 9.1.5.2.9 from TS 38.523-1 MediaTek (Chengdu) Inc. imported from 3GU
R5‑210581 Discussion to add test cases for RRC DL segmentation MediaTek (Chengdu) Inc. imported from 3GU
R5‑210582 Addition of A.15.1 MTSI MO Video Call / with preconditions / 5GS Qualcomm CDMA Technologies imported from 3GU
R5‑210583 WI Update for UE Conformance Test Aspects - Rel -16 for CLI handling for NR Qualcomm Technologies Netherlands B.V. imported from 3GU
R5‑210584 SR UE Conformance Test Aspects - Rel -16 for CLI handling for NR Qualcomm Technologies Netherlands B.V. imported from 3GU
R5‑210585 SR on 5G NR User Equipment (UE) Application Layer Data Throughput Performance Qualcomm Technologies Netherlands B.V. imported from 3GU
R5‑210586 SI update on 5G NR User Equipment (UE) Application Layer Data Throughput Performance Qualcomm Technologies Netherlands B.V. imported from 3GU
R5‑210587 SR - UE Conformance Test Aspects - Enhancements for Mission Critical Services MCPTT, MCData and MCVideo (UID - 890042) MCenhUEConTest NIST imported from 3GU
R5‑210588 WP - UE Conformance Test Aspects - Enhancements for Mission Critical Services MCPTT, MCData and MCVideo (UID - 890042) MCenhUEConTest NIST imported from 3GU
R5‑210589 Correction to Annex A.9 EPS Fallback for Voice Call / 5GS Qualcomm CDMA Technologies, Anritsu imported from 3GU
R5‑210590 Correction to IMS over 5GS TC 6.2 Qualcomm CDMA Technologies imported from 3GU
R5‑210591 Correction to IMS over 5GS TC 7.2 Qualcomm CDMA Technologies, Anritsu, MCC TF160 imported from 3GU
R5‑210592 Correction to IMS over 5GS TC 7.11 Qualcomm CDMA Technologies, Keysight Technologies, Anritsu imported from 3GU
R5‑210593 Updates to 37.901-5 Annex A for Downlink Throughput tests with Fading and FRC scenario QUALCOMM communications-France imported from 3GU
R5‑210594 Updates to connection diagram for Application Layer Data Throughput QUALCOMM communications-France imported from 3GU
R5‑210595 Updates to Impact of Modem Performance in Application Layer Throughput QUALCOMM communications-France imported from 3GU
R5‑210596 Updates to Test System Uncertainty and Test Tolerance for Application Layer Data Throughput QUALCOMM communications-France imported from 3GU
R5‑210597 Updates to Conclusion for Application Layer Data Throughput QUALCOMM communications-France imported from 3GU
R5‑210598 Correction to Additional Information of 8.2.1.3.1_A and 8.7.1.1_A in Table 4.1-1 TTA imported from 3GU
R5‑210599 Editorial correction on numbering of several Tables in 38.508-1 TTA imported from 3GU
R5‑210600 On MTSU definition for RRM Keysight Technologies UK Ltd imported from 3GU
R5‑210601 Clarification of BWP1 and BWP2 in 6.6.1.3, 6.6.1.4, 6.6.1.6 Keysight Technologies UK Ltd imported from 3GU
R5‑210602 Addition of R16 new channel bandwidths for n3 in 38.521-1 China Telecommunications imported from 3GU
R5‑210603 Update on DL AWGN absolute power uncertainty values for DFF Keysight Technologies UK Ltd imported from 3GU
R5‑210604 Update MU threshold for DL AWGN absolute power for RRM FR2 Keysight Technologies UK Ltd imported from 3GU
R5‑210605 RACH-Config Correction for Non-Contention based Random Access test case 6.3.2.2.2 Keysight Technologies UK Ltd imported from 3GU
R5‑210606 RACH-Config Correction for Non-Contention based Random Access test case 4.3.2.2.2 Keysight Technologies UK Ltd imported from 3GU
R5‑210607 Correction in 4.7.3.2.1 test parameters Keysight Technologies UK Ltd imported from 3GU
R5‑210608 Correction in 4.5.2.1 and 4.5.2.2 test procedure Keysight Technologies UK Ltd imported from 3GU
R5‑210609 Correction to PLMN Selection Test Case 6.2.1.2 Apple (UK) Limited imported from 3GU
R5‑210610 Correction to Inter-RAT Cell Reselection Test Case 6.4.3.1 Apple (UK) Limited imported from 3GU
R5‑210611 Update IE PDCCH-ConfigCommon Ericsson imported from 3GU
R5‑210612 Editorial correction in 6.5.2.1 Keysight Technologies UK Ltd imported from 3GU
R5‑210613 Correction in SIB5 for iRAT cell reselection Keysight Technologies UK Ltd imported from 3GU
R5‑210614 Correction in 6.1.2.2 test procedure Keysight Technologies UK Ltd imported from 3GU
R5‑210615 Correction in Table H.3.6-5 Keysight Technologies UK Ltd imported from 3GU
R5‑210616 Editorial update DLDedicatedMessageSegment message Ericsson imported from 3GU
R5‑210617 AP#87e.24 Input for Large Device Size Apple Portugal imported from 3GU
R5‑210618 CR for 38.521-3: Update Editor’s Notes in Power Control tests Apple Portugal imported from 3GU
R5‑210619 Correction to NR-DC RRC test case 8.2.3.14.2 TDIA, CATT imported from 3GU
R5‑210620 Correction to NR-DC RRC test case 8.2.3.14.2 TDIA, CATT imported from 3GU
R5‑210621 Correction of NR-DC tese case 8.2.5.1.2 TDIA, CATT imported from 3GU
R5‑210622 Introduciton of general capability for NR to UTRA-FDD CELL_DCH CS handover CATT, TDIA imported from 3GU
R5‑210623 Correction to Table 4.6.1-13 RRCReconfiguration Huawei, Hisilicon imported from 3GU
R5‑210624 Correction to Table 4.6.3-185 SSB-MTC Huawei, Hisilicon imported from 3GU
R5‑210625 Correction to Table 4.6.3-192 TDD-UL-DL-ConfigCommon Huawei, Hisilicon imported from 3GU
R5‑210626 Correction to Table 6.4.1-11 USIM Configuration 11 Huawei, Hisilicon imported from 3GU
R5‑210627 Correction to Table 4.8.2.1-7 Reference QoS rule 7 Huawei, Hisilicon imported from 3GU
R5‑210628 Correction to NR TC 6.1.1.6-PLMN Selection with MinimumPeriodicSearchTimer Huawei, Hisilicon imported from 3GU
R5‑210629 Correction to NR TC 6.1.2.2-Cell Selection Qqualmin Huawei, Hisilicon imported from 3GU
R5‑210630 Correction to NR TC 6.1.2.9-Cell Reselection Huawei, Hisilicon imported from 3GU
R5‑210631 Correction to NR TC 6.2.3.2-L2N cell reselection Huawei, Hisilicon imported from 3GU
R5‑210632 Correction to NR TC 6.2.3.4-N2L cell reselection Huawei, Hisilicon imported from 3GU
R5‑210633 Correction to NR TC 6.3.1.1-SoR security check successful Huawei, Hisilicon imported from 3GU
R5‑210634 Correction to NR TC 6.3.1.2-SoR ACK has NOT requested Huawei, Hisilicon imported from 3GU
R5‑210635 Correction to NR TC 6.3.1.3-SoR Security check unsuccessful Huawei, Hisilicon imported from 3GU
R5‑210636 Correction to NR TC 6.3.1.5-SoR UE configured but not receive Steering of Roaming from Network Huawei, Hisilicon imported from 3GU
R5‑210637 Correction to NR TC 6.3.1.8-Automatic PLMN selection mode Huawei, Hisilicon imported from 3GU
R5‑210638 Correction to NR TC 7.1.1.2.2-PDSCH Aggregate Huawei, Hisilicon, MCC TF160 imported from 3GU
R5‑210639 Correction to NR TC 7.1.1.3.8.X-PHR report Huawei, Hisilicon imported from 3GU
R5‑210640 Correction to NR TC 7.1.2.3.3 and 7.1.2.3.4-RLC SN sequence Huawei, Hisilicon imported from 3GU
R5‑210641 Correction to NR TC 7.1.3.1.1 and 7.1.3.1.2-PDCP SN sequence Huawei, Hisilicon imported from 3GU
R5‑210642 Correction to NR test case 8.1.3.1.13-CSI-RS based intra-freq measure Huawei, Hisilicon imported from 3GU
R5‑210643 Correction to NR TC 8.1.3.1.15A-bliacklisting Huawei, Hisilicon imported from 3GU
R5‑210644 Correction to NR TC 8.1.3.2.2-Event B2 Huawei, Hisilicon imported from 3GU
R5‑210645 Correction to NR TC 8.1.5.6.1-RLF Huawei, Hisilicon imported from 3GU
R5‑210646 Correction to NR TC 8.1.5.8.1-Latency check Huawei, Hisilicon, MCC TF160 imported from 3GU
R5‑210647 Addition of NR TC 8.1.5.8.2.1-intra-band SCell Latency check Huawei, Hisilicon, MCC TF160 imported from 3GU
R5‑210648 Addition of NR TC 8.1.5.8.2.2-inter-band SCell Latency check Huawei, Hisilicon, MCC TF160 imported from 3GU
R5‑210649 Addition of NR TC 8.1.5.8.2.3-intra-band non-contigous SCell Latency check Huawei, Hisilicon, MCC TF160 imported from 3GU
R5‑210650 Correction to NR-DC TC 8.2.2.7.2-bearer type change without security key change Huawei, Hisilicon imported from 3GU
R5‑210651 Correction to NR-DC TC 8.2.2.9.2-Split DRB Huawei, Hisilicon imported from 3GU
R5‑210652 Correction to NR-DC TC 8.2.3.16.2-Intra NR measurements Huawei, Hisilicon imported from 3GU
R5‑210653 Correction to NR-DC TC 8.2.6.1.2.1-RLC failure Huawei, Hisilicon imported from 3GU
R5‑210654 Correction to NR TC 11.1.3-EPS Fallback with handover Huawei, Hisilicon imported from 3GU
R5‑210655 Correction to NR TC applicability for 5GS Huawei, Hisilicon imported from 3GU
R5‑210656 Correction to NR IMS TC 6.5-UE de-reg after ISIM refresh Huawei, Hisilicon imported from 3GU
R5‑210657 Correction to NR IMS TC 7.10-Content Type not present Huawei, Hisilicon imported from 3GU
R5‑210658 Correction to NR IMS A.9.2-Optional UPDATE after EPS fallback Huawei, Hisilicon imported from 3GU
R5‑210659 Withdrawing NR IMS TC 7.3-MO voice-UE preconditions enabled but not included in INVITE Huawei, Hisilicon imported from 3GU
R5‑210660 Correction to NR IMS TC 10.1-Conformance requirement update Huawei, Hisilicon imported from 3GU
R5‑210661 Addition of NR IMS TC 7.26-MO CAT forking model Huawei, Hisilicon imported from 3GU
R5‑210662 Addition of NR IMS TC 8.26-MO hold without announcement Huawei, Hisilicon imported from 3GU
R5‑210663 Addition of NR IMS TC 8.28-MT hold without announcement Huawei, Hisilicon imported from 3GU
R5‑210664 Addition of NR IMS TC 8.30-Subscription to MWI event Huawei, Hisilicon imported from 3GU
R5‑210665 Addition of NR IMS TC 8.31-Creating and leaving conference Huawei, Hisilicon imported from 3GU
R5‑210666 Addition of NR IMS TC 8.32-Inviting user to conference by REFER Huawei, Hisilicon imported from 3GU
R5‑210667 Addition of NR IMS TC 8.34-Three way session Huawei, Hisilicon imported from 3GU
R5‑210668 Addition of NR IMS TC 8.36-MO explicit communication transfer Huawei, Hisilicon imported from 3GU
R5‑210669 Addition of TC 7.1.1.3.1-UL grant prioritization Huawei, Hisilicon imported from 3GU
R5‑210670 Correction to NR TC applicability for IIoT Huawei, Hisilicon imported from 3GU
R5‑210671 Addition of MDT TC 8.1.6.1.4.3-CEF-intra-NR handover Huawei, Hisilicon imported from 3GU
R5‑210672 Addition of MDT TC 8.1.6.1.4.4-CEF-RRC re-establishment Huawei, Hisilicon imported from 3GU
R5‑210673 Addition of MDT TC 8.1.6.1.4.5-CEF-location info Huawei, Hisilicon imported from 3GU
R5‑210674 Addition of MDT TC 8.1.6.1.4.6-CEF-intra-freq measurements Huawei, Hisilicon imported from 3GU
R5‑210675 Addition of MDT TC 8.1.6.1.4.7-CEF-inter-freq measurements Huawei, Hisilicon imported from 3GU
R5‑210676 Addition of MDT TC 8.1.6.1.4.8-CEF-rach failure Huawei, Hisilicon imported from 3GU
R5‑210677 Correction to NR TC applicability for MDT Huawei, Hisilicon imported from 3GU
R5‑210678 Addition of 5G SRVCC TC 8.1.3.2.6-NR to UMTS Inter-RAT measurements-Event B1 Huawei, Hisilicon imported from 3GU
R5‑210679 Addition of 5G SRVCC TC 8.1.3.2.7-NR to UMTS Inter-RAT measurements-Event B2 Huawei, Hisilicon imported from 3GU
R5‑210680 Correction to NR TC applicability for 5G SRVCC Huawei, Hisilicon imported from 3GU
R5‑210681 Correction to LTE TC 6.1.1.2a Huawei, Hisilicon, MCC TF160 imported from 3GU
R5‑210682 Correction to LTE TC 6.1.1.6a Huawei, Hisilicon, MCC TF160 imported from 3GU
R5‑210683 Addition of LTE TC 6.1.1.6b Huawei, Hisilicon, MCC TF160 imported from 3GU
R5‑210684 Correction to LTE TC 6.1.2.3 Huawei, Hisilicon, MCC TF160 imported from 3GU
R5‑210685 Correction to LTE TC 6.1.2.12 Huawei, Hisilicon, MCC TF160 imported from 3GU
R5‑210686 Addition of LTE TC applicability Huawei, Hisilicon, MCC TF160 imported from 3GU
R5‑210687 Correction to Table 4.6.3-25B CondReconfigId Huawei, Hisilicon imported from 3GU
R5‑210688 Correction to Table 4.6.3-25C CondReconfigToAddModList Huawei, Hisilicon imported from 3GU
R5‑210689 Correction to Table 4.6.3-25D ConditionalReconfiguration Huawei, Hisilicon imported from 3GU
R5‑210690 Correction to Table 4.6.3-142 ReportConfigNR Huawei, Hisilicon imported from 3GU
R5‑210691 Addition of NR TC 8.1.4.4.1-Conditional handover Success Huawei, Hisilicon imported from 3GU
R5‑210692 Addition of NR TC 8.1.4.4.2-Conditional handover modify conditional handover configuration Huawei, Hisilicon imported from 3GU
R5‑210693 Addition of NR TC 8.1.4.4.3-Conditional handover Failure Huawei, Hisilicon imported from 3GU
R5‑210694 Correction to applicability for NR MobEnc Huawei, Hisilicon imported from 3GU
R5‑210695 Add UE capability for NR MobEnc Huawei, Hisilicon imported from 3GU
R5‑210696 SR UE Conformance Test Aspects - Rel-16 NR Mobility Enhancement Huawei, Hisilicon imported from 3GU
R5‑210697 WP UE Conformance Test Aspects - Rel-16 NR Mobility Enhancement Huawei, Hisilicon imported from 3GU
R5‑210698 Addition of IE SL-PreconfigurationNR Huawei, Hisilicon imported from 3GU
R5‑210699 Addition of V2X NAS IEs Huawei, Hisilicon imported from 3GU
R5‑210700 Addition of SI combination for NR SL Huawei, Hisilicon imported from 3GU
R5‑210701 Correction of NR SL IE SL-BWP-ConfigCommon Huawei, Hisilicon imported from 3GU
R5‑210702 Correction of NR SL IE SL-BWP-PoolConfigCommon Huawei, Hisilicon imported from 3GU
R5‑210703 Correction of NR SL IE SL-ConfigDedicatedNR Huawei, Hisilicon imported from 3GU
R5‑210704 Correction of NR SL IE SL-FreqConfigCommon Huawei, Hisilicon imported from 3GU
R5‑210705 Correction of NR SL IE SL-LogicalChannelConfig Huawei, Hisilicon imported from 3GU
R5‑210706 Correction of NR SL IE SL-MeasConfigInfo Huawei, Hisilicon imported from 3GU
R5‑210707 Correction of NR SL IE SL-PDCP-Config Huawei, Hisilicon imported from 3GU
R5‑210708 Correction of NR SL IE SL-RadioBearerConfig Huawei, Hisilicon imported from 3GU
R5‑210709 Correction of NR SL IE SL-ResourcePool Huawei, Hisilicon imported from 3GU
R5‑210710 Correction of NR SL IE SL-RLC-BearerConfig Huawei, Hisilicon imported from 3GU
R5‑210711 Correction of NR SL IE SL-RLC-Config Huawei, Hisilicon imported from 3GU
R5‑210712 Correction of NR SL IE SL-SDAP-Config Huawei, Hisilicon imported from 3GU
R5‑210713 Correction to NR Uu IE ARFCN-ValueNR Huawei, Hisilicon imported from 3GU
R5‑210714 Correction to NR Uu IE SCS-SpecificCarrier Huawei, Hisilicon imported from 3GU
R5‑210715 Correction to PC5-RRC message RRCReconfigurationSidelink Huawei, Hisilicon imported from 3GU
R5‑210716 Correction to PC5-RRC message UECapabilityEnquirySidelink Huawei, Hisilicon imported from 3GU
R5‑210717 Correction to PC5-RRC message UECapabilityInformationSidelink Huawei, Hisilicon imported from 3GU
R5‑210718 SR UE Conformance Test Aspects - Rel-16 NR V2X Huawei, Hisilicon imported from 3GU
R5‑210719 WP UE Conformance Test Aspects - Rel-16 NR V2X Huawei, Hisilicon imported from 3GU
R5‑210720 SR UE Conformance Test Aspects- SRVCC_NR_to_UMTS China Unicom imported from 3GU
R5‑210721 WP UE Conformance Test Aspects- SRVCC_NR_to_UMTS China Unicom imported from 3GU
R5‑210722 Discussion on omitting of Rx cases with UL-MIMO on TDD bands Huawei, HiSilicon imported from 3GU
R5‑210723 Omitting of FR1 Rx cases with UL-MIMO on TDD bands Huawei, HiSilicon imported from 3GU
R5‑210724 Omitting of FR2 Rx cases with UL-MIMO on TDD bands Huawei, HiSilicon imported from 3GU
R5‑210725 Omitting of NSA Rx cases with UL-MIMO on TDD bands Huawei, HiSilicon imported from 3GU
R5‑210726 Updating applicability of FR1 Rx cases with UL-MIMO to only FDD bands Huawei, HiSilicon imported from 3GU
R5‑210727 Addition of Inner_partial allocation in general section and a few test cases Huawei, HiSilicon imported from 3GU
R5‑210728 Correction of parameter configuration for open loop power control Huawei, HiSilicon imported from 3GU
R5‑210729 Removing test condition of extreme voltage Huawei, HiSilicon imported from 3GU
R5‑210730 Cleaning up of FR2 test specification Huawei, HiSilicon imported from 3GU
R5‑210731 Adding definition of FR2a, FR2b and FR2c in general section Huawei, HiSilicon imported from 3GU
R5‑210732 Cleaning up of Annex K Huawei, HiSilicon imported from 3GU
R5‑210733 Discussion on FR2 TT calculation in special scenarios Huawei, HiSilicon, Vivo imported from 3GU
R5‑210734 Discussion on draft LS on on nominal channel spacing calculation Huawei, HiSilicon imported from 3GU
R5‑210735 Editorial correction to several MU factors Huawei, HiSilicon imported from 3GU
R5‑210736 Correcting EN-DC A-MPR test requirements for non-overlapping test points Huawei, HiSilicon imported from 3GU
R5‑210737 Correction of test requirements for EN-DC configured output power Huawei, HiSilicon, Anritsu imported from 3GU
R5‑210738 Clarification of tested Rx antenna numbers on E-UTRA band Huawei, HiSilicon, Bureau Veritas imported from 3GU
R5‑210739 Correction of test points for NS_48 Huawei, HiSilicon imported from 3GU
R5‑210740 Updating TP analysis of FR1 A-MPR for NS_48 Huawei, HiSilicon imported from 3GU
R5‑210741 Addition of A-MPR test for NS_49 Huawei, HiSilicon imported from 3GU
R5‑210742 Adding TP analysis of FR1 A-MPR for NS_49 Huawei, HiSilicon imported from 3GU
R5‑210743 Resubmitting TP analysis of FR1 A-MPR for NS_44 Huawei, HiSilicon imported from 3GU
R5‑210744 Adding PICS for UL switching Huawei, HiSilicon imported from 3GU
R5‑210745 Adding test applicability for switching test case Huawei, HiSilicon imported from 3GU
R5‑210746 Updating Rel-16 EN-DC PC2 MOP to include powerClassNRPart-r16 Huawei, HiSilicon imported from 3GU
R5‑210747 Updating Rel-16 EN-DC PC2 MPR to include powerClassNRPart-r16 Huawei, HiSilicon imported from 3GU
R5‑210748 Updating Rel-16 EN-DC PC2 A-MPR to include powerClassNRPart-r16 Huawei, HiSilicon imported from 3GU
R5‑210749 Updating Rel-16 EN-DC PC2 configured output power to include powerClassNRPart-r16 Huawei, HiSilicon imported from 3GU
R5‑210750 TEI16 Status update of introduction of PowerClassNRPart capability Huawei, HiSilicon imported from 3GU
R5‑210751 Addition of TDD NB-IOT RSTD measurement test case 9.7.1 Huawei, HiSilicon imported from 3GU
R5‑210752 Addition of TDD NB-IOT RSTD measurement test case 9.7.2 Huawei, HiSilicon imported from 3GU
R5‑210753 Addition of TDD NB-IOT RSTD measurement test case 9.7.3 Huawei, HiSilicon imported from 3GU
R5‑210754 Addition of TDD NB-IOT RSTD measurement test case 9.8.1 Huawei, HiSilicon imported from 3GU
R5‑210755 Addition of TDD NB-IOT RSTD measurement test case 9.8.2 Huawei, HiSilicon imported from 3GU
R5‑210756 Addition of TDD NB-IOT RSTD measurement test case 9.8.3 Huawei, HiSilicon imported from 3GU
R5‑210757 Update to Annex C for TDD NB-IOT RSTD measurement test cases Huawei, HiSilicon imported from 3GU
R5‑210758 Addition of applicability for TDD NB-IOT RSTD measurement test cases Huawei, HiSilicon imported from 3GU
R5‑210759 WP - Shortened TTI and processing time for LTE Huawei, HiSilicon imported from 3GU
R5‑210760 SR - Shortened TTI and processing time for LTE Huawei, HiSilicon imported from 3GU
R5‑210761 WP - RF requirements for NR frequency range 1 (FR1) Huawei, HiSilicon imported from 3GU
R5‑210762 SR - RF requirements for NR frequency range 1 (FR1) Huawei, HiSilicon imported from 3GU
R5‑210763 WP - Enhancements on MIMO for NR Huawei, HiSilicon imported from 3GU
R5‑210764 SR - Enhancements on MIMO for NR Huawei, HiSilicon imported from 3GU
R5‑210765 WP - NR URLLC Huawei, HiSilicon imported from 3GU
R5‑210766 SR - NU URLLC Huawei, HiSilicon imported from 3GU
R5‑210767 Update to UECapabilityInformation China Telecommunications imported from 3GU
R5‑210768 Update PDSCH-TimeDomainResourceAllocationList to consider coreset0 for Demod FR2 test cases Keysight Technologies UK Ltd imported from 3GU
R5‑210769 Corrections to DL Multi SPS test case Lenovo, Motorola Mobility, MCC TF160 imported from 3GU
R5‑210770 Update message content in test case 7.3.2.2.2 Keysight Technologies UK Ltd imported from 3GU
R5‑210771 Correction in CodebookConfig for 4Tx RI Demod test cases Keysight Technologies UK Ltd imported from 3GU
R5‑210772 Alignment xOverhead setting with PDSCH RMCs for Demod FR2 testing Keysight Technologies UK Ltd imported from 3GU
R5‑210773 Correction in 6.4.2.1_1 test requirements Keysight Technologies UK Ltd imported from 3GU
R5‑210774 New WID on UE Conformance Test Aspects – High power UE (power class 2) for EN-DC with 1 LTE band + 1 NR TDD band China Unicom imported from 3GU
R5‑210775 On Testability Aspects for FR2 Demodulation Testing Keysight Technologies UK Ltd imported from 3GU
R5‑210776 Correction to the physical configuration for sTTI RF test cases Huawei, HiSilicon imported from 3GU
R5‑210777 Correction to the physical configuration for sTTI Demod test cases Huawei, HiSilicon imported from 3GU
R5‑210778 Correction to the physical configuration for sTTI CQI reporting test case Huawei, HiSilicon imported from 3GU
R5‑210779 Addition of new test case 6.6.2.1_s SEM for sTTI Huawei, HiSilicon imported from 3GU
R5‑210780 Addition of new test case 6.6.2.2_s A-SEM for sTTI Huawei, HiSilicon imported from 3GU
R5‑210781 Addition of new test case 6.6.2.3_s ACLR for sTTI Huawei, HiSilicon imported from 3GU
R5‑210782 Update of A-MPR minimum requirements for Rel-16 DMRS Huawei, HiSilicon imported from 3GU
R5‑210783 Adding TP analysis for Rel-16 DMRS in A-MPR test case Huawei, HiSilicon imported from 3GU
R5‑210784 Adding test point for Rel-16 DMRS in EVM equalizer spectrum flatness test case Huawei, HiSilicon imported from 3GU
R5‑210785 Update of TP analysis for EVM equalizer spectrum flatness for half Pi BPSK Huawei, HiSilicon imported from 3GU
R5‑210786 Adding additional TP for half Pi BPSK DMRS to MPR test case for SUL Huawei, HiSilicon imported from 3GU
R5‑210787 Adding additional TP for half Pi BPSK DMRS to SEM test case for SUL Huawei, HiSilicon imported from 3GU
R5‑210788 Adding additional TP for half Pi BPSK DMRS to NR ACLR test case for SUL Huawei, HiSilicon imported from 3GU
R5‑210789 Update of TP analysis for FR1 SUL test cases Huawei, HiSilicon imported from 3GU
R5‑210790 Addition of new test case 6.4C.2.5 EVM equalizer spectrum flatness for half Pi BPSK DMRS for SUL Huawei, HiSilicon imported from 3GU
R5‑210791 Adding TP selection for 6.4C.2 Transmit modulation quality for SUL Huawei, HiSilicon imported from 3GU
R5‑210792 Adding the test applicability of RF test cases for eMIMO Huawei, HiSilicon imported from 3GU
R5‑210793 Update of the test configuration for carrier leakage for SUL Huawei, HiSilicon imported from 3GU
R5‑210794 Correction to 5GMM Inter-system mobility test case 9.3.1.2 Keysight Technologies UK imported from 3GU
R5‑210795 Clarification of BWP1 and BWP2 in 4.6.1.3, 4.6.1.4, 4.6.1.6 MediaTek Inc. imported from 3GU
R5‑210796 Clarification of BWP1 and BWP2 in 7.6.1.3 and 7.6.1.4 MediaTek Inc. imported from 3GU
R5‑210797 Revised WID on UE Conformance Test Aspects – Single Radio Voice Call Continuity from 5G to 3G China Unicom imported from 3GU
R5‑210798 Addition of new MDT TC 8.1.6.1.3.1 MediaTek Inc., Tejet, SRTC imported from 3GU
R5‑210799 Addition of new MDT TC 8.1.6.1.3.2 MediaTek Inc., Tejet, SRTC imported from 3GU
R5‑210800 Addition of new MDT TC 8.1.6.1.3.3 MediaTek Inc., Tejet, SRTC imported from 3GU
R5‑210801 Adding applicability for new MDT test cases MediaTek Inc., Tejet, SRTC imported from 3GU
R5‑210802 Update of clause 5 to R15 TS 38.521-1 China Unicom imported from 3GU
R5‑210803 Update of R16 CADC configurations into TS38.521-1 clause 5 China Unicom, Huawei, HiSilicon imported from 3GU
R5‑210804 Update of R17 CADC configurations into TS38.521-1 clause 5 China Unicom, Huawei, HiSilicon imported from 3GU
R5‑210805 Update IE SemiStaticChannelAccessConfig Ericsson imported from 3GU
R5‑210806 Discussion paper on confirming successful resource reservation ROHDE & SCHWARZ imported from 3GU
R5‑210807 Correction to NR Idle Mode Test Case 6.3.1.7 ZTE Corporation imported from 3GU
R5‑210808 Correction to 5GS Non-3GPP Access Test Case 9.2.2.2 ZTE Corporation imported from 3GU
R5‑210809 Correction to 5GS Non-3GPP Access Test Case 9.2.4.1 ZTE Corporation imported from 3GU
R5‑210810 Correction to 5GS Non-3GPP Access Test Case 9.2.5.1.4 ZTE Corporation imported from 3GU
R5‑210811 Correction to 5GS Non-3GPP Access Test Case 9.2.5.2.1 ZTE Corporation imported from 3GU
R5‑210812 Update IE ServingCellConfig Ericsson imported from 3GU
R5‑210813 Update FR2 Downlink and Uplink MU values ANRITSU LTD imported from 3GU
R5‑210814 Finalise FR2 Timing MU values ANRITSU LTD imported from 3GU
R5‑210815 Update Test Tolerance analyses for FR2 Tx Timing Test cases ANRITSU LTD imported from 3GU
R5‑210816 Update of FR2 Tx Timing Test case 5.4.1.1 Test Tolerances ANRITSU LTD imported from 3GU
R5‑210817 Update Test Tolerance analyses for FR2 RLM Test cases ANRITSU LTD imported from 3GU
R5‑210818 Update Test Tolerance analyses for FR2 Event-Trig Test cases ANRITSU LTD imported from 3GU
R5‑210819 Update Test Tolerance analyses for FR2 SS-RSRP Test cases ANRITSU LTD imported from 3GU
R5‑210820 Update Test Tolerance analyses for FR1 RLM Test cases ANRITSU LTD imported from 3GU
R5‑210821 Update Test Tolerance for FR1 RLM Test Cases ANRITSU LTD imported from 3GU
R5‑210822 Handover of Test Tolerance review process in RAN5 ANRITSU LTD imported from 3GU
R5‑210823 Summary of known issues for NR RRM Test cases in 38.533 ANRITSU LTD imported from 3GU
R5‑210824 Number of control symbols for RRM tests with 240kHz SSB SCS ANRITSU LTD imported from 3GU
R5‑210825 Editorial update IE SSB-MTC Ericsson imported from 3GU
R5‑210826 Editorial update IE ServingCellConfigCommon Ericsson imported from 3GU
R5‑210827 New WID on UE Conformance Test Aspects – LTE-NR & NR-NR Dual Connectivity and NR CA enhancements Nokia, Nokia Shanghai Bell imported from 3GU
R5‑210828 FDD Inter Frequency Absolute RSRP Accuracy CA Idle Mode Measurements for Non-Overlapping Carrier Nokia, Nokia Shanghai Bell imported from 3GU
R5‑210829 FDD Inter Frequency Absolute RSRP Accuracy CA Idle Mode Measurements for Overlapping Carrier Nokia Corporation imported from 3GU
R5‑210830 FDD Inter Frequency Absolute RSRP Accuracy CA Idle Mode Measurements for Overlapping Carrier Nokia, Nokia Shanghai Bell imported from 3GU
R5‑210831 FDD Intra Frequency Absolute RSRP Accuracy CA Idle Mode Measurements Nokia, Nokia Shanghai Bell imported from 3GU
R5‑210832 Introduction of MU and TT for CA Idle Mode Measurements Nokia, Nokia Shanghai Bell imported from 3GU
R5‑210833 Introduction of CA Idle Mode Measurement RRM Testcase Applicabilities Nokia, Nokia Shanghai Bell imported from 3GU
R5‑210834 Introducing declaration of antenna size D for FR2 tests Anritsu imported from 3GU
R5‑210835 Correction to AoA Test Setup applicability per permitted test method Anritsu imported from 3GU
R5‑210836 Update on FR2 Blocking Test MU Anritsu imported from 3GU
R5‑210837 Update MU for FR2 RRM Anritsu imported from 3GU
R5‑210838 On MU for FR2 Blocker Test using offset antenna Anritsu imported from 3GU
R5‑210839 On declaration of FR2 antenna implementation and test method applicability Anritsu imported from 3GU
R5‑210840 On Quality of Quiet Zone for DFF Anritsu imported from 3GU
R5‑210841 On MU for FR2 Blocker Test Anritsu imported from 3GU
R5‑210842 On MU of IFF DFF test method for FR2 RRM Anritsu imported from 3GU
R5‑210843 On FR2 OBW MU Anritsu imported from 3GU
R5‑210844 On MTSU for FR2 RRM test Anritsu imported from 3GU
R5‑210845 On FR2 relative power measurement uncertainty Anritsu imported from 3GU
R5‑210846 Update of grouping of test cases in clause 8 Huawei, HiSilicon imported from 3GU
R5‑210847 Update of FR1 TT for SCell activation Huawei, HiSilicon imported from 3GU
R5‑210848 Update of FR1 TT for SSB based link recovery Huawei, HiSilicon imported from 3GU
R5‑210849 Update of FR1 TT for CSI-RS based link recovery Huawei, HiSilicon imported from 3GU
R5‑210850 Update of FR1 TT for RRC re-establishment Huawei, HiSilicon imported from 3GU
R5‑210851 Update of FR1 TT for 4.5.5.1 and 4.5.5.2 SSB based LR Huawei, HiSilicon imported from 3GU
R5‑210852 Update of FR1 TT for 4.5.5.3 and 4.5.5.4 CSI-RS based LR Huawei, HiSilicon imported from 3GU
R5‑210853 Correction to 4.6.4.3 and 4.6.4.4 L1-RSRP reporting delay Huawei, HiSilicon imported from 3GU
R5‑210854 Correction to EN-DC radio link monitoring Huawei, HiSilicon imported from 3GU
R5‑210855 Update of 4.5.3.1 SCell activation and deactivation Huawei, HiSilicon imported from 3GU
R5‑210856 Correction to SA radio link monitoring Huawei, HiSilicon imported from 3GU
R5‑210857 Update of FR1 TT for 6.5.5.1 and 6.5.5.2 SSB based LR Huawei, HiSilicon imported from 3GU
R5‑210858 Update of FR1 TT for 6.5.5.3 and 6.5.5.4 CSI-RS based LR Huawei, HiSilicon imported from 3GU
R5‑210859 Correction to NR TC 6.6.3.2-Inter-RAT DRX Huawei, HiSilicon imported from 3GU
R5‑210860 Correction to 6.6.4.3 and 6.6.4.4 L1-RSRP reporting delay Huawei, HiSilicon imported from 3GU
R5‑210861 Update of 6.5.1.2 and 6.5.1.4 SSB based RLM Huawei, HiSilicon imported from 3GU
R5‑210862 Update of 6.5.2 interruption during measurement on deactivated SCC Huawei, HiSilicon imported from 3GU
R5‑210863 Update of 6.5.3.1 SCell activation and deactivation Huawei, HiSilicon imported from 3GU
R5‑210864 Update of D.4 antenna configuration Huawei, HiSilicon imported from 3GU
R5‑210865 Update of Annex F for Test Tolerance Huawei, HiSilicon imported from 3GU
R5‑210866 Correction to CSI-RS RMC Huawei, HiSilicon imported from 3GU
R5‑210867 Correction to default configuration on L1-RSRP reporting in Annex H Huawei, HiSilicon imported from 3GU
R5‑210868 Correction to Table F.1.1.2-2 for FR1 test cases Huawei, HiSilicon imported from 3GU
R5‑210869 Correction to Test Purpose of PDCCH test cases Huawei, HiSilicon imported from 3GU
R5‑210870 Correction to NR test case 6.2.2.1.2.1 Huawei, HiSilicon imported from 3GU
R5‑210871 Correction to NR TC 9.4B.1.1 Huawei, HiSilicon imported from 3GU
R5‑210872 Addition of default configuration of CSI-IM for RRM tests Huawei, HiSilicon imported from 3GU
R5‑210873 Correction of aperiodic CSI-RS reference configuration for RRM tests Huawei, HiSilicon imported from 3GU
R5‑210874 Update of 6.2.3A.1_3 Maximum Power Reduction for CA and HPUE Huawei, HiSilicon imported from 3GU
R5‑210875 Update of 6.6.2.3_1 ACLR for HPUE Huawei, HiSilicon imported from 3GU
R5‑210876 WP - R15 TDD HPUE – Status after RAN5#90-e Huawei, HiSilicon imported from 3GU
R5‑210877 SR - R15 TDD HPUE – Status after RAN5#90-e Huawei, HiSilicon imported from 3GU
R5‑210878 WP - R17 NR_CADC_NR_LTE_DC – Status after RAN5#90-e Huawei, HiSilicon imported from 3GU
R5‑210879 SR - R17 NR_CADC_NR_LTE_DC – Status after RAN5#90-e Huawei, HiSilicon imported from 3GU
R5‑210880 Correction to MultipleCoreset test case Lenovo, Motorola Mobility imported from 3GU
R5‑210881 New MIMO enhancements test case Lenovo, Motorola Mobility imported from 3GU
R5‑210882 Correction to NR IMS TC 7.1-Shorter Retry-after period Huawei, Hisilicon imported from 3GU
R5‑210883 Addition of 6.2.21 TDD Contention Based Random Access on Non-anchor Carrier Test for UE category NB1 UEs In-band mode in Enhanced Coverage Sporton imported from 3GU
R5‑210884 Addition of 7.1.27 E-UTRAN TDD – UE Transmit Timing Accuracy Tests for Category NB1 UE In-Band mode under normal coverage Sporton imported from 3GU
R5‑210885 Addition of 7.1.28 E-UTRAN TDD – UE Transmit Timing Accuracy Tests for Category NB1 UE In-band mode under enhanced coverage Sporton imported from 3GU
R5‑210886 Addition of 7.2.15 E-UTRAN TDD – TDD UE Timing Advance Adjustment Accuracy Test for UE Category NB1 in Standalone Mode under Enhanced Coverage Sporton imported from 3GU
R5‑210887 Addition of 7.3.88 TDD Radio Link Monitoring Test for Out-of-sync in DRX for UE category NB1 In-band mode in normal coverage Sporton imported from 3GU
R5‑210888 Addition of 7.3.89 TDD Radio Link Monitoring Test for Out-of-sync in DRX for UE category NB1 In-band mode in enhanced coverage Sporton imported from 3GU
R5‑210889 Addition of applicability for NB-IoT RRM TDD Test Cases Sporton imported from 3GU
R5‑210890 Addition of Cell configuration mapping for NB-IoT RRM TDD Test Cases in Annex E Sporton imported from 3GU
R5‑210891 Correction of Table number for RRM Radio Link Monitoring Test Cases Sporton imported from 3GU
R5‑210892 Update of MU for addition of new NB-IoT TDD Test Cases Sporton imported from 3GU
R5‑210893 Update of TX Test Cases for UL MIMO in FR2 Sporton imported from 3GU
R5‑210894 Correct of test applicability for TC with and without UL CA Sporton imported from 3GU
R5‑210895 WP UE Conformance Test Aspects - New Rel-17 NR licensed bands and extension of existing NR bands after 90e Huawei, Hisilicon imported from 3GU
R5‑210896 SR UE Conformance Test Aspects - New Rel-17 NR licensed bands and extension of existing NR bands after 90e Huawei, Hisilicon imported from 3GU
R5‑210897 Correction to test frequency parameters for band n83 Huawei, Hisilicon imported from 3GU
R5‑210898 Correction to test frequency parameters for band n84 Huawei, Hisilicon imported from 3GU
R5‑210899 Removal of the highest SCS from test configuration for Tx spurious emissions for CA Huawei, Hisilicon imported from 3GU
R5‑210900 Updating TP analysis for Spurious Emissions for CA in FR1 Huawei, Hisilicon imported from 3GU
R5‑210901 Updating test point analysis for FR1 REFSENS for CA test case Huawei, Hisilicon imported from 3GU
R5‑210902 Updating test case 7.3A.1_1 for 4Rx test requirements Huawei, Hisilicon imported from 3GU
R5‑210903 Editorial correction to clause 7.3.1 Huawei, Hisilicon imported from 3GU
R5‑210904 Updating test case 7.3C.2-Reference sensitivity power level for SUL Huawei, Hisilicon imported from 3GU
R5‑210905 Updating TP analysis for FR1 REFSENS for SUL testing Huawei, Hisilicon imported from 3GU
R5‑210906 Updating A-SEM for MIMO testing for NS_04 Huawei, Hisilicon imported from 3GU
R5‑210907 Updating AMPR for MIMO test case for NS_35 Huawei, Hisilicon imported from 3GU
R5‑210908 Updating test applicability of test case 6.5D.2.4.2-UTRA ACLR for UL MIMO Huawei, Hisilicon imported from 3GU
R5‑210909 Editorial correction to test case 6.2B.4.1.3 Huawei, Hisilicon imported from 3GU
R5‑210910 Correction to RB allocation start for test case 6.3D.4.2 Huawei, Hisilicon imported from 3GU
R5‑210911 Correction to test configuration table Test IDs for test case 6.5D.3.3 Huawei, Hisilicon imported from 3GU
R5‑210912 Correction to test case 6.2.3 AMPR for NS_24 Huawei, Hisilicon imported from 3GU
R5‑210913 Updating Transmitter power for CA requiements for CA_n28A-n41A Huawei, Hisilicon imported from 3GU
R5‑210914 Updating test case general spurious emission for CA_n28A-n41A Huawei, Hisilicon imported from 3GU
R5‑210915 Updating Spurious emission for UE co-existence for CA_n28A-n41A Huawei, Hisilicon imported from 3GU
R5‑210916 Addition of TP analysis for CA_n28A-n41A in Tx Spurious Emision cases Huawei, Hisilicon imported from 3GU
R5‑210917 Updating general requirements for intra-band non-contiguous CA Huawei, Hisilicon imported from 3GU
R5‑210918 Updating MOP and MPR for MIMO testing for several NR bands Huawei, Hisilicon imported from 3GU
R5‑210919 Updating 6.5A.3.1.0 for intra-band CA Huawei, Hisilicon imported from 3GU
R5‑210920 Updating test requirement of CA test cases for CA configurations including n90 Huawei, Hisilicon imported from 3GU
R5‑210921 Updating test case 7.3A.2 for CA_n79D Huawei, Hisilicon imported from 3GU
R5‑210922 Updating test case 7.6A.4 for band n48 Huawei, Hisilicon imported from 3GU
R5‑210923 Adding NR test case-Time mask for Uplink carriers switching Huawei, Hisilicon imported from 3GU
R5‑210924 Adding TP analysis for NR test case-Time mask for UL carrier switching Huawei, Hisilicon imported from 3GU
R5‑210925 Adding MU and TT for Uplink carriers switching testing Huawei, Hisilicon imported from 3GU
R5‑210926 Introduction of PICS for intra-band non-contiguous CA configurations Huawei, Hisilicon imported from 3GU
R5‑210927 Updating Rel-17 mid and highest channel bandwitch for n83 and n84 Huawei, Hisilicon imported from 3GU
R5‑210928 Adding Rel-17 CBW 30MHz test frequencies for n83 Huawei, Hisilicon imported from 3GU
R5‑210929 Updating test frequencies for Rel-17 new CBWs for band n84 Huawei, Hisilicon imported from 3GU
R5‑210930 Updating MPR testing for SUL band n83 Huawei, Hisilicon imported from 3GU
R5‑210931 Updating AMPR testing for SUL band n83 and n84 Huawei, Hisilicon imported from 3GU
R5‑210932 Updating Additional spurious emisisons testing for SUL band n83 and n84 Huawei, Hisilicon imported from 3GU
R5‑210933 Updating clause 6.2C.2 for Rel-17 SUL combinations Huawei, Hisilicon imported from 3GU
R5‑210934 Updating REFSENS for SUL for new R17 configurations Huawei, Hisilicon imported from 3GU
R5‑210935 Discussion about REFSENS for SUL testing for 3CC Huawei, Hisilicon imported from 3GU
R5‑210936 Updating Editror’s Note in 6.2A.2 and 6.2A.4 for intra-band UL CA Huawei, Hisilicon imported from 3GU
R5‑210937 Introducing PICS for CA_n28A-n41A Huawei, Hisilicon imported from 3GU
R5‑210938 Adding PICS for SUL with DL CA configurations Huawei, Hisilicon imported from 3GU
R5‑210939 SR UE Conformance Test Aspects- Additional LTE bands for UE category M1 and/or NB1 in Rel-16 Ericsson imported from 3GU
R5‑210940 WP UE Conformance Test Aspects- Additional LTE bands for UE category M1 and/or NB1 in Rel-16 Ericsson imported from 3GU
R5‑210941 Addition of reference sensitivity test point analyses for FR1 NR CA and EN-DC Ericsson imported from 3GU
R5‑210942 Moving of principles for reference sensitivity test point selection from attachments to annexes Ericsson imported from 3GU
R5‑210943 Adding delta TIB and delta RIB for DC_2-7-7-66_n78 Huawei, HiSilicon imported from 3GU
R5‑210944 Removing Editor note in 6.2B.4 configured transmitted power for EN-DC within FR1 Huawei, HiSilicon imported from 3GU
R5‑210945 Discussion on the default TDD configuration for EN-DC RF test cases Huawei, HiSilicon imported from 3GU
R5‑210946 Correction to default TDD configuration for EN-DC RF test cases Huawei, HiSilicon imported from 3GU
R5‑210947 Removing the reconfiguration of TDD-config across EN-DC Tx test cases Huawei, HiSilicon imported from 3GU
R5‑210948 Discussion on the uplink power configuration for EN-DC RF cases Huawei, HiSilicon imported from 3GU
R5‑210949 Updating the value of P-Max for EN-DC and NR SA test cases Huawei, HiSilicon imported from 3GU
R5‑210950 Updating the value of PLTE for EN-DC test cases Huawei, HiSilicon imported from 3GU
R5‑210951 Correction to the TDM pattern configuration for EN-DC Tx test cases Huawei, HiSilicon imported from 3GU
R5‑210952 Update to 5.4.1.1 EN-DC FR2 UE transmit timing accuracy Qualcomm Technologies Netherlands B.V. imported from 3GU
R5‑210953 Update to 5.4.3.1 EN-DC FR2 timing advance adjustment accuracy Qualcomm Technologies Netherlands B.V. imported from 3GU
R5‑210954 Update to 4.5.4.1 EN-DC FR1 UE UL carrier RRC reconfiguration delay Qualcomm Technologies Netherlands B.V. imported from 3GU
R5‑210955 Update to 4.7.5.1 EN-DC FR1 SFTD measurement accuracy Qualcomm Technologies Netherlands B.V. imported from 3GU
R5‑210956 Update to 6.3.2.2.1 Contention based random access test in FR1 for NR standalone Qualcomm Technologies Netherlands B.V. imported from 3GU
R5‑210957 Update to 6.3.2.2.2 Non-Contention based random access test in FR1 for NR standalone Qualcomm Technologies Netherlands B.V. imported from 3GU
R5‑210958 Update to 6.5.2.1 NR SA FR1 interruptions during measurements on deactivated NR SCC Qualcomm Technologies Netherlands B.V. imported from 3GU
R5‑210959 Update to 6.5.4.1 NR SA FR1 UE UL carrier RRC reconfiguration delay Qualcomm Technologies Netherlands B.V. imported from 3GU
R5‑210960 Update to 6.6.3.1 NR SA FR1 – E-UTRAN event-triggered reporting in non-DRX Qualcomm Technologies Netherlands B.V. imported from 3GU
R5‑210961 Update to 6.6.3.2 NR SA FR1 – E-UTRAN event-triggered reporting in DRX Qualcomm Technologies Netherlands B.V. imported from 3GU
R5‑210962 Spur emission TP analysis R16 DC_2A_n41A Qualcomm Korea imported from 3GU
R5‑210963 Spur emission TP analysis R16 DC_5A_n2A Qualcomm Korea imported from 3GU
R5‑210964 GCF 3GPP TCL after GCF CAG#65 Ericsson imported from 3GU
R5‑210965 RAN5#90-e summary of changes to RAN5 test cases with potential impact on GCF and PTCRB Ericsson, Samsung imported from 3GU
R5‑210966 3GPP RAN5 CA status list (pre-RAN5#90-e meeting) Ericsson imported from 3GU
R5‑210967 3GPP RAN5 CA status list (post-RAN5#90-e meeting) Ericsson imported from 3GU
R5‑210968 WP UE Conformance Test Aspects - Rel-14 LTE CA configurations Ericsson imported from 3GU
R5‑210969 SR UE Conformance Test Aspects - Rel-14 LTE CA configurations Ericsson imported from 3GU
R5‑210970 WP UE Conformance Test Aspects - Rel-15 LTE CA configurations Ericsson imported from 3GU
R5‑210971 SR UE Conformance Test Aspects - Rel-15 LTE CA configurations Ericsson imported from 3GU
R5‑210972 WP UE Conformance Test Aspects - Rel-16 LTE CA configurations Ericsson imported from 3GU
R5‑210973 SR UE Conformance Test Aspects - Rel-16 LTE CA configurations Ericsson imported from 3GU
R5‑210974 WP UE Conformance Test Aspects - 5G system with NR and LTE Ericsson imported from 3GU
R5‑210975 SR UE Conformance Test Aspects - 5G system with NR and LTE Ericsson imported from 3GU
R5‑210976 5GS progress report RAN5#90-e Ericsson imported from 3GU
R5‑210977 Update of RAN5 5G NR phases and target update RAN5#90-e Ericsson imported from 3GU
R5‑210978 WP UE Conformance Test Aspects - New Rel-16 NR bands and extension of existing NR bands Ericsson imported from 3GU
R5‑210979 SR UE Conformance Test Aspects - New Rel-16 NR bands and extension of existing NR bands Ericsson imported from 3GU
R5‑210980 Spur emission TP analysis R16 DC_13A_n2A Qualcomm Korea imported from 3GU
R5‑210981 Spur emission TP analysis R16 DC_48A_n5A Qualcomm Korea imported from 3GU
R5‑210982 Spur emission TP analysis R16 DC_48A_n66A Qualcomm Korea imported from 3GU
R5‑210983 Revised WID: UE Conformance Test Aspects - 5G system with NR and LTE Ericsson imported from 3GU
R5‑210984 Checklist - Adding new NR band or channel bandwidth to existing bands Ericsson imported from 3GU
R5‑210985 Spur emission TP analysis R16 DC_66A_n41A Qualcomm Korea imported from 3GU
R5‑210986 Update for 6.5B.3.3.2 Spurious emission band UE co-existence_Rel16 Qualcomm Korea imported from 3GU
R5‑210987 Update for 6.5B.3.3.2 Spurious emission band UE co-existence Qualcomm Korea imported from 3GU
R5‑210988 Change of RB allocation start in test case 6.3D.4.2 Ericsson imported from 3GU
R5‑210989 Update for 7.3B.2.0 Minimum Conformance Requirements of Reference sensitivity for EN-DC Qualcomm Korea imported from 3GU
R5‑210990 Addition of Note 7 in the Additional Information column of RF conformance test cases with 2Rx and 4Rx Branch in secton 8 and section 9 CAICT imported from 3GU
R5‑210991 Update for 7.3.2 Reference sensitivity power level Qualcomm Korea imported from 3GU
R5‑210992 Correction to XCAP test case 15.5 Qualcomm Incorporated imported from 3GU
R5‑210993 Editorial, cleanup of some references in 38.521-4 Ericsson imported from 3GU
R5‑210994 Update to default MCPTT media plane control messages MCC TF160 imported from 3GU
R5‑210995 Update for 6.5.3.2 Spurious emission for UE co-existence_R15 Qualcomm Korea imported from 3GU
R5‑210996 Addition of test case 6.5D.2_1.4.2, UTRA ACLR for UL MIMO (Rel-16 onward) Ericsson imported from 3GU
R5‑210997 Update for 6.5.3.2 Spurious emission for UE co-existence_R16 Qualcomm Korea imported from 3GU
R5‑210998 Correction to applicability conditions of test cases 8.1.4.2.1.2 and 11.1.9 Qualcomm Incorporated, MCC TF160 imported from 3GU
R5‑210999 TP analysis for test case 6.5D.1_1, Occupied bandwidth for UL MIMO (Rel-16 onward) Ericsson imported from 3GU
R5‑211000 Correction to EN-DC Wideband Intermodulation tests Bureau Veritas imported from 3GU
R5‑211001 Update to NR FR1 2Rx-4Rx implementation Capabilities Bureau Veritas, Samsung imported from 3GU
R5‑211002 Correction to TC6.4.2.5 EVM equalizer spectrum flatness for Pi2 BPSK Bureau Veritas imported from 3GU
R5‑211003 Update to applicability spec for 5G test cases Bureau Veritas, China Mobile, ROHDE & SCHWARZ, TTA, LG Electronics, KTL, Ericsson, Huawei imported from 3GU
R5‑211004 Update to EN-DC R15 Configuration information in clause 5 Bureau Veritas imported from 3GU
R5‑211005 Update to EN-DC R16 Configuration information in clause 5 Bureau Veritas, Ericsson imported from 3GU
R5‑211006 Update to EN-DC R17 Configuration information in clause 5 Bureau Veritas imported from 3GU
R5‑211007 Correction to NR TC 9.1.8.1-SMS Huawei, Hisilicon imported from 3GU
R5‑211008 Update of CA_n1A-n78C into 3DL CA Refsense TC 7.3A.2 China Unicom imported from 3GU
R5‑211009 Update to NR RRC test case 8.1.1.3.2 Qualcomm Incorporated imported from 3GU
R5‑211010 Update of reference sensitivity for intra-band contiguous EN-DC Huawei, HiSilicon imported from 3GU
R5‑211011 Update of reference sensitivity for intra-band non-contiguous EN-DC Huawei, HiSilicon imported from 3GU
R5‑211012 Update of reference sensitivity for inter-band 2CC EN-DC Huawei, HiSilicon imported from 3GU
R5‑211013 Correction to refsens test requirements for DC_1A-7A_n78A Huawei, HiSilicon imported from 3GU
R5‑211014 Adding in-gap tests to ACS for intra-band non-contiguous EN-DC Huawei, HiSilicon imported from 3GU
R5‑211015 Discussion on test coverage for reference sensitivity for EN-DC configs with exceptions Huawei, HiSilicon imported from 3GU
R5‑211016 Update of test configuration for inter-band 2CC EN-DC configurations affected by reference sensitivity exceptions Huawei, HiSilicon imported from 3GU
R5‑211017 Update of test coverage for reference sensitivity for 3CC EN-DC Huawei, HiSilicon imported from 3GU
R5‑211018 TP analysis for test case 6.5D.2_1.4.2, UTRA ACLR for UL MIMO (Rel-16 onward) Ericsson imported from 3GU
R5‑211019 Update of Inter system mobility test case 9.3.1.1 Qualcomm Incorporated imported from 3GU
R5‑211020 Adding EN-DC configurations DC_1A-28A_n3A and DC_7A-28A_n3A to clause 5.5B.4.2 Ericsson imported from 3GU
R5‑211021 Adding Delta TIB,c for DC_1A-28A_n3A, DC_7A-20A_n1A and DC_7A-28A_n3A to clause 6.2B.4.2.3.3 Ericsson imported from 3GU
R5‑211022 Update to idle mode test cases 6.2.1.2, 6.2.1.3, 6.4.3.1 Qualcomm Incorporated imported from 3GU
R5‑211023 Correction to LTE test case 8.2.4.1 for CAT-M mode UEs ROHDE & SCHWARZ imported from 3GU
R5‑211024 Update of Tx test procedure for PC2 UE on FDD bands due to maxUplinkDutyCycle Huawei, HiSilicon, Bureau Veritas imported from 3GU
R5‑211025 Update of UAC test case 11.3.6 Qualcomm Incorporated imported from 3GU
R5‑211026 Update of CA_n1A-n78C into 3DL CA maximum input level TC 7.4A.2 China Unicom imported from 3GU
R5‑211027 Update to NR RRC test case 8.1.5.8.1 Qualcomm Incorporated imported from 3GU
R5‑211028 Addition of new test case 6.2A.1.1.4 UE maximum output power - EIRP and TRP for 5UL CA KTL imported from 3GU
R5‑211029 Addition of new test case 6.2A.1.1.5 UE maximum output power - EIRP and TRP for 6UL CA KTL imported from 3GU
R5‑211030 Addition of new test case 6.2A.1.1.6 UE maximum output power - EIRP and TRP for 7UL CA KTL imported from 3GU
R5‑211031 Addition of new test case 6.2A.1.1.7 UE maximum output power - EIRP and TRP for 8UL CA KTL imported from 3GU
R5‑211032 Correction test frequencies for CA_n261(2A) Ericsson imported from 3GU
R5‑211033 Correction test frequencies for CA_n261(2A) for protocol testing Ericsson imported from 3GU
R5‑211034 Correction of protocol applicability for test frequencies for DC_xA_n261(2A) configurations Ericsson imported from 3GU
R5‑211035 Introduction of UE capabilities for Rel-15 EN-DC FR1 configurations Ericsson imported from 3GU
R5‑211036 Introduction of UE capabilities for Rel-15 EN-DC FR2 configuration CA_n261(2A) Ericsson imported from 3GU
R5‑211037 Addition of minimum requirement for intra-band UL CA in the test case 6.4A.2 KTL imported from 3GU
R5‑211038 Addition of procedure for clearing UE’s Last Registered PLMN (RPLMN) Qualcomm Incorporated imported from 3GU
R5‑211039 Issues with pre-established session establishment UPV/EHU, Nemergent Solutions imported from 3GU
R5‑211040 Addition of 70M into 38.521-1 TC6.3A.1 China Unicom imported from 3GU
R5‑211041 Addition of 70M into 38.521-1 TC6.3D China Unicom imported from 3GU
R5‑211042 Spurious emissions for UE co-existence update to core specs Keysight Technologies UK Ltd imported from 3GU
R5‑211043 Addition of new IMS over 5GS TC 8.38 Communication Waiting and cancelling the call / 5GS Qualcomm Incorporated imported from 3GU
R5‑211044 Update of References in 36.579-1 Samsung imported from 3GU
R5‑211045 Discussion paper on impact of UE’s highest channel bandwidth capability on Transport Block Selection test cases Qualcomm Incorporated imported from 3GU
R5‑211046 Update message content for PMI reporting test cases Keysight Technologies UK Ltd imported from 3GU
R5‑211047 Clarification on the connection diagram for FR2 demod and RRM test cases Anritsu imported from 3GU
R5‑211048 Correction to test tolerance for FR1 blocking tests Anritsu imported from 3GU
R5‑211049 Additional of default downlink level for FR2 Anritsu imported from 3GU
R5‑211050 Updating applicability in test case 5.2.2.2.4_1 Ericsson imported from 3GU
R5‑211051 Introduction of additional Rel-15 EN-DC inter-band configurations to EN-DC MOP test case 6.2B.1.3 Ericsson imported from 3GU
R5‑211052 Introduction of dTIB,c for inter-band EN-DC Rel-15 EN-DC inter-band configurations Ericsson imported from 3GU
R5‑211053 Introduction of Rel-15 EN-DC configuration DC_8A_n77A to spurious emission test case 6.5B.3.3.2 Ericsson imported from 3GU
R5‑211054 Introduction of Rel-15 EN-DC configuration DC_11A_n77A to spurious emission test case 6.5B.3.3.2 Ericsson imported from 3GU
R5‑211055 Introduction of Rel-15 EN-DC configuration DC_11A_n78A to spurious emission test case 6.5B.3.3.2 Ericsson imported from 3GU
R5‑211056 Introduction of Rel-15 EN-DC configuration DC_11A_n79A to spurious emission test case 6.5B.3.3.2 Ericsson imported from 3GU
R5‑211057 Introduction of Rel-15 EN-DC configuration DC_25A_n41A to spurious emission test case 6.5B.3.3.2 Ericsson imported from 3GU
R5‑211058 Introduction of Rel-15 EN-DC configuration DC_26A_n41A to spurious emission test case 6.5B.3.3.2 Ericsson imported from 3GU
R5‑211059 Introduction of Rel-15 EN-DC configuration DC_26A_n77A to spurious emission test case 6.5B.3.3.2 Ericsson imported from 3GU
R5‑211060 Introduction of Rel-15 EN-DC configuration DC_26A_n78A to spurious emission test case 6.5B.3.3.2 Ericsson imported from 3GU
R5‑211061 Introduction of Rel-15 EN-DC configuration DC_26A_n79A to spurious emission test case 6.5B.3.3.2 Ericsson imported from 3GU
R5‑211062 Introduction of Rel-15 EN-DC configuration DC_41A_n77A to spurious emission test case 6.5B.3.3.2 Ericsson imported from 3GU
R5‑211063 Introduction of Rel-15 EN-DC configuration DC_41A_n78A to spurious emission test case 6.5B.3.3.2 Ericsson imported from 3GU
R5‑211064 Introduction of spurious emission TP analysis for Rel-15 EN-DC configuration DC_8A_n77A Ericsson imported from 3GU
R5‑211065 Introduction of spurious emission TP analysis for Rel-15 EN-DC configuration DC_11A_n77A Ericsson imported from 3GU
R5‑211066 Introduction of spurious emission TP analysis for Rel-15 EN-DC configuration DC_11A_n78A Ericsson imported from 3GU
R5‑211067 Introduction of spurious emission TP analysis for Rel-15 EN-DC configuration DC_11A_n79A Ericsson imported from 3GU
R5‑211068 Introduction of spurious emission TP analysis for Rel-15 EN-DC configuration DC_25A_n41A Ericsson imported from 3GU
R5‑211069 Introduction of spurious emission TP analysis for Rel-15 EN-DC configuration DC_26A_n41A Ericsson imported from 3GU
R5‑211070 Introduction of spurious emission TP analysis for Rel-15 EN-DC configuration DC_26A_n77A Ericsson imported from 3GU
R5‑211071 Introduction of spurious emission TP analysis for Rel-15 EN-DC configuration DC_26A_n78A Ericsson imported from 3GU
R5‑211072 Introduction of spurious emission TP analysis for Rel-15 EN-DC configuration DC_26A_n79A Ericsson imported from 3GU
R5‑211073 Introduction of spurious emission TP analysis for Rel-15 EN-DC configuration DC_41A_n77A Ericsson imported from 3GU
R5‑211074 Introduction of spurious emission TP analysis for Rel-15 EN-DC configuration DC_41A_n78A Ericsson imported from 3GU
R5‑211075 Adding new test case 6.3.2.2.3, 2Rx TDD FR1 Single PMI with 16Tx Type1 - SinglePanel codebook for both SA and NSA Ericsson imported from 3GU
R5‑211076 Introduction of test frequencies for n41 adding CBW 70 MHz Ericsson imported from 3GU
R5‑211077 Introduction of test frequencies for n48 adding CBW 70 MHz - DL only Ericsson imported from 3GU
R5‑211078 Adding new test case 6.3.2.2.4, 2Rx TDD FR1 Single PMI with 32Tx Type1 - SinglePanel codebook for both SA and NSA Ericsson imported from 3GU
R5‑211079 Adding new test case 6.3.3.2.3, 4Rx TDD FR1 Single PMI with 16Tx Type1 - SinglePanel codebook for both SA and NSA Ericsson imported from 3GU
R5‑211080 New WID on UE Conformance Test Aspects for NR-based Access to Unlicensed Spectrum Qualcomm Wireless GmbH imported from 3GU
R5‑211081 Update to downlink physical channel EPRE level for LTE-NR coex scenario Qualcomm Wireless GmbH imported from 3GU
R5‑211082 Test case structure updates for CA PDSCH Demodulation test cases Qualcomm Wireless GmbH imported from 3GU
R5‑211083 Input on fading crest factor margin for FR2 Demodulation test cases Qualcomm Wireless GmbH imported from 3GU
R5‑211084 Update to FR2 PDSCH test case for maximum testable SNR Qualcomm Wireless GmbH imported from 3GU
R5‑211085 Update to FR2 CQI reporting test case for maximum testable SNR Qualcomm Wireless GmbH imported from 3GU
R5‑211086 Adding new CSI test cases to annex F Ericsson imported from 3GU
R5‑211087 New WID - UE Conformance Test Aspects - Support of eCall over IMS for NR Qualcomm Incorporated imported from 3GU
R5‑211088 Correction to A-MPR test requirement of NS_22 in TC 6.2.4 Anritsu imported from 3GU
R5‑211089 Clarification on the initialBWP condition in PDCCH-ConfigCommon in 4.6.3 Anritsu imported from 3GU
R5‑211090 Correction to the message contents for CQI reporting tests in 5.4.2.4 Anritsu imported from 3GU
R5‑211091 Correction to the message contents for PMI reporting tests in 5.4.2.5 Anritsu imported from 3GU
R5‑211092 Test ID separation to powerBoostPiBPSK 1 and 0 in Table 6.5.2.2.4.1-1 Anritsu imported from 3GU
R5‑211093 Correction to ACLR relaxation value in TC 6.5.2.3 Anritsu imported from 3GU
R5‑211094 Correction to assumption of aggregated channel bandwidth in TC 6.5A.2.2 Anritsu imported from 3GU
R5‑211095 Correction to definition of power control window size in FR2 relative power tolerance in TC 6.3.4.3 Anritsu imported from 3GU
R5‑211096 Correction to editors note about beam peak direction Anritsu imported from 3GU
R5‑211097 Definition of relaxation value of spurious emissions UE co-existence in TC 6.5.3.2 Anritsu imported from 3GU
R5‑211098 Update FR2 MU and TT in 38.521-2 Anritsu imported from 3GU
R5‑211099 Correction to editors note about number of E-UTRA carriers Anritsu imported from 3GU
R5‑211100 Correction to MOP and MPR test procedures for PC2 in TC 6.2B.1.3 and 6.2B.2.1 Anritsu imported from 3GU
R5‑211101 Correction to test points of FR1 EN-DC intermodulation with 3CC in TC 7.8B.2.6 Anritsu imported from 3GU
R5‑211102 Update FR2 MU and TT in 38.521-3 Anritsu imported from 3GU
R5‑211103 Update FR2 MU and TT in 38.903 Anritsu imported from 3GU
R5‑211104 Correction of parameters of FR2 ACLR test cases Anritsu imported from 3GU
R5‑211105 The degradation of TE noise floor for ON OFF time mask and how to avoid it Anritsu imported from 3GU
R5‑211106 Discussion on subclause drafting rules in RAN5 specs ZTE Corporation imported from 3GU
R5‑211107 Corrections to subclauses in 38.508-1 with appropriate subclause level and heading styles ZTE Corporation imported from 3GU
R5‑211108 Corrections to subclauses in 38.508-2 with appropriate subclause level and heading styles ZTE Corporation imported from 3GU
R5‑211109 Corrections to subclauses in 38.521-1 with appropriate subclause level and heading styles ZTE Corporation imported from 3GU
R5‑211110 Corrections to subclauses in 38.521-2 with appropriate subclause level and heading styles ZTE Corporation imported from 3GU
R5‑211111 Corrections to subclauses in 38.521-3 with appropriate subclause level and heading styles ZTE Corporation imported from 3GU
R5‑211112 Discussion on inter-band CA configurations in RAN5 specs ZTE Corporation imported from 3GU
R5‑211113 Corrections to reference figures for transmission bandwidth in FR1 ZTE Corporation imported from 3GU
R5‑211114 Corrections to reference figures for transmission bandwidth configuration in FR2 ZTE Corporation imported from 3GU
R5‑211115 Update of 4.3.1.1.3.40.1 for test frequency of NR intra-band contiguous CA_n40B ZTE Corporation imported from 3GU
R5‑211116 Update of 4.3.1.1.3.41.1 for test frequency of NR intra-band contiguous CA_n41C ZTE Corporation imported from 3GU
R5‑211117 Update of 4.3.1.1.3.66.1 for test frequency of NR intra-band contiguous CA_n66B ZTE Corporation imported from 3GU
R5‑211118 Update of 4.3.1.1.3.78.1 for test frequency of NR intra-band contiguous CA_n78C ZTE Corporation imported from 3GU
R5‑211119 Update of 4.3.1.1.3.78.2 for test frequency of NR intra-band contiguous CA_n78B ZTE Corporation imported from 3GU
R5‑211120 Update of 4.3.1.0A for mid test channel bandwidth ZTE Corporation imported from 3GU
R5‑211121 Update of 4.3.1.3.2.1 for test frequencies for NR-DC configurations between FR1 and FR2 ZTE Corporation imported from 3GU
R5‑211122 Update of 4.3.1.4.1 for test frequencies for EN-DC band combinations within FR1 ZTE Corporation imported from 3GU
R5‑211123 Update of 4.3.1.5.1 for test frequencies for EN-DC band combinations including FR2 ZTE Corporation imported from 3GU
R5‑211124 Update of 4.3.1.6.1.3 for test frequencies for EN-DC band combinations including FR1 and FR2 ZTE Corporation imported from 3GU
R5‑211125 Update of 5.3B for UE channel bandwidth for EN-DC ZTE Corporation imported from 3GU
R5‑211126 Update of 5.5A.2 for corrections to configurations for intra-band non-contiguous CA ZTE Corporation imported from 3GU
R5‑211127 Minor corrections of 4.1 for test environment conditions ZTE Corporation imported from 3GU
R5‑211128 Correction of Table A.4.3.2B.2.3.12-1 Google Inc. imported from 3GU
R5‑211129 Introduction of dRIB,c for inter-band EN-DC Rel-15 EN-DC inter-band configurations Ericsson imported from 3GU
R5‑211130 Completion C384 and C385 of Table 4-1a Google Inc. imported from 3GU
R5‑211131 WP UE Conformance Test Aspects – Rel14 Enhanced Full Dimension MIMO for LTE Ericsson imported from 3GU
R5‑211132 SR UE Conformance Test Aspects – Rel14 Enhanced Full Dimension MIMO for LTE Ericsson imported from 3GU
R5‑211133 Addition of ULFPTx in MPR test case Ericsson imported from 3GU
R5‑211134 TP analysis for ULFPTx in MPR test case Ericsson imported from 3GU
R5‑211135 Discussion on test points for EN-DC refsens with exception avoiding Ericsson imported from 3GU
R5‑211136 TP analysis update for EN_DC refsens Ericsson imported from 3GU
R5‑211137 Update of 2CC refsens test case 7.3B.2.3 Ericsson imported from 3GU
R5‑211138 Update of 3CC refsens test case 7.3B.2.3_1.1 Ericsson imported from 3GU
R5‑211139 Correction of configurations not to be tested in 4CC refsens test case 7.3B.2.3_1.2 Ericsson imported from 3GU
R5‑211140 TP analysis for DC_8A_n77A Ericsson imported from 3GU
R5‑211141 Addition of DC_8A_n77A in test case 7.3B.2.3 Ericsson imported from 3GU
R5‑211142 TP analysis for DC_11A_n79A Ericsson imported from 3GU
R5‑211143 Addition of DC_11A_n79A in test case 7.3B.2.3 Ericsson imported from 3GU
R5‑211144 TP analysis for DC_26A_n41A Ericsson imported from 3GU
R5‑211145 Addition of DC_26A_n41A in test case 7.3B.2.3 Ericsson imported from 3GU
R5‑211146 TP analysis for DC_26A_n77A and DC_26A_n78A Ericsson imported from 3GU
R5‑211147 Addition of DC_26A_n77A and DC_26A_n78A in test case 7.3B.2.3 Ericsson imported from 3GU
R5‑211148 TP analysis for DC_26A_n79A Ericsson imported from 3GU
R5‑211149 Addition of DC_26A_n79A in test case 7.3B.2.3 Ericsson imported from 3GU
R5‑211150 TP analysis for DC_41A_n77A and DC_41A_n78A Ericsson imported from 3GU
R5‑211151 Addition of DC_41A_n77A and DC_41A_n78A in test case 7.3B.2.3 Ericsson imported from 3GU
R5‑211152 Updates to global conditions used in default messages MCC TF160 imported from 3GU
R5‑211153 WP UE Conformance Test Aspects- Even further mobility enhancement for E-UTRAN after RAN5#90-e China Telecom imported from 3GU
R5‑211154 SR UE Conformance Test Aspects- Even further mobility enhancement for E-UTRAN after RAN5#90-e China Telecom imported from 3GU
R5‑211155 WP UE Conformance Test Aspects for add support of NR DL 256QAM for FR2 China Telecom imported from 3GU
R5‑211156 SR UE Conformance Test Aspects for add support of NR DL 256QAM for FR2 China Telecom imported from 3GU
R5‑211157 SR UE Conformance Test Aspects for NR performance requirement enhancement after RAN5#90-e China Telecom imported from 3GU
R5‑211158 Addition of applicability new test case 6.3.2.1.3 in TS 38.521-4 China Telecom imported from 3GU
R5‑211159 Addition of applicability new test case 6.3.3.1.3 in TS 38.521-4 China Telecom imported from 3GU
R5‑211160 Addition of new test case 6.3.2.1.3 2Rx FDD FR1 Multiple PMI with 16Tx Type1 - SinglePanel codebook for both SA and NSA China Telecom imported from 3GU
R5‑211161 Addition of new test case 6.3.3.1.3 4Rx FDD FR1 Multiple PMI with 16Tx Type1 - SinglePanel codebook for both SA and NSA China Telecom imported from 3GU
R5‑211162 Addtion of E-UTRAN TC 8.2.4.30.1 DAPS handover China Telecom imported from 3GU
R5‑211163 WP UE Conformance Test Aspects - Even further enhanced MTC for LTE Ericsson imported from 3GU
R5‑211164 SR UE Conformance Test Aspects - Even further enhanced MTC for LTE Ericsson imported from 3GU
R5‑211165 Introduction of support for URLLC Ericsson imported from 3GU
R5‑211166 Addition of QoS for URLLC Ericsson imported from 3GU
R5‑211167 Updates to REGISTRATION ACCEPT message Ericsson imported from 3GU
R5‑211168 Updates to PDU SESSION ESTABLISHMENT ACCEPT message Ericsson imported from 3GU
R5‑211169 Addition of URSP details Ericsson imported from 3GU
R5‑211170 Editorial update to BandCombinationListSidelink IE Ericsson imported from 3GU
R5‑211171 Update to RRCReconfiguration-Speech IE Ericsson imported from 3GU
R5‑211172 Editorial updates to RACH-ConfigCommon IE Ericsson imported from 3GU
R5‑211173 Correction NR RRC idle mode test case 6.1.2.14 ANRITSU LTD imported from 3GU
R5‑211174 Addition of R17 new CBWs into 38.521-1 clause 5 China Unicom, Huawei, HiSilicon imported from 3GU
R5‑211175 FR2 Minimum output power measurement uncertainty update Keysight Technologies UK Ltd imported from 3GU
R5‑211176 Reference to measurement BW corrected in 6.5D.4 TX intermodulation test case Keysight Technologies UK Ltd imported from 3GU
R5‑211177 Correction of Table 4.1-1 Google Inc. imported from 3GU
R5‑211178 Updating test frequencies for Rel-17 inter-band EN-DC configurations for band n1 DOCOMO Communications Lab. imported from 3GU
R5‑211179 On Additional Spurious emissions Keysight Technologies UK Ltd imported from 3GU
R5‑211180 Correction of Table A.4.3-3d Google Inc. imported from 3GU
R5‑211181 PC1 and PC3 Updates for Band n14 AT&T imported from 3GU
R5‑211182 Addition of PICS powerBoosting-pi2BPSK Google Inc. imported from 3GU
R5‑211183 Correction PICS condition of test case 6.4.2.5 Google Inc. imported from 3GU
R5‑211184 On ETC MUs Keysight Technologies UK Ltd, Rohde & Schwarz imported from 3GU
R5‑211185 CR to 38.903 on ETC Testing Keysight Technologies UK Ltd imported from 3GU
R5‑211186 On Larger Quiet Zone Sizes with Grey Box Keysight Technologies UK Ltd imported from 3GU
R5‑211187 CR to 38.508-1 on larger quiet zone with grey box approach Keysight Technologies UK Ltd imported from 3GU
R5‑211188 CR to 38.521-2 on larger quiet zone with grey box approach Keysight Technologies UK Ltd imported from 3GU
R5‑211189 PC1 MUs based on the revised antenna array assumptions Keysight Technologies UK Ltd imported from 3GU
R5‑211190 CR to 38.521-2 on PC1 Measurement Grid MUs Keysight Technologies UK Ltd imported from 3GU
R5‑211191 CR to 38.903 on PC1 Measurement Grid MUs Keysight Technologies UK Ltd imported from 3GU
R5‑211192 On n259 QoQZ and XPD MU Keysight Technologies UK Ltd imported from 3GU
R5‑211193 On the MU Element “Uncertainty of an absolute gain of the calibration antenna” for n259 Keysight Technologies UK Ltd imported from 3GU
R5‑211194 On Declaration of Antenna Aperture for DFF based RRM systems Keysight Technologies UK Ltd imported from 3GU
R5‑211195 CR to 38.508-2 on Antenna Aperture Declarations Keysight Technologies UK Ltd imported from 3GU
R5‑211196 Updating UE capability for Rel-17 NR CA configuration DOCOMO Communications Lab. imported from 3GU
R5‑211197 SR UE Conformance Test Aspects- ENDC_UE_PC2_FDD_TDD after R5#90e China Unicom imported from 3GU
R5‑211198 WP UE Conformance Test Aspects- ENDC_UE_PC2_FDD_TDD after R5#90e China Unicom imported from 3GU
R5‑211199 Specify CSI-SSB-ResourceSet for RRM ROHDE & SCHWARZ imported from 3GU
R5‑211200 Applicability for 5.4.3.1 ROHDE & SCHWARZ imported from 3GU
R5‑211201 Applicability for FR2 iRAT ROHDE & SCHWARZ imported from 3GU
R5‑211202 Applicability for 4.5.7.1 ROHDE & SCHWARZ imported from 3GU
R5‑211203 Editorial for Table 6.6.2-10 Reference packet filter #9 NIST imported from 3GU
R5‑211204 Editorial update IE BWP Ericsson imported from 3GU
R5‑211205 Correction to Test Case 10.2.2 NIST imported from 3GU
R5‑211206 FR1 Test Tolerance review training Ericsson imported from 3GU
R5‑211207 FR2 Test Tolerance review training Ericsson imported from 3GU
R5‑211208 Update of Test Tolerance analysis for FR1 event triggered reporting test cases Ericsson imported from 3GU
R5‑211209 Update of Test Tolerance analysis for FR1 SSB-based L1-RSRP test cases Ericsson imported from 3GU
R5‑211210 Update of Test Tolerance analysis for FR1 CSI-RS based L1-RSRP test cases Ericsson imported from 3GU
R5‑211211 Correction of applied TT for EN-DC FR1 L1-RSRP measurement test cases Ericsson imported from 3GU
R5‑211212 Correction of applied TT for SA FR1 L1-RSRP measurement test cases Ericsson imported from 3GU
R5‑211213 Correction of EN-DC FR2 inter-freq measurement test case 5.6.2.1 including TT Ericsson imported from 3GU
R5‑211214 Correction of EN-DC FR2 inter-freq measurement test case 5.6.2.3 including TT Ericsson imported from 3GU
R5‑211215 Correction of SA FR2 inter-freq measurement test case 7.6.2.1 including TT Ericsson imported from 3GU
R5‑211216 Correction of SA FR2 inter-freq measurement test case 7.6.2.3 including TT Ericsson imported from 3GU
R5‑211217 Correction of MTSU and applied TT in Annex F Ericsson imported from 3GU
R5‑211218 Addition of new RRM test cases to the applicability table in 4.2 Ericsson imported from 3GU
R5‑211219 Correction of the minimum conformance requirements for Inter-RAT measurements 6.6.3.0 Ericsson imported from 3GU
R5‑211220 Addition of new RRM iRAT measurement Inter-RAT measurements test case 6.6.3.3 Ericsson imported from 3GU
R5‑211221 Correction of the minimum conformance requirements for E-UTRA – NR FR1 Cell reselection 8.2.1.0 Ericsson imported from 3GU
R5‑211222 Addition of new RRM E-UTRA – NR FR1 Cell reselection test case 8.2.1.2 Ericsson imported from 3GU
R5‑211223 Correction of the minimum conformance requirements for E-UTRA – NR Inter-RAT event triggered reporting tests 8.4.2.0 Ericsson imported from 3GU
R5‑211224 Addition of new RRM E-UTRA – NR Inter-RAT event triggered reporting test case 8.4.2.9 Ericsson imported from 3GU
R5‑211225 Addition of new RMCs and OCNGs into Annex A Ericsson imported from 3GU
R5‑211226 Updating UE capability for Rel-17 NR inter-band EN-DC configurations for band n1 DOCOMO Communications Lab. imported from 3GU
R5‑211227 Discussion on PCC prioritization for FR1 and FR2 UL CA testing Qualcomm Finland RFFE Oy imported from 3GU
R5‑211228 Test Point analysis update for FR2 Tx additional spurious emission test case Qualcomm Finland RFFE Oy imported from 3GU
R5‑211229 Add n26 to 2Rx capabilities declaration Dish Network imported from 3GU
R5‑211230 NS_12, NS_13, NS_14, NS_15 TP analysis to 38.905 Dish Network imported from 3GU
R5‑211231 FR2 Tx additional spurious emission test case updates Qualcomm Finland RFFE Oy imported from 3GU
R5‑211232 Quality of the Quiet Zone measurement results for 20cm QZ ROHDE & SCHWARZ imported from 3GU
R5‑211233 Correction of test frequencies for NR band n48 Ericsson imported from 3GU
R5‑211234 Update to NR RRC UE capability transfer test case 8.1.5.1.1 Qualcomm Incorporated imported from 3GU
R5‑211235 Discussion on the size of Quiet Zone above 30cm ROHDE & SCHWARZ imported from 3GU
R5‑211236 Addition of band 7, 42, 43 and 65 for UE category M1 and NB1 to clause 5 Ericsson imported from 3GU
R5‑211237 Addition of band 7, 42, 43 and 65 for UE category M1 and NB1 to clause 6 Ericsson imported from 3GU
R5‑211238 Addition of band 7, 42, 43 and 65 for UE category M1 and NB1 to clause 7.3 Ericsson imported from 3GU
R5‑211239 Introduction of DC_1A-28A_n3A to reference sensitivity test Ericsson imported from 3GU
R5‑211240 Introduction of DC_7A-20A_n1A ^^to reference sensitivity test Ericsson imported from 3GU
R5‑211241 Introduction of DC_7A-28A_n3A^^to reference sensitivity test Ericsson imported from 3GU
R5‑211242 Reference sensitivity TP analysis for DC_1A-28A_n3A Ericsson imported from 3GU
R5‑211243 Reference sensitivity analysis for DC_3A-7A_n1A Ericsson imported from 3GU
R5‑211244 Reference sensitivity TP analysis for DC_7A-20A_n1A Ericsson imported from 3GU
R5‑211245 Reference sensitivity TP analysis for DC_7A-28A_n3A Ericsson imported from 3GU
R5‑211246 Update to MR-DC RRC UE capability transfer test case 8.2.1.1.1 Qualcomm Incorporated imported from 3GU
R5‑211247 Simplified Quality of the Quiet Zone procedure ROHDE & SCHWARZ imported from 3GU
R5‑211248 Updating UE capability for Rel-16 NR inter-band CA configurations for band n1 DOCOMO Communications Lab. imported from 3GU
R5‑211249 Discussion paper to align DL CA Rx test cases Dish Network imported from 3GU
R5‑211250 Correction to MCVideo Test Case 6.1.1.9 NIST imported from 3GU
R5‑211251 CR to 38.508-2 on larger quiet zone with grey box approach Keysight Technologies UK Ltd imported from 3GU
R5‑211252 Updating Rel-16 NR inter-band CA configuration for band n1 DOCOMO Communications Lab. imported from 3GU
R5‑211253 Updating Rel-17 NR inter-band EN-DC configurations for band n1 DOCOMO Communications Lab. imported from 3GU
R5‑211254 Adding an MCPTT test case to the applicability table NIST imported from 3GU
R5‑211255 Clarification of BWP1 and BWP2 in 4.6.1.3, 4.6.1.4, 4.6.1.6 Keysight Technologies UK Ltd imported from 3GU
R5‑211256 Updating 6.2A.1.1 for CA_n1A-n79A DOCOMO Communications Lab. imported from 3GU
R5‑211257 Update for Band 48 in test case 6.2.2 ROHDE & SCHWARZ imported from 3GU
R5‑211258 Editorial Correction in test case 7.3A9 ROHDE & SCHWARZ imported from 3GU
R5‑211259 On the achievable SNR for demod test cases ROHDE & SCHWARZ imported from 3GU
R5‑211260 Update of FR2 demod test cases ROHDE & SCHWARZ imported from 3GU
R5‑211261 Update of demod SNR testability ROHDE & SCHWARZ imported from 3GU
R5‑211262 On the QoQZ standard deviation for ETC testing ROHDE & SCHWARZ imported from 3GU
R5‑211263 On the MU for n259 ROHDE & SCHWARZ imported from 3GU
R5‑211264 Update of QoQZ MU ROHDE & SCHWARZ imported from 3GU
R5‑211265 Update of ETC MTSU ROHDE & SCHWARZ imported from 3GU
R5‑211266 On the MU of FR2 OBW ROHDE & SCHWARZ imported from 3GU
R5‑211267 Update of Annex F for test case 7.3.4 ROHDE & SCHWARZ imported from 3GU
R5‑211268 On FR2 ON/OFF Time Mask ROHDE & SCHWARZ imported from 3GU
R5‑211269 Correction to MCVideo Test Case 6.2.6 NIST imported from 3GU
R5‑211270 Updating 6.2B.1.3 for Rel-17 NR inter-band EN-DC configurations for band n1 DOCOMO Communications Lab. imported from 3GU
R5‑211271 Editorial for correcting heading styles NIST imported from 3GU
R5‑211272 Correction to clause 4.5.2 RRC_IDLE Qualcomm CDMA Technologies imported from 3GU
R5‑211273 Test Tolerance analysis for FR2 event triggered reporting test cases Ericsson imported from 3GU
R5‑211274 Updating 6.5A.3.2 for CA_n1A-n79A DOCOMO Communications Lab. imported from 3GU
R5‑211275 Measurement uncertainties for PC1 devices Keysight Technologies UK Ltd imported from 3GU
R5‑211276 FR2 Extreme testing conditions applicability Keysight Technologies UK Ltd imported from 3GU
R5‑211277 LS on inter-RAT cell reselection for mobility state estimation TSG WG RAN2 imported from 3GU
R5‑211278 Reply LS on Rel-16 mandatory RRM requirements TSG WG RAN2 imported from 3GU
R5‑211279 LS to RAN5 on RRC processing time with segmentation TSG WG RAN2 imported from 3GU
R5‑211280 Reply LS on reporting of SINR measurements for serving cell TSG WG RAN2 imported from 3GU
R5‑211281 Correction to TC6.4.2.5 EVM equalizer spectrum flatness for Pi2 BPSK Bureau Veritas imported from 3GU
R5‑211282 Agenda - opening session WG Chairman imported from 3GU
R5‑211283 Addition of UAI test function Qualcomm CDMA Technologies imported from 3GU
R5‑211284 LS on change of methodology for new LTE-CA REL-17 combinations TSG WG RAN4 imported from 3GU
R5‑211285 LS on Signalling scheme of Transparent TxD TSG WG RAN4 imported from 3GU
R5‑211286 LS on Test Methodology for UE URLLC Ultra Low BLER CQI requirements TSG WG RAN4 imported from 3GU
R5‑211287 WP UE Conformance Test Aspects - Enhancing LTE CA Utilization Nokia, Nokia Shanghai Bell imported from 3GU
R5‑211288 SR UE Conformance Test Aspects - Enhancing LTE CA Utilization Nokia, Nokia Shanghai Bell imported from 3GU
R5‑211289 WP UE Conformance Test Aspects - NR performance requirement enhancement Qualcomm imported from 3GU
R5‑211290 SR UE Conformance Test Aspects - NR performance requirement enhancement Qualcomm imported from 3GU
R5‑211291 Introduction of MU and TT for CA Idle Mode Measurements Nokia, Nokia Shanghai Bell imported from 3GU
R5‑211292 Introduction of CA Idle Mode Measurement RRM Testcase Applicabilities Nokia, Nokia Shanghai Bell imported from 3GU
R5‑211293 FDD Inter Frequency Absolute RSRP Accuracy CA Idle Mode Measurements for Non-Overlapping Carrier Nokia, Nokia Shanghai Bell imported from 3GU
R5‑211294 FDD Inter Frequency Absolute RSRP Accuracy CA Idle Mode Measurements for Overlapping Carrier Nokia, Nokia Shanghai Bell imported from 3GU
R5‑211295 FDD Intra Frequency Absolute RSRP Accuracy CA Idle Mode Measurements Nokia, Nokia Shanghai Bell imported from 3GU
R5‑211296 Correction to test case 8.1.5.1.1 MediaTek Inc. imported from 3GU
R5‑211297 Correction to test case 8.2.1.1.1 MediaTek Inc. imported from 3GU
R5‑211298 Corrections for support of multiple GPS signals Spirent Communications imported from 3GU
R5‑211299 Applicability of ‘Re-registration after capability update / 5GS’ test case Apple Inc. imported from 3GU
R5‑211300 MCC TF160 Status Report MCC TF160 imported from 3GU
R5‑211301 Reply LS on NGMN-GTI 5G Smart Devices Supporting Network Slicing TSG WG RAN5 imported from 3GU
R5‑211302 New WID on UE Conformance Test Aspects for NR RF Requirement Enhancements for FR2 Nokia, Nokia Shanghai Bell imported from 3GU
R5‑211303 New WID on UE Conformance Test Aspects for Enhancement of Network Slicing China Mobile, China Telecom, China Unicom imported from 3GU
R5‑211304 New WID on UE Conformance Test Aspects for 2-step RACH for NR ZTE Corporation, China Telecom imported from 3GU
R5‑211305 New WID on UE Conformance Test Aspects – LTE-NR & NR-NR Dual Connectivity and NR CA enhancements Nokia, Nokia Shanghai Bell imported from 3GU
R5‑211306 New WID on UE Conformance Test Aspects for NR-based Access to Unlicensed Spectrum Qualcomm Wireless GmbH imported from 3GU
R5‑211307 New WID on UE Conformance Test Aspects – High power UE (power class 2) for EN-DC with 1 LTE band + 1 NR TDD band China Unicom imported from 3GU
R5‑211308 New WID - UE Conformance Test Aspects - Support of eCall over IMS for NR Qualcomm Incorporated imported from 3GU
R5‑211309 New SID: Study on on 5G NR UE supporting Network Slicing Testing China Mobile, China Unicom imported from 3GU
R5‑211310 Discussion to add test cases for RRC DL segmentation MediaTek Inc. imported from 3GU
R5‑211311 LS on confirming successful resource reservation TSG WG RAN5 imported from 3GU
R5‑211312 Correction to NR5GC RRC test case 8.1.1.2.4 Keysight Technologies UK imported from 3GU
R5‑211313 Addition of TC 7.1.1.3.11 - UL grant prioritization Huawei, Hisilicon imported from 3GU
R5‑211314 Draft RAN5 Terms of Reference WG Chairman imported from 3GU
R5‑211315 Update test case applicability for 6.2.3.9 MediaTek Inc. imported from 3GU
R5‑211316 Remove Idle Mode test case 6.2.3.9 MediaTek Inc. imported from 3GU
R5‑211317 Proposal for introduction of a New Study Item on 5G NR UE supporting Network Slicing Testing CMCC imported from 3GU
R5‑211318 Correction to NR5GC UAC test case 11.3.7 Keysight Technologies UK, Qualcomm imported from 3GU
R5‑211319 Correction to EPS FallBack test cases 11.1.X ANRITSU LTD, Qualcomm, Keysight imported from 3GU
R5‑211320 Correction to Test frequencies for NB-IoT FDD MFBI ANRITSU LTD imported from 3GU
R5‑211321 Voiding 5GS Non-3GPP Access Test Case 9.2.5.2.1 ZTE Corporation imported from 3GU
R5‑211322 Testing Early implementation of Rel-14 NB-IoT Features “Category NB2”, and “twoHARQ-Processes-r14” ROHDE & SCHWARZ, Nordic Semiconductor, Verizon, Telstra imported from 3GU
R5‑211323 MR-DC Ericsson imported from 3GU
R5‑211324 Discussion paper for RRC Segmentation in Rel-16 RACS Qualcomm CDMA Technologies imported from 3GU
R5‑211325 Title: Discussion paper on IMS 180 Ringing before or after resource reservation Huawei, Hisilicon imported from 3GU
R5‑211327 Remove applicability of 5GS Non-3GPP Access Test Case 9.2.5.2.1 ZTE Corporation imported from 3GU
R5‑211328 Correction to frequency parameters for band n53 Keysight Technologies UK, Nokia imported from 3GU
R5‑211329 Correction to test case 6.1.1.3 MediaTek Inc. imported from 3GU
R5‑211330 Correction to test case 6.1.2.8 MediaTek Inc. imported from 3GU
R5‑211331 Correction to test case 6.4.1.2 MediaTek Inc. imported from 3GU
R5‑211332 Correction of NR RRC test case 8.1.4.1.5 Keysight Technologies UK imported from 3GU
R5‑211333 Removing test case 9.1.5.2.9 MediaTek Inc. imported from 3GU
R5‑211334 Addition of IMS over 5GS test case 7.25 ROHDE & SCHWARZ imported from 3GU
R5‑211335 Correction of NR SL IE SL-BWP-PoolConfigCommon Huawei, Hisilicon imported from 3GU
R5‑211336 Correction of NR SL IE SL-SDAP-Config Huawei, Hisilicon imported from 3GU
R5‑211337 Correction to PC5-RRC message RRCReconfigurationSidelink Huawei, Hisilicon imported from 3GU
R5‑211338 Correction to PC5-RRC message UECapabilityEnquirySidelink Huawei, Hisilicon imported from 3GU
R5‑211339 Correction to PC5-RRC message UECapabilityInformationSidelink Huawei, Hisilicon imported from 3GU
R5‑211340 Addition of support for BDS B1C signal Spirent Communications, CATT, CAICT imported from 3GU
R5‑211341 Editorial updates of TS 36.523-1 Section 6 Samsung imported from 3GU
R5‑211342 Correction to LTE TC 6.1.1.6a Huawei, Hisilicon, MCC TF160 imported from 3GU
R5‑211343 Editorial updates of TS 36.523-1 Section 7.1 Samsung imported from 3GU
R5‑211344 Editorial updates of TS 36.523-1 Sections 8.1 and 8.2 Samsung imported from 3GU
R5‑211345 Correction to LTE test case 8.2.4.1 for CAT-M mode UEs ROHDE & SCHWARZ imported from 3GU
R5‑211346 Editorial updates of TS 36.523-1 Section 8.3 Samsung imported from 3GU
R5‑211347 Editorial updates of TS 36.523-1 Section 8.4 Samsung imported from 3GU
R5‑211348 Editorial updates of TS 36.523-1 Section 9 Samsung imported from 3GU
R5‑211349 Editorial updates of TS 36.523-1 Sections 10 to 13 Samsung imported from 3GU
R5‑211350 Editorial updates of TS 36.523-1 Sections 15, 17 and 19 Samsung imported from 3GU
R5‑211351 Aligning content of 36.523-2 with 36.523-1 Samsung imported from 3GU
R5‑211352 Adding applicability for TC 13.1.22 MCPTT / Attach / Call setup CO Samsung imported from 3GU
R5‑211353 Correction to annexure A.3.1 Keysight Technologies UK, MCC TF160, Qualcomm imported from 3GU
R5‑211354 Update of References in 36.579-1 Samsung imported from 3GU
R5‑211355 Editorial for correcting heading styles NIST imported from 3GU
R5‑211356 Adding applicability for E-UTRAN TC 8.2.4.30.1 DAPS handover China Telecom imported from 3GU
R5‑211357 Addition of URSP details Ericsson imported from 3GU
R5‑211358 Adding new test cases of SCell Dormancy Indication for UE power saving in NR CATT imported from 3GU
R5‑211359 LS on confirming IMS 180 Ringing before or after dedicated bearer establishment TSG WG RAN5 imported from 3GU
R5‑211360 LS on ICE support for establishing an MCPTT pre-established session TSG WG RAN5 imported from 3GU
R5‑211361 Draft RAN5 Terms of Reference WG Chairman imported from 3GU
R5‑211362 Discussion paper on impact of UE’s highest channel bandwidth capability on Transport Block Selection test cases Qualcomm Incorporated imported from 3GU
R5‑211363 Revised WID on UE Conformance Test Aspects for NR HST CMCC imported from 3GU
R5‑211364 Revised WID - Rel-16 Optimisations on UE radio capability signalling – NR/E-UTRA Qualcomm CDMA Technologies imported from 3GU
R5‑211365 Revised WID on UE Conformance Test Aspects for SON and MDT support for NR CMCC, Ericsson imported from 3GU
R5‑211366 WP UE Conformance Test Aspects - Rel -16 for CLI handling for NR Qualcomm Technologies Netherlands B.V. imported from 3GU
R5‑211367 WP - 5G NR User Equipment (UE) Application Layer Data Throughput Performance Qualcomm Technologies Netherlands B.V. imported from 3GU
R5‑211368 Correction to test cases 22.3.1.6a, 22.3.1.9 and 22.3.2.7 ROHDE & SCHWARZ, Nordic Semiconductor, Verizon, Telstra imported from 3GU
R5‑211369 Corrections to generic test procedures for IMS ROHDE & SCHWARZ, Ericsson, MCC TF160 imported from 3GU
R5‑211370 Correction to generic procedure for UE-requested PDU session modification after S1 to N1 change Keysight Technologies UK imported from 3GU
R5‑211371 Correction to test procedure 4.9.7 MCC TF160 imported from 3GU
R5‑211372 Correction to RRC IDLE procedures Keysight Technologies UK, Qualcomm imported from 3GU
R5‑211373 Addition of procedure for clearing Ues Last Registered PLMN Qualcomm Incorporated imported from 3GU
R5‑211374 Update IE PDCCH-ConfigCommon Ericsson, MCC TF160, Anritsu imported from 3GU
R5‑211375 Correction to Table 4.6.3-185 SSB-MTC Huawei, Hisilicon, Ericsson imported from 3GU
R5‑211376 Addition and update of PICS Lenovo, Motorola Mobility, Qualcomm imported from 3GU
R5‑211377 Editorial changes to 38.523-1 Section 6 Samsung imported from 3GU
R5‑211378 Correction to NR5G Idle mode TCs Qualcomm CDMA Technologies imported from 3GU
R5‑211379 Correction to NR TC 6.3.1.1-SoR security check successful Huawei, Hisilicon imported from 3GU
R5‑211380 Correction to NR TC 6.3.1.2-SoR ACK has NOT requested Huawei, Hisilicon imported from 3GU
R5‑211381 Remove Idle Mode test case 6.2.3.9 MediaTek Inc. imported from 3GU
R5‑211382 Correction to NR MAC test case 7.1.1.8.1 Keysight Technologies UK imported from 3GU
R5‑211383 Editorial changes to 38.523-1 Section 7 Samsung imported from 3GU
R5‑211384 Correction to NR TC 7.1.1.2.2-PDSCH Aggregate Huawei, Hisilicon, MCC TF160 imported from 3GU
R5‑211385 Correction to NR TC 7.1.1.3.8.X-PHR report Huawei, Hisilicon imported from 3GU
R5‑211386 Correction to NR TC 7.1.2.3.3 and 7.1.2.3.4-RLC SN sequence Huawei, Hisilicon, Qualcomm CDMA Technologies, MCC TF160 imported from 3GU
R5‑211387 Correction to NR TC 7.1.3.1.1 and 7.1.3.1.2-PDCP SN sequence Huawei, Hisilicon, Qualcomm CDMA Technologies, MCC TF160 imported from 3GU
R5‑211388 Update to NR RRC test case 8.1.1.3.2 Qualcomm Incorporated imported from 3GU
R5‑211389 Correction to NR5G TCs 8.1.X on SINR reporting Qualcomm CDMA Technologies, Mediatek imported from 3GU
R5‑211390 Correction to NR test case 8.1.3.1.13-CSI-RS based intra-freq measure Huawei, Hisilicon imported from 3GU
R5‑211391 Correction of NR CA TC 8.1.4.1.9.x MediaTek Inc., Keysight Technologies imported from 3GU
R5‑211392 Correction to NR TC 8.1.5.8.1-Latency check Huawei, Hisilicon, MCC TF160, Qualcomm imported from 3GU
R5‑211393 Addition of NR TC 8.1.5.8.2.1-intra-band SCell Latency check Huawei, Hisilicon, MCC TF160 imported from 3GU
R5‑211394 Correction to test case 8.1.5.1.1 MediaTek Inc. imported from 3GU
R5‑211395 Correction to test case 8.2.1.1.1 MediaTek Inc. imported from 3GU
R5‑211396 Correction to MR-DC test case 8.2.3.7.1 Guangdong OPPO Mobile Telecom. imported from 3GU
R5‑211397 Correction to NR-DC RRC test case 8.2.3.14.2 TDIA, CATT imported from 3GU
R5‑211398 Addition of NR-DC RRC TC 8.2.5.3.2 Qualcomm CDMA Technologies imported from 3GU
R5‑211399 Addition of NR-DC RRC TC 8.2.5.4.2 Qualcomm CDMA Technologies imported from 3GU
R5‑211400 Correction to NR-DC RRC TC 8.2.5.1.2 Qualcomm CDMA Technologies, TDIA, CATT imported from 3GU
R5‑211401 Correction to NR-DC TC 8.2.6.1.2.1-RLC failure Huawei, Hisilicon imported from 3GU
R5‑211402 Addition of new 5GS NAS test case to test handling of extended octets NTT DOCOMO INC. imported from 3GU
R5‑211403 Correction to NR TC 9.1.8.1-SMS Huawei, Hisilicon imported from 3GU
R5‑211404 Correction to 5GMM Inter-system mobility test case 9.3.1.2 Keysight Technologies UK imported from 3GU
R5‑211405 Update of Inter system mobility test case 9.3.1.1 Qualcomm Incorporated imported from 3GU
R5‑211406 Correction to NR TC 11.1.3-EPS Fallback with handover Huawei, Hisilicon imported from 3GU
R5‑211407 Correction to EPS FallBack test cases 11.1.X ANRITSU LTD, Qualcomm, Keysight imported from 3GU
R5‑211408 Correction to NR5G UAC TC 11.3.4 Qualcomm CDMA Technologies, Keysight imported from 3GU
R5‑211409 Update of UAC test case 11.3.6 Qualcomm Incorporated imported from 3GU
R5‑211410 Correction to NR5GC UAC test case 11.3.7 Keysight Technologies UK, Qualcomm imported from 3GU
R5‑211411 Correction to 11.4.2 and 11.4.3 MediaTek Inc. imported from 3GU
R5‑211412 Update release applicability of RRC TC 8.1.1.2.4 NTT DOCOMO INC. imported from 3GU
R5‑211413 Adding missing applicability for TC 6.1.2.7 and 8.1.5.2.2 Samsung imported from 3GU
R5‑211414 Adding applicability for new IMS emergency TC 11.4.11 Samsung imported from 3GU
R5‑211415 Update of 5G-NR test cases applicability Qualcomm Incorporated, Mediatek imported from 3GU
R5‑211416 Correction to NR TC applicability for 5GS Huawei, Hisilicon imported from 3GU
R5‑211417 5G Test Models updates MCC TF160 imported from 3GU
R5‑211418 Adding NG.114 dependencies to Annex A.2.1 ROHDE & SCHWARZ imported from 3GU
R5‑211419 Addition of applicabilities for new IMS over 5GS test cases ROHDE & SCHWARZ imported from 3GU
R5‑211420 Corrections and extensions to applicability statements of IMS over 5GS test cases ROHDE & SCHWARZ imported from 3GU
R5‑211421 Addition of IMS over 5GS test case 7.27 ZTE Corporation imported from 3GU
R5‑211422 Addition of IMS over 5GS test case 7.28 ZTE Corporation imported from 3GU
R5‑211423 Addition of IMS over 5GS test case 7.29 ZTE Corporation imported from 3GU
R5‑211424 Addition of IMS over 5GS test case 7.30 ZTE Corporation imported from 3GU
R5‑211425 Addition of IMS over 5GS test case 7.31 ZTE Corporation imported from 3GU
R5‑211426 Addition of IMS over 5GS test case 7.32 ZTE Corporation imported from 3GU
R5‑211427 Addition of IMS over 5GS test case 7.33 ZTE Corporation imported from 3GU
R5‑211428 Addition of IMS over 5GS test case 7.34 ZTE Corporation imported from 3GU
R5‑211429 Update test case 7.4, 7.5, 7.6 and 7.7 ZTE Corporation imported from 3GU
R5‑211430 Editorial corrections to TS 34.229-5 ROHDE & SCHWARZ imported from 3GU
R5‑211431 Addition of IMS over 5GS TC 7.14 Qualcomm CDMA Technologies imported from 3GU
R5‑211432 Adding references ROHDE & SCHWARZ imported from 3GU
R5‑211433 Addition of A.15.1 MTSI MO Video Call / with preconditions / 5GS Qualcomm CDMA Technologies imported from 3GU
R5‑211434 Correction to IMS over 5GS TC 7.2 Qualcomm CDMA Technologies, Anritsu, MCC TF160 imported from 3GU
R5‑211435 Correction to IMS over 5GS TC 7.11 Qualcomm CDMA Technologies, Keysight Technologies, Anritsu imported from 3GU
R5‑211436 Correction to NR IMS TC 7.10-Content Type not present Huawei, Hisilicon imported from 3GU
R5‑211437 Correction to NR IMS A.9.2-Optional UPDATE after EPS fallback Huawei, Hisilicon imported from 3GU
R5‑211438 Correction to NR IMS TC 10.1-Conformance requirement update Huawei, Hisilicon imported from 3GU
R5‑211439 Addition of NR IMS TC 7.26-MO CAT forking model Huawei, Hisilicon imported from 3GU
R5‑211440 Addition of NR IMS TC 8.26-MO hold without announcement Huawei, Hisilicon imported from 3GU
R5‑211441 Addition of NR IMS TC 8.28-MT hold without announcement Huawei, Hisilicon imported from 3GU
R5‑211442 Addition of NR IMS TC 8.30-Subscription to MWI event Huawei, Hisilicon imported from 3GU
R5‑211443 Addition of NR IMS TC 8.31-Creating and leaving conference Huawei, Hisilicon imported from 3GU
R5‑211444 Addition of NR IMS TC 8.32-Inviting user to conference by REFER Huawei, Hisilicon imported from 3GU
R5‑211445 Addition of NR IMS TC 8.34-Three way session Huawei, Hisilicon imported from 3GU
R5‑211446 Addition of NR IMS TC 8.36-MO explicit communication transfer Huawei, Hisilicon imported from 3GU
R5‑211447 Addition of new IMS over 5GS TC 8.38 Communication Waiting and cancelling the call / 5GS Qualcomm Incorporated imported from 3GU
R5‑211448 Adding missing applicability for TC 8.2.2.14.1 Samsung imported from 3GU
R5‑211449 Correction of Table A.4.3.2B.2.3.12-1 Google Inc. imported from 3GU
R5‑211450 Editorial updates to RACH-ConfigCommon IE Ericsson imported from 3GU
R5‑211451 Completion C384 and C385 of Table 4-1a Google Inc. imported from 3GU
R5‑211452 Addition of E-UTRAN TC 8.2.4.30.1 DAPS handover China Telecom imported from 3GU
R5‑211453 Adding applicability for E-UTRAN TC 8.2.4.30.1 DAPS handover China Telecom imported from 3GU
R5‑211454 Corrections to DL Multi SPS test case Lenovo, Motorola Mobility, MCC TF160 imported from 3GU
R5‑211455 Correction to NR TC applicability for IIoT Huawei, Hisilicon imported from 3GU
R5‑211456 Correction to Table 4.6.3-142 ReportConfigNR Huawei, Hisilicon imported from 3GU
R5‑211457 Add UE capability for NR MobEnc Huawei, Hisilicon imported from 3GU
R5‑211458 Addition of NR TC 8.1.4.4.1-Conditional handover Success Huawei, Hisilicon imported from 3GU
R5‑211459 Addition of NR TC 8.1.4.4.2 -Conditional handover modify conditional handover configuration Huawei, Hisilicon imported from 3GU
R5‑211460 Addition of NR TC 8.1.4.4.3-Conditional handover Failure Huawei, Hisilicon imported from 3GU
R5‑211461 Correction to applicability for NR MobEnc Huawei, Hisilicon imported from 3GU
R5‑211462 Addition of SI combination for NR SL Huawei, Hisilicon imported from 3GU
R5‑211463 Adding scell dormancy indication outside active time to physical layer baseline implementation capabilities CATT imported from 3GU
R5‑211464 Addition of test applicabilities for UE power saving in NR CATT imported from 3GU
R5‑211465 Updates to SIB1 and SIB10 for Rel-16 NPN Qualcomm CDMA Technologies imported from 3GU
R5‑211466 Addition of System information combination for Rel-16 NPN Qualcomm CDMA Technologies imported from 3GU
R5‑211467 Introduction of definition of common environment for R16 NR Immediate MDT CMCC, ZTE imported from 3GU
R5‑211468 Updating Contents of RRC messages for Logged MDT test cases ZTE Corporation, CMCC imported from 3GU
R5‑211469 Introduction of common implementation conformance statements for R16 NR SON and MDT CMCC, ZTE, MediaTek Inc, HiSilicon imported from 3GU
R5‑211470 Addition of new MDT test case 8.1.6.1.2.1 ZTE, SRTC, Tejet imported from 3GU
R5‑211471 Addition of new MDT test case 8.1.6.1.2.2 ZTE, SRTC, Tejet imported from 3GU
R5‑211472 Addition of new MDT test case 8.1.6.1.2.3 ZTE, SRTC, Tejet imported from 3GU
R5‑211473 Addition of new MDT test case 8.1.6.1.2.7 ZTE Corporation imported from 3GU
R5‑211474 Addition of new MDT test case 8.1.6.1.2.8 ZTE Corporation imported from 3GU
R5‑211475 Addition of new MDT test case 8.1.6.1.2.12 ZTE Corporation imported from 3GU
R5‑211476 Addition of new MDT test case 8.1.6.1.2.13 ZTE Corporation imported from 3GU
R5‑211477 Addition of new test case 8.1.6.1.1.1 for NR Immediate MDT CMCC imported from 3GU
R5‑211478 Addition of new test case 8.1.6.1.1.2 for NR L2 measurement CMCC imported from 3GU
R5‑211479 Addition of MDT TC 8.1.6.1.4.3-CEF-intra-NR handover Huawei, Hisilicon imported from 3GU
R5‑211480 Addition of MDT TC 8.1.6.1.4.4-CEF-RRC re-establishment Huawei, Hisilicon imported from 3GU
R5‑211481 Addition of MDT TC 8.1.6.1.4.5-CEF-location info Huawei, Hisilicon imported from 3GU
R5‑211482 Addition of MDT TC 8.1.6.1.4.6-CEF-intra-freq measurements Huawei, Hisilicon imported from 3GU
R5‑211483 Addition of MDT TC 8.1.6.1.4.7-CEF-inter-freq measurements Huawei, Hisilicon imported from 3GU
R5‑211484 Addition of MDT TC 8.1.6.1.4.8-CEF-rach failure Huawei, Hisilicon imported from 3GU
R5‑211485 Addition of new MDT TC 8.1.6.1.3.1 MediaTek Inc., Tejet, SRTC imported from 3GU
R5‑211486 Addition of new MDT TC 8.1.6.1.3.3 MediaTek Inc., Tejet, SRTC imported from 3GU
R5‑211487 Applicability statement for new test cases for NR Immediate MDT CMCC imported from 3GU
R5‑211488 Adding applicability for new logged MDT test cases ZTE Corporation, CMCC imported from 3GU
R5‑211489 Correction to NR TC applicability for MDT Huawei, Hisilicon imported from 3GU
R5‑211490 Update UE Positioning test mode procedures and UE Positioning messages ZTE Corporation imported from 3GU
R5‑211491 Addition of Cell configurations for 5G-SRVCC from NG-RAN to UTRAN CATT, TDIA imported from 3GU
R5‑211492 Introduciton of general capability for NR to UTRA-FDD CELL_DCH CS handover CATT, TDIA imported from 3GU
R5‑211493 Addition of a new test case for 5G-SRVCC from NG-RAN to 3GPP UTRAN CATT, TDIA imported from 3GU
R5‑211494 Addition of 5G SRVCC TC 8.1.3.2.6-NR to UMTS Inter-RAT measurements-Event B1 Huawei, Hisilicon imported from 3GU
R5‑211495 Addition of 5G SRVCC TC 8.1.3.2.7-NR to UMTS Inter-RAT measurements-Event B2 Huawei, Hisilicon imported from 3GU
R5‑211496 Introduction of applicability for SRVCC from NG-RAN to 3GPP UTRAN CATT, TDIA, Huawei, Hisilicon imported from 3GU
R5‑211497 Editorial update IE PhysicalCellGroupConfig Ericsson imported from 3GU
R5‑211498 Introduction of support for URLLC Ericsson imported from 3GU
R5‑211499 Addition of QoS for URLLC Ericsson imported from 3GU
R5‑211500 Update test case 8.1.5.1.1 to add UE capability nr-HO-ToEN-DC-r16 China Telecommunications imported from 3GU
R5‑211501 Update of test case 8.2.1.1.1 to support Inter-RAT handover from NR to EN-DC China Telecommunications imported from 3GU
R5‑211502 Correction to 5GS Non-3GPP Access Test Case 9.2.2.2 ZTE Corporation imported from 3GU
R5‑211503 Introduction of a new test case for voice fallback indication under EPS Fallback with handover CATT, TDIA imported from 3GU
R5‑211504 Update to applicabilities for the EPS fallback test cases CATT, TDIA imported from 3GU
R5‑211505 Correction to emergency bearer service over S1 for eCall test cases Keysight Technologies UK, Qualcomm imported from 3GU
R5‑211506 Editorial for Table 6.6.2-10 Reference packet filter #9 NIST imported from 3GU
R5‑211507 Correction to Test frequencies for NB-IoT FDD MFBI ANRITSU LTD imported from 3GU
R5‑211508 Clarification of DRB identity in CLOSE UE TEST LOOP message in 36.509 Anritsu imported from 3GU
R5‑211509 Update of TC WLAN measurement collection in Immediate MDT for specific sys infos CMCC imported from 3GU
R5‑211510 Update of TC WLAN measurement collection in Logged MDT for specific sys infos CMCC imported from 3GU
R5‑211511 Correction to Test Case 10.2.2 NIST imported from 3GU
R5‑211512 Update to TC 13.1.22 MCPTT / Attach / Call setup CO Samsung imported from 3GU
R5‑211513 Editorial updates of TS 36.523-1 Sections 22 and 24 Samsung imported from 3GU
R5‑211514 Adding specs to References in TS 36.523-1 Samsung imported from 3GU
R5‑211515 Addition of LTE TC applicability Huawei, Hisilicon, MCC TF160 imported from 3GU
R5‑211516 Corrections for support of multiple GPS signals Spirent Communications imported from 3GU
R5‑211517 Addition of a generic procedure for MCPTT radio bearer establishment for use of pre-established session MCC TF160 imported from 3GU
R5‑211518 Correction to generic test procedure for MCPTT pre-established session establishment MCC TF160 imported from 3GU
R5‑211519 Update to Default Message Content - REFER and Resource-List MCC TF160 imported from 3GU
R5‑211520 MCPTT Info Corrections UPV/EHU, Nemergent Solutions, MCC TF160 imported from 3GU
R5‑211521 Correction to MCPTT Test Case 5.3 MCC TF160 imported from 3GU
R5‑211522 Correction to MCPTT Test Case 5.4 MCC TF160 imported from 3GU
R5‑211523 Correction to MCPTT Test Case 6.1.1.1 MCC TF160 imported from 3GU
R5‑211524 Correction to MCPTT Test Case 6.1.1.10 MCC TF160, NIST, UPV/EHU, Nemergent Solutions imported from 3GU
R5‑211525 Correction to MCPTT Test Case 6.1.1.2 MCC TF160 imported from 3GU
R5‑211526 Correction to MCPTT Test Case 6.1.1.5 MCC TF160 imported from 3GU
R5‑211527 Correction to MCPTT Test Case 6.1.1.8 MCC TF160 imported from 3GU
R5‑211528 Correction to MCPTT Test Case 6.1.2.10 MCC TF160 imported from 3GU
R5‑211529 Correction to MCPTT Test Case 6.1.2.11 MCC TF160 imported from 3GU
R5‑211530 Correction to MCPTT Test Case 6.1.2.12 MCC TF160 imported from 3GU
R5‑211531 Correction to MCPTT Test Case 6.1.2.7 MCC TF160 imported from 3GU
R5‑211532 Correction to MCPTT Test Case 6.1.2.8 MCC TF160 imported from 3GU
R5‑211533 Correction to MCPTT Test Case 6.1.2.9 MCC TF160 imported from 3GU
R5‑211534 Correction to MCPTT Test Case 6.2.1 MCC TF160 imported from 3GU
R5‑211535 Correction to MCPTT Test Case 6.2.14 MCC TF160 imported from 3GU
R5‑211536 Correction to MCPTT Test Case 6.2.15 MCC TF160 imported from 3GU
R5‑211537 Correction to MCPTT Test Case 6.2.16 MCC TF160 imported from 3GU
R5‑211538 Correction to MCPTT Test Case 6.2.17 MCC TF160 imported from 3GU
R5‑211539 Correction to MCPTT Test Case 6.2.2 MCC TF160 imported from 3GU
R5‑211540 Correction to MCPTT Test Case 6.2.3 MCC TF160 imported from 3GU
R5‑211541 Correction to MCPTT Test Case 6.2.4 MCC TF160 imported from 3GU
R5‑211542 Correction to MCPTT Test Case 6.2.5 MCC TF160 imported from 3GU
R5‑211543 Correction to MCPTT Test Case 6.2.6 MCC TF160 imported from 3GU
R5‑211544 Correction to MCPTT Test Case 6.2.7 MCC TF160 imported from 3GU
R5‑211545 Addition of missing MCX PICS MCC TF160 imported from 3GU
R5‑211546 Correction to MCVideo Test Case 6.1.1.9 NIST imported from 3GU
R5‑211547 Correction to EPS Fallback Test Case 11.1.1 Qualcomm CDMA Technologies, Anritsu imported from 3GU
R5‑211548 Addition of NID information for Rel-16 NPN Qualcomm CDMA Technologies imported from 3GU
R5‑211549 Addition of UAI test function Qualcomm CDMA Technologies imported from 3GU
R5‑211550 Addition of test function Set UE Capability Info Qualcomm CDMA Technologies imported from 3GU
R5‑211600 Reply LS on nominal channel spacing calculation for two carriers at band n41 with 40MHz and 80MHz channel bandwidths TSG WG RAN5 imported from 3GU
R5‑211601 Update to 5.4.3.1 EN-DC FR2 timing advance adjustment accuracy Qualcomm Technologies Netherlands B.V. imported from 3GU
R5‑211602 Introducing PICS for CA_n28A-n41A Huawei, Hisilicon imported from 3GU
R5‑211603 Update to 5.4.1.1 EN-DC FR2 UE transmit timing accuracy Qualcomm Technologies Netherlands B.V. imported from 3GU
R5‑211604 Introduction of test frequencies for CBW 70 MHz for n77 Ericsson, China Unicom imported from 3GU
R5‑211605 Introduction of test frequencies for CBW 70 MHz for n78 Ericsson, China Unicom imported from 3GU
R5‑211606 Updating test point analysis for FR1 REFSENS for CA test case Huawei, Hisilicon imported from 3GU
R5‑211607 Update MU threshold for DL AWGN absolute power for RRM FR2 Keysight Technologies UK Ltd imported from 3GU
R5‑211608 Update of Tx test procedure for PC2 UE on FDD bands due to maxUplinkDutyCycle Huawei, HiSilicon, Bureau Veritas imported from 3GU
R5‑211609 Clarification on exception requirements for Intermodulation due to Dual uplink (IMD) TSG WG RAN5 imported from 3GU
R5‑211610 Applicability of Error Vector Magnitude for V2X for non-concurrent operation LG Electronics imported from 3GU
R5‑211611 Applicability for RRM NR HST test case 6.1.1.7 and 6.6.1.7 CMCC imported from 3GU
R5‑211612 Update of 6.5.2 interruption during measurement on deactivated SCC Huawei, HiSilicon, Keysight imported from 3GU
R5‑211613 Spurious emissions for UE co-existence update to core specs Keysight Technologies UK Ltd imported from 3GU
R5‑211614 Update of Scell activation and CSI reporting time for EN-DC TC 4.5.3.1 MediaTek Inc. imported from 3GU
R5‑211615 Complete RRM 4.5.7.1 including TT analysis results ROHDE & SCHWARZ imported from 3GU
R5‑211616 Update Test Tolerance for FR1 RLM Test Cases ANRITSU LTD imported from 3GU
R5‑211617 Correction to EN-DC radio link monitoring Huawei, HiSilicon imported from 3GU
R5‑211618 Update of 4.5.3.1 SCell activation and deactivation Huawei, HiSilicon imported from 3GU
R5‑211619 Update to 4.5.4.1 EN-DC FR1 UE UL carrier RRC reconfiguration delay Qualcomm Technologies Netherlands B.V. imported from 3GU
R5‑211620 Update to 4.7.5.1 EN-DC FR1 SFTD measurement accuracy Qualcomm Technologies Netherlands B.V. imported from 3GU
R5‑211621 Correction of applied TT for EN-DC FR1 L1-RSRP measurement test cases Ericsson imported from 3GU
R5‑211622 Update 5.4.3.1 with TT analysis results ROHDE & SCHWARZ imported from 3GU
R5‑211623 Correction of EN-DC FR2 inter-freq measurement test case 5.6.2.1 including TT Ericsson imported from 3GU
R5‑211624 Correction of EN-DC FR2 inter-freq measurement test case 5.6.2.3 including TT Ericsson imported from 3GU
R5‑211625 Update of CSI reporting time for SA TC 6.5.3.1 MediaTek Inc. imported from 3GU
R5‑211626 Correction to SA radio link monitoring Huawei, HiSilicon imported from 3GU
R5‑211627 Update to 6.3.2.2.1 Contention based random access test in FR1 for NR standalone Qualcomm Technologies Netherlands B.V. imported from 3GU
R5‑211628 Update to 6.3.2.2.2 Non-Contention based random access test in FR1 for NR standalone Qualcomm Technologies Netherlands B.V. imported from 3GU
R5‑211629 Update to 6.5.2.1 NR SA FR1 interruptions during measurements on deactivated NR SCC Qualcomm Technologies Netherlands B.V. imported from 3GU
R5‑211630 Update to 6.6.3.1 NR SA FR1 - E-UTRAN event-triggered reporting in non-DRX Qualcomm Technologies Netherlands B.V. imported from 3GU
R5‑211631 Update to 6.6.3.2 NR SA FR1 - E-UTRAN event-triggered reporting in DRX Qualcomm Technologies Netherlands B.V. imported from 3GU
R5‑211632 Correction of applied TT for SA FR1 L1-RSRP measurement test cases Ericsson imported from 3GU
R5‑211633 Correction of SA FR2 inter-freq measurement test case 7.6.2.1 including TT Ericsson imported from 3GU
R5‑211634 Correction of SA FR2 inter-freq measurement test case 7.6.2.3 including TT Ericsson imported from 3GU
R5‑211635 Complete FR2 iRAT measurement accuracy test cases ROHDE & SCHWARZ imported from 3GU
R5‑211636 Update Annex F for 5.4.3.1 and 7.4.3.1 with TT analysis results ROHDE & SCHWARZ imported from 3GU
R5‑211637 Update DL AWGN MU for RRM FR2 ROHDE & SCHWARZ imported from 3GU
R5‑211638 Update FR2 Downlink and Uplink MU values ANRITSU LTD imported from 3GU
R5‑211639 Update of Annex F for Test Tolerance Huawei, HiSilicon imported from 3GU
R5‑211640 Correction of MTSU and applied TT in Annex F Ericsson imported from 3GU
R5‑211641 Addition of new RMCs and OCNGs into Annex A Ericsson imported from 3GU
R5‑211642 Test tolerance analysis for 4.5.7.1 ROHDE & SCHWARZ imported from 3GU
R5‑211643 Update SS-RSRP measurement accuracy TT analyses for SNR uncertainty change ROHDE & SCHWARZ imported from 3GU
R5‑211644 Update RRM MU values for FR2 ROHDE & SCHWARZ imported from 3GU
R5‑211645 Update of FR1 TT for SCell activation Huawei, HiSilicon imported from 3GU
R5‑211646 Update of FR1 TT for SSB based link recovery Huawei, HiSilicon imported from 3GU
R5‑211647 Update of FR1 TT for CSI-RS based link recovery Huawei, HiSilicon imported from 3GU
R5‑211648 Update of FR1 TT for RRC re-establishment Huawei, HiSilicon imported from 3GU
R5‑211649 Update of Test Tolerance analysis for FR1 event triggered reporting test cases Ericsson imported from 3GU
R5‑211650 Update of Test Tolerance analysis for FR1 SSB-based L1-RSRP test cases Ericsson imported from 3GU
R5‑211651 Update of Test Tolerance analysis for FR1 CSI-RS based L1-RSRP test cases Ericsson imported from 3GU
R5‑211652 Test Tolerance analysis for FR2 event triggered reporting test cases Ericsson imported from 3GU
R5‑211653 On the DL AWGN MTSU for RRM ROHDE & SCHWARZ imported from 3GU
R5‑211654 FR1 Test Tolerance review training Ericsson imported from 3GU
R5‑211655 FR2 Test Tolerance review training Ericsson imported from 3GU
R5‑211656 On the MU for n259 ROHDE & SCHWARZ imported from 3GU
R5‑211657 PC1 and PC3 Updates for Band n14 AT&T imported from 3GU
R5‑211658 Addition of new test case 6.3.2.1.3 2Rx FDD FR1 Multiple PMI with 16Tx Type1 - SinglePanel codebook for both SA and NSA China Telecom imported from 3GU
R5‑211659 Addition of new test case 6.3.3.1.3 4Rx FDD FR1 Multiple PMI with 16Tx Type1 - SinglePanel codebook for both SA and NSA China Telecom imported from 3GU
R5‑211660 Update of EN-DC inter-band configurations in clause 4.3.1 China Telecommunications imported from 3GU
R5‑211661 Addition of 3 band EN-DC Test Frequency (DC_1A-8A_n78A, DC_3A-8A_n78A) KT Corp. imported from 3GU
R5‑211662 Addition of 4 band EN-DC Test Frequency (DC_1A-3A-8A_n78A) KT Corp. imported from 3GU
R5‑211663 Update PDSCH-TimeDomainResourceAllocationList to consider coreset0 for Demod FR2 test cases Keysight Technologies UK Ltd imported from 3GU
R5‑211664 Update message content for PMI reporting test cases Keysight Technologies UK Ltd imported from 3GU
R5‑211665 Changes to RRM default message contents ROHDE & SCHWARZ imported from 3GU
R5‑211666 Add SSB Index table for RRM with SECOND_SSB condition ROHDE & SCHWARZ imported from 3GU
R5‑211667 Addition of default configuration of CSI-IM for RRM tests Huawei, HiSilicon imported from 3GU
R5‑211668 Specify CSI-SSB-ResourceSet for RRM ROHDE & SCHWARZ imported from 3GU
R5‑211669 Editorial rework of the conditions for CSI-FrequencyOccupation ROHDE & SCHWARZ imported from 3GU
R5‑211670 Align TDD UL DL Common for RRM with TS 38.533 ROHDE & SCHWARZ imported from 3GU
R5‑211671 Correct reportOffsetList in CSI-ReportConfig ROHDE & SCHWARZ imported from 3GU
R5‑211672 Specify CSI-SSB-ResourceSet ROHDE & SCHWARZ imported from 3GU
R5‑211673 Clarification on the connection diagram for FR2 demod and RRM test cases Anritsu imported from 3GU
R5‑211674 Introduction of UE capabilities for Rel-15 EN-DC FR2 configuration CA_n261(2A) Ericsson imported from 3GU
R5‑211675 Clarification of DRB identity in CLOSE UE TEST LOOP message in 38.509 Anritsu imported from 3GU
R5‑211676 Clarifications for ON/OFF time mask for UL MIMO test case Keysight Technologies UK Ltd imported from 3GU
R5‑211677 Correction of test frequencies for NR band n28 30MHz test channel bandwidth of CA SUL and UL MIMO test cases in section 6 CAICT imported from 3GU
R5‑211678 Updating AMPR for MIMO test case for NS_35 Huawei, Hisilicon imported from 3GU
R5‑211679 Correction to RB allocation start for test case 6.3D.4.2 Huawei, Hisilicon, Ericsson imported from 3GU
R5‑211680 Correction of test frequencies for NR band n28 30MHz test channel bandwidth of CA SUL and UL MIMO test cases in section 7 CAICT imported from 3GU
R5‑211681 Updating test case 7.3C.2-Reference sensitivity power level for SUL Huawei, Hisilicon, CAICT imported from 3GU
R5‑211682 Update of clause 5 to R15 TS 38.521-1 China Unicom imported from 3GU
R5‑211683 Editorial corrections in Occupied bandwidth test procedure Keysight Technologies UK Ltd imported from 3GU
R5‑211684 FR2 UL CA Frequency error test cases update Keysight Technologies UK Ltd imported from 3GU
R5‑211685 Addition of Inner_partial allocation in general section and a few test cases Huawei, HiSilicon, Keysight imported from 3GU
R5‑211686 Correction of parameter configuration for open loop power control Huawei, HiSilicon imported from 3GU
R5‑211687 Correction to test points of FR1 EN-DC intermodulation with 3CC in TC 7.8B.2.6 Anritsu imported from 3GU
R5‑211688 Addition of new test case 6.2A.1.1.4 UE maximum output power - EIRP and TRP for 5UL CA KTL imported from 3GU
R5‑211689 Addition of new test case 6.2A.1.1.5 UE maximum output power - EIRP and TRP for 6UL CA KTL imported from 3GU
R5‑211690 Addition of new test case 6.2A.1.1.6 UE maximum output power - EIRP and TRP for 7UL CA KTL imported from 3GU
R5‑211691 Addition of new test case 6.2A.1.1.7 UE maximum output power - EIRP and TRP for 8UL CA KTL imported from 3GU
R5‑211692 Corrections to reference figures for transmission bandwidth configuration in FR2 ZTE Corporation imported from 3GU
R5‑211693 Update of Annex F for test case 7.3.4 ROHDE & SCHWARZ imported from 3GU
R5‑211694 Spectrum emissions mask for intra-band non-contiguous EN-DC Test Definition Keysight Technologies UK Ltd imported from 3GU
R5‑211695 ACLR for intra-band non-contiguous EN-DC Test Definition Keysight Technologies UK Ltd imported from 3GU
R5‑211696 Update Test description of 6.5B.1.1 Guangdong OPPO Mobile Telecom. imported from 3GU
R5‑211697 EN-DC FR2 UL CA Frequency error test cases update Keysight Technologies UK Ltd imported from 3GU
R5‑211698 Correction of test requirements for EN-DC configured output power Huawei, HiSilicon, Anritsu imported from 3GU
R5‑211699 Introduction of Rel-15 EN-DC configuration DC_8A_n77A to spurious emission test case 6.5B.3.3.2 Ericsson imported from 3GU
R5‑211700 Introduction of Rel-15 EN-DC configuration DC_11A_n77A to spurious emission test case 6.5B.3.3.2 Ericsson imported from 3GU
R5‑211701 Introduction of Rel-15 EN-DC configuration DC_11A_n78A to spurious emission test case 6.5B.3.3.2 Ericsson imported from 3GU
R5‑211702 Introduction of Rel-15 EN-DC configuration DC_11A_n79A to spurious emission test case 6.5B.3.3.2 Ericsson imported from 3GU
R5‑211703 Introduction of Rel-15 EN-DC configuration DC_25A_n41A to spurious emission test case 6.5B.3.3.2 Ericsson imported from 3GU
R5‑211704 Introduction of Rel-15 EN-DC configuration DC_26A_n41A to spurious emission test case 6.5B.3.3.2 Ericsson imported from 3GU
R5‑211705 Introduction of Rel-15 EN-DC configuration DC_26A_n77A to spurious emission test case 6.5B.3.3.2 Ericsson imported from 3GU
R5‑211706 Introduction of Rel-15 EN-DC configuration DC_26A_n78A to spurious emission test case 6.5B.3.3.2 Ericsson imported from 3GU
R5‑211707 Introduction of Rel-15 EN-DC configuration DC_26A_n79A to spurious emission test case 6.5B.3.3.2 Ericsson imported from 3GU
R5‑211708 Introduction of Rel-15 EN-DC configuration DC_41A_n77A to spurious emission test case 6.5B.3.3.2 Ericsson imported from 3GU
R5‑211709 Introduction of Rel-15 EN-DC configuration DC_41A_n78A to spurious emission test case 6.5B.3.3.2 Ericsson imported from 3GU
R5‑211710 Correction of MSD test point on Table 7.3B.2.0.3.5.2-1 DC_1A-8A_n78A KT Corp. imported from 3GU
R5‑211711 Update of 7.3B.2.3_1.1 RefSens DC_3A-8A_n78A KT Corp. imported from 3GU
R5‑211712 Addition of new test case 7.3B.4 for EIS Spherical Coverage ROHDE & SCHWARZ imported from 3GU
R5‑211713 Editorial correction for errors in 7.6B.4.3_1 CAICT imported from 3GU
R5‑211714 Correction of test configuration tables in section 7 CAICT imported from 3GU
R5‑211715 Clarification of tested Rx antenna numbers on E-UTRA band Huawei, HiSilicon, Bureau Veritas imported from 3GU
R5‑211716 Correction to DCI bit size for PDSCH Type B performance and LTE coexistence tests Anritsu imported from 3GU
R5‑211717 Correction to LB setup DRB in CLOSE UE TEST LOOP message Anritsu imported from 3GU
R5‑211718 Correction to NR test case 6.2.2.1.2.1 Huawei, HiSilicon imported from 3GU
R5‑211719 Correction to E-UTRA link setup for NSA testing ROHDE & SCHWARZ imported from 3GU
R5‑211720 Correction of applicability definitions for PUSCH HalfPi BPSK related test cases CAICT imported from 3GU
R5‑211721 Correction PICS condition of test case 6.4.2.5 Google Inc. imported from 3GU
R5‑211722 Correction EN-DC FR1 timing tests ROHDE & SCHWARZ imported from 3GU
R5‑211723 Corrections to 5.4.1.1 ROHDE & SCHWARZ imported from 3GU
R5‑211724 Clarification of SNR for 4RX UE in RLM Test Cases Anritsu imported from 3GU
R5‑211725 Correction in 4.7.3.2.1 test parameters Keysight Technologies UK Ltd imported from 3GU
R5‑211726 Update of RRC message for TC 6.3.1.4, 6.3.1.5 and 6.3.2.3.2 MediaTek Inc. imported from 3GU
R5‑211727 Corrections NR SA FR1 timing test cases ROHDE & SCHWARZ imported from 3GU
R5‑211728 Correction to NR TC 6.6.3.2-Inter-RAT DRX Huawei, HiSilicon imported from 3GU
R5‑211729 Update of 6.5.1.2 and 6.5.1.4 SSB based RLM Huawei, HiSilicon imported from 3GU
R5‑211730 Clarification of BWP1 and BWP2 in 7.6.1.3 and 7.6.1.4 MediaTek Inc. imported from 3GU
R5‑211731 Addition of Serving Cell Config for RRM timing test cases ROHDE & SCHWARZ imported from 3GU
R5‑211732 Editorial correction to several MU factors Huawei, HiSilicon imported from 3GU
R5‑211733 Updated TP analysis for 7.3B Reference sensitivity for EN-DC in FR1 Nokia, Nokia Shanghai Bell imported from 3GU
R5‑211734 TP analysis for 38.521-3 test case 6.5B.2.2.1 SEM Intra-band non-contiguous Keysight Technologies UK Ltd imported from 3GU
R5‑211735 TP analysis for 38.521-3 test case 6.5B.2.2.3 ACLR Intra-band non-contiguous Keysight Technologies UK Ltd imported from 3GU
R5‑211736 Update of test point analysis for FR2 UL CA frequency error test cases Keysight Technologies UK Ltd imported from 3GU
R5‑211737 Introduction of spurious emission TP analysis for Rel-15 EN-DC configuration DC_8A_n77A Ericsson imported from 3GU
R5‑211738 Introduction of spurious emission TP analysis for Rel-15 EN-DC configuration DC_11A_n77A Ericsson imported from 3GU
R5‑211739 Introduction of spurious emission TP analysis for Rel-15 EN-DC configuration DC_11A_n78A Ericsson imported from 3GU
R5‑211740 Introduction of spurious emission TP analysis for Rel-15 EN-DC configuration DC_11A_n79A Ericsson imported from 3GU
R5‑211741 Introduction of spurious emission TP analysis for Rel-15 EN-DC configuration DC_25A_n41A Ericsson imported from 3GU
R5‑211742 Introduction of spurious emission TP analysis for Rel-15 EN-DC configuration DC_26A_n41A Ericsson imported from 3GU
R5‑211743 Introduction of spurious emission TP analysis for Rel-15 EN-DC configuration DC_26A_n77A Ericsson imported from 3GU
R5‑211744 Introduction of spurious emission TP analysis for Rel-15 EN-DC configuration DC_26A_n78A Ericsson imported from 3GU
R5‑211745 Introduction of spurious emission TP analysis for Rel-15 EN-DC configuration DC_26A_n79A Ericsson imported from 3GU
R5‑211746 Introduction of spurious emission TP analysis for Rel-15 EN-DC configuration DC_41A_n77A Ericsson imported from 3GU
R5‑211747 Introduction of spurious emission TP analysis for Rel-15 EN-DC configuration DC_41A_n78A Ericsson imported from 3GU
R5‑211748 Test Point analysis update for FR2 Tx additional spurious emission test case Qualcomm Finland RFFE Oy imported from 3GU
R5‑211749 Addition of new test case 9.6.1.1_A.6 DEKRA imported from 3GU
R5‑211750 Addition of new test case 9.6.1.2_A.6 DEKRA imported from 3GU
R5‑211751 Addition of the definition of CA capability with 6DL and 7DL CCs LG Electronics imported from 3GU
R5‑211752 Update to applicability TDD FDD 7DL CA Peformance test cases LG Electronics imported from 3GU
R5‑211753 Addition of new test case 9.1.72 DEKRA imported from 3GU
R5‑211754 Addition of new test case 9.2.59 DEKRA imported from 3GU
R5‑211755 Addition of new test case 6.6.2.1_s SEM for sTTI Huawei, HiSilicon imported from 3GU
R5‑211756 Addition of new test case 6.6.2.3_s ACLR for sTTI Huawei, HiSilicon imported from 3GU
R5‑211757 Introduction of CA Idle Mode Measurement RRM Testcase Applicabilities Nokia, Nokia Shanghai Bell imported from 3GU
R5‑211758 Introduction of MU and TT for CA Idle Mode Measurements Nokia, Nokia Shanghai Bell imported from 3GU
R5‑211759 FDD Inter Frequency Absolute RSRP Accuracy CA Idle Mode Measurements for Non-Overlapping Carrier Nokia, Nokia Shanghai Bell imported from 3GU
R5‑211760 FDD Inter Frequency Absolute RSRP Accuracy CA Idle Mode Measurements for Overlapping Carrier Nokia, Nokia Shanghai Bell imported from 3GU
R5‑211761 FDD Intra Frequency Absolute RSRP Accuracy CA Idle Mode Measurements Nokia, Nokia Shanghai Bell imported from 3GU
R5‑211762 Update of 4.3.1.4.1 for test frequencies for EN-DC band combinations within FR1 ZTE Corporation imported from 3GU
R5‑211763 Update of 4.3.1.5.1 for test frequencies for EN-DC band combinations including FR2 ZTE Corporation imported from 3GU
R5‑211764 Update of 7.5A.3 Adjacent channel selectivity for 4DL CA China Telecommunications imported from 3GU
R5‑211765 Update of R16 CADC configurations into TS38.521-1 clause 5 China Unicom, Huawei, HiSilicon, NTT DOCOMO imported from 3GU
R5‑211766 Introduction of Rel-16 EN-DC configuration DC_7A_n3A to spurious emission test case 6.5B.3.3.2 Nokia, Nokia Shanghai Bell, Ericsson imported from 3GU
R5‑211767 Introduction of Rel-16 EN-DC configuration DC_8A_n3A to spurious emission test case 6.5B.3.3.2 Nokia, Nokia Shanghai Bell, Ericsson imported from 3GU
R5‑211768 Introduction of Rel-16 EN-DC configuration DC_20A_n1A to spurious emission test case 6.5B.3.3.2 Nokia, Nokia Shanghai Bell, Ericsson imported from 3GU
R5‑211769 Update for 6.5B.3.3.2 Spurious emission band UE co-existence_Rel16 Qualcomm Korea, Ericsson imported from 3GU
R5‑211770 Adding Delta TIB,c for DC_1A-28A_n3A, DC_7A-20A_n1A and DC_7A-28A_n3A to clause 6.2B.4.2.3.3 Ericsson imported from 3GU
R5‑211771 Introduction of DC_7A_n3A to reference sensitivity test Nokia, Nokia Shanghai Bell imported from 3GU
R5‑211772 Introduction of DC_8A_n1A and DC_8A_n3A to reference sensitivity test Nokia, Nokia Shanghai Bell imported from 3GU
R5‑211773 Adding Inter-band EN-DC combination within FR1 KDDI Corporation imported from 3GU
R5‑211774 Introduction of spurious emission TP analysis for Rel-16 EN-DC configuration DC_7A_n3A Nokia, Nokia Shanghai Bell, Ericsson imported from 3GU
R5‑211775 Introduction of spurious emission TP analysis for Rel-16 EN-DC configuration DC_8A_n3A Nokia, Nokia Shanghai Bell, Ericsson imported from 3GU
R5‑211776 Introduction of spurious emission TP analysis for Rel-16 EN-DC configuration DC_20A_n1A Nokia, Nokia Shanghai Bell, Ericsson imported from 3GU
R5‑211777 Spur emission TP analysis R16 DC_2A_n41A Qualcomm Korea, Ericsson imported from 3GU
R5‑211778 Spur emission TP analysis R16 DC_13A_n2A Qualcomm Korea imported from 3GU
R5‑211779 Spur emission TP analysis R16 DC_48A_n5A Qualcomm Korea, Ericsson imported from 3GU
R5‑211780 Spur emission TP analysis R16 DC_48A_n66A Qualcomm Korea imported from 3GU
R5‑211781 Spur emission TP analysis R16 DC_66A_n41A Qualcomm Korea, Ericsson imported from 3GU
R5‑211782 Updates to Impact of Modem Performance in Application Layer Throughput QUALCOMM communications-France imported from 3GU
R5‑211783 Update of 6.2.3A.1_3 Maximum Power Reduction for CA and HPUE Huawei, HiSilicon imported from 3GU
R5‑211784 Update of 4.3.1.0A for mid test channel bandwidth ZTE Corporation, Ericsson imported from 3GU
R5‑211785 Correction of test frequencies for NR band n48 Ericsson imported from 3GU
R5‑211786 Correction of test points for NS_48 Huawei, HiSilicon imported from 3GU
R5‑211787 Addition of A-MPR test for NS_49 Huawei, HiSilicon imported from 3GU
R5‑211788 Update for 6.5.3.2 Spurious emission for UE co-existence_R16 Qualcomm Korea, Keysight imported from 3GU
R5‑211789 Addition of R16 new channel bandwidths for n3 in 38.521-1 China Telecommunications imported from 3GU
R5‑211790 Addition of 6.2.21 TDD Contention Based Random Access on Non-anchor Carrier Test for UE category NB1 UEs In-band mode in Enhanced Coverage Sporton imported from 3GU
R5‑211791 Addition of 7.1.27 E-UTRAN TDD UE Transmit Timing Accuracy Tests for Category NB1 UE In-Band mode under normal coverage Sporton imported from 3GU
R5‑211792 Addition of 7.1.28 E-UTRAN TDD - UE Transmit Timing Accuracy Tests for Category NB1 UE In-band mode under enhanced coverage Sporton imported from 3GU
R5‑211793 Addition of 7.2.15 E-UTRAN TDD TDD UE Timing Advance Adjustment Accuracy Test for UE Category NB1 in Standalone Mode under Enhanced Coverage Sporton imported from 3GU
R5‑211794 Addition of 7.3.88 TDD Radio Link Monitoring Test for Out-of-sync in DRX for UE category NB1 In-band mode in normal coverage Sporton imported from 3GU
R5‑211795 Addition of 7.3.89 TDD Radio Link Monitoring Test for Out-of-sync in DRX for UE category NB1 In-band mode in enhanced coverage Sporton imported from 3GU
R5‑211796 Addition of TDD NB-IOT RSTD measurement test case 9.7.1 Huawei, HiSilicon imported from 3GU
R5‑211797 Addition of TDD NB-IOT RSTD measurement test case 9.7.2 Huawei, HiSilicon imported from 3GU
R5‑211798 Addition of TDD NB-IOT RSTD measurement test case 9.7.3 Huawei, HiSilicon imported from 3GU
R5‑211799 Addition of TDD NB-IOT RSTD measurement test case 9.8.1 Huawei, HiSilicon imported from 3GU
R5‑211800 Addition of TDD NB-IOT RSTD measurement test case 9.8.2 Huawei, HiSilicon imported from 3GU
R5‑211801 Addition of TDD NB-IOT RSTD measurement test case 9.8.3 Huawei, HiSilicon imported from 3GU
R5‑211802 Addition of applicability for TDD NB-IOT RSTD measurement test cases Huawei, HiSilicon imported from 3GU
R5‑211803 Correction of Table 4.1-1 Google Inc. imported from 3GU
R5‑211804 Updating Editors Note in 6.2A.2 and 6.2A.4 for intra-band UL CA Huawei, Hisilicon imported from 3GU
R5‑211805 Updating general requirements for intra-band non-contiguous CA Huawei, Hisilicon imported from 3GU
R5‑211806 Addition of 6.5E.2.2.1 Guangdong OPPO Mobile Telecom. imported from 3GU
R5‑211807 Adding test point for Rel-16 DMRS in EVM equalizer spectrum flatness test case Huawei, HiSilicon imported from 3GU
R5‑211808 Addition of new test case 6.4C.2.5 EVM equalizer spectrum flatness for half Pi BPSK DMRS for SUL Huawei, HiSilicon imported from 3GU
R5‑211809 Adding TP analysis for Rel-16 DMRS in A-MPR test case Huawei, HiSilicon imported from 3GU
R5‑211810 Update of TP analysis for EVM equalizer spectrum flatness for half Pi BPSK Huawei, HiSilicon imported from 3GU
R5‑211811 Update of TP analysis for FR1 SUL test cases Huawei, HiSilicon imported from 3GU
R5‑211812 Addition of support for BDS B1C signal Spirent Communications, CATT, CAICT imported from 3GU
R5‑211813 Adding new test case 6.3.2.2.3, 2Rx TDD FR1 Single PMI with 16Tx Type1 - SinglePanel codebook for both SA and NSA Ericsson imported from 3GU
R5‑211814 Adding new test case 6.3.3.2.3, 4Rx TDD FR1 Single PMI with 16Tx Type1 - SinglePanel codebook for both SA and NSA Ericsson imported from 3GU
R5‑211815 Addition of common ICS in A.4.3.11 for Rel-16 HST CMCC imported from 3GU
R5‑211816 Update of minimum conformance requirements for 4Rx FDD FR1 PDSCH in TC 5.2.3.1.1_1 LG Electronics imported from 3GU
R5‑211817 Addition of Applicability of different requirements for R16 NR HST in 5.1.1.7 CMCC imported from 3GU
R5‑211818 Update of Applicability of requirements for mandatory UE features with capability signalling for R16 NR HST in 5.1.1.4 CMCC imported from 3GU
R5‑211819 Update of Applicability of requirements for optional UE features for R16 NR HST in 5.1.1.3 CMCC imported from 3GU
R5‑211820 Addition of Abbreviations and References for R16 NR HST in 3.3 and References CMCC imported from 3GU
R5‑211821 Addition of HST-DPS Channel Profile in B.3.3 CMCC imported from 3GU
R5‑211822 Addition of HST-SFN Channel Profile in B.3.2 CMCC imported from 3GU
R5‑211823 Update of Combinations of channel model parameters for R16 NR HST in B.2.2 CMCC imported from 3GU
R5‑211824 Update of Reference measurement channels for PDSCH performance requirements for R16 NR HST in A.3.2 CMCC imported from 3GU
R5‑211825 Update of Single Tap Channel Profile for R16 NR HST in B.3.1 CMCC imported from 3GU
R5‑211826 LS on minimum requirements for Transmit ON/OFF time mask in UL MIMO FR1 TSG WG RAN5 imported from 3GU
R5‑211827 Addition of new test case 6.1.1.7 for R16 NR HST CMCC imported from 3GU
R5‑211828 Addition of new test case 6.6.1.7 for R16 NR HST CMCC imported from 3GU
R5‑211829 Addition of cell configuration mapping in Annex E for R16 NR HST CMCC imported from 3GU
R5‑211830 Correction of the minimum conformance requirements for E-UTRA - NR FR1 Cell reselection 8.2.1.0 Ericsson imported from 3GU
R5‑211831 Addition of new RRM E-UTRA - NR FR1 Cell reselection test case 8.2.1.2 Ericsson imported from 3GU
R5‑211832 Correction of the minimum conformance requirements for E-UTRA - NR Inter-RAT event triggered reporting tests 8.4.2.0 Ericsson imported from 3GU
R5‑211833 Addition of new RRM E-UTRA - NR Inter-RAT event triggered reporting test case 8.4.2.9 Ericsson imported from 3GU
R5‑211834 Addition of band 7, 42, 43 and 65 for UE category M1 and NB1 to clause 5 Ericsson imported from 3GU
R5‑211835 Addition of band 7, 42, 43 and 65 for UE category M1 and NB1 to clause 6 Ericsson imported from 3GU
R5‑211836 Introduction of test frequencies for n48 adding CBW 70 MHz - DL only Ericsson imported from 3GU
R5‑211837 Updating MPR testing for SUL band n83 Huawei, Hisilicon imported from 3GU
R5‑211838 Updating AMPR testing for SUL band n83 and n84 Huawei, Hisilicon imported from 3GU
R5‑211839 Adding PICS for SUL with DL CA configurations Huawei, Hisilicon imported from 3GU
R5‑211840 Updating Rel-16 EN-DC PC2 MOP to include powerClassNRPart-r16 Huawei, HiSilicon imported from 3GU
R5‑211841 Updating Rel-16 EN-DC PC2 MPR to include powerClassNRPart-r16 Huawei, HiSilicon imported from 3GU
R5‑211842 Updating Rel-16 EN-DC PC2 A-MPR to include powerClassNRPart-r16 Huawei, HiSilicon imported from 3GU
R5‑211843 Updating Rel-16 EN-DC PC2 configured output power to include powerClassNRPart-r16 Huawei, HiSilicon imported from 3GU
R5‑211844 Correction of applicability definition for 2Rx related test cases to exclude category 1bis UEs equipped with single Rx antenna CAICT, Spreadtrum Communications imported from 3GU
R5‑211845 Correct of test applicability for TC with and without UL CA Sporton imported from 3GU
R5‑211846 Correction of Table A.4.3-3d Google Inc. imported from 3GU
R5‑211847 Correction of Table number for RRM Radio Link Monitoring Test Cases Sporton imported from 3GU
R5‑211848 Corrections for support of multiple signals in a GNSS Spirent Communications imported from 3GU
R5‑211849 CR to 38.508-2 on larger quiet zone with grey box approach Keysight Technologies UK Ltd imported from 3GU
R5‑211850 On minimum requirements for Transmit ON/OFF time mask in UL MIMO FR1 Keysight Technologies UK Ltd imported from 3GU
R5‑211851 Correction to NR TC 9.4B.1.1 Huawei, HiSilicon imported from 3GU
R5‑211852 Update for 6.5B.3.3.2 Spurious emission band UE co-existence Qualcomm Korea imported from 3GU
R5‑211853 Update to applicability spec for 5G test cases Bureau Veritas, ROHDE & SCHWARZ, TTA, KTL, Ericsson, Huawei, HiSilicon, CAICT, Google Inc., Anritsu imported from 3GU
R5‑211854 Correction to EN-DC Wideband Intermodulation tests Bureau Veritas, Anritsu imported from 3GU
R5‑211855 Updating the value of P-Max for EN-DC and NR SA test cases Huawei, HiSilicon imported from 3GU
R5‑211856 Correction to the message contents for CQI reporting tests in 5.4.2.4 Anritsu imported from 3GU
R5‑211857 Correction to the message contents for PMI reporting tests in 5.4.2.5 Anritsu imported from 3GU
R5‑211858 Update of UE capabilities for EN-DC configurations China Telecommunications imported from 3GU
R5‑211859 Update of Table A.4.3.2B.2.3.2-2 (DC_1A-8A_n78A, DC_3A-8A_n78A) KT Corp. imported from 3GU
R5‑211860 Update of Table A.4.3.2B.2.3.3-2 (DC_1A-3A-8A_n78A) KT Corp. imported from 3GU
R5‑211861 Introduction of UE capabilities for Rel-15 EN-DC FR1 configurations Ericsson imported from 3GU
R5‑211862 Addition of PICS powerBoosting-pi2BPSK Google Inc. imported from 3GU
R5‑211863 FR2 MPR, ACLR and SEM test cases update as per TP analysis update Keysight Technologies UK Ltd, Ericsson, CAICT imported from 3GU
R5‑211864 Cleaning up of FR2 test specification Huawei, HiSilicon imported from 3GU
R5‑211865 Update of TX Test Cases for UL MIMO in FR2 Sporton imported from 3GU
R5‑211866 Correction to definition of power control window size in FR2 relative power tolerance in TC 6.3.4.3 Anritsu imported from 3GU
R5‑211867 FR2 Tx additional spurious emission test case updates Qualcomm Finland RFFE Oy imported from 3GU
R5‑211868 ACS FR2 test case update Keysight Technologies UK Ltd imported from 3GU
R5‑211869 IBB FR2 test case update Keysight Technologies UK Ltd imported from 3GU
R5‑211870 Editorial addition of editors notes in 6.3B.8.1.4, 6.3B.8.2.4 and 6.3B.8.3.4 CMCC, Qualcomm, Bureau Veritas, Ericsson, R&S, Huawei, CAICT, Apple imported from 3GU
R5‑211871 Correcting EN-DC A-MPR test requirements for non-overlapping test points Huawei, HiSilicon imported from 3GU
R5‑211872 Correction to the TDM pattern configuration for EN-DC Tx test cases Huawei, HiSilicon imported from 3GU
R5‑211873 Correction to MOP and MPR test procedures for PC2 in TC 6.2B.1.3 and 6.2B.2.1 Anritsu imported from 3GU
R5‑211874 Correction of LTE frequency for 19-n79 combo in 7.3B.2.3 Keysight Technologies UK Ltd, Ericsson imported from 3GU
R5‑211875 Update to EN-DC Reference Sensitivity ROHDE & SCHWARZ imported from 3GU
R5‑211876 Update of reference sensitivity for intra-band non-contiguous EN-DC Huawei, HiSilicon imported from 3GU
R5‑211877 Update of reference sensitivity for inter-band 2CC EN-DC Huawei, HiSilicon imported from 3GU
R5‑211878 Correction to refsens test requirements for DC_1A-7A_n78A Huawei, HiSilicon, Keysight Technologies UK Ltd, Ericsson imported from 3GU
R5‑211879 Update of test configuration for inter-band 2CC EN-DC configurations affected by reference sensitivity exceptions Huawei, HiSilicon imported from 3GU
R5‑211880 Update of 2CC refsens test case 7.3B.2.3 Ericsson imported from 3GU
R5‑211881 Update of 3CC refsens test case 7.3B.2.3_1.1 Ericsson imported from 3GU
R5‑211882 Correction of configurations not to be tested in 4CC refsens test case 7.3B.2.3_1.2 Ericsson imported from 3GU
R5‑211883 Addition of DC_8A_n77A in test case 7.3B.2.3 Ericsson imported from 3GU
R5‑211884 Addition of DC_11A_n79A in test case 7.3B.2.3 Ericsson imported from 3GU
R5‑211885 Addition of DC_26A_n41A in test case 7.3B.2.3 Ericsson imported from 3GU
R5‑211886 Addition of DC_26A_n77A and DC_26A_n78A in test case 7.3B.2.3 Ericsson imported from 3GU
R5‑211887 Addition of DC_26A_n79A in test case 7.3B.2.3 Ericsson imported from 3GU
R5‑211888 Addition of DC_41A_n77A and DC_41A_n78A in test case 7.3B.2.3 Ericsson imported from 3GU
R5‑211889 Update TT results for 6.3.1.1 ROHDE & SCHWARZ imported from 3GU
R5‑211890 Update TT results for 6.3.1.1 Annex F ROHDE & SCHWARZ imported from 3GU
R5‑211891 Updating the value of PLTE for EN-DC test cases Huawei, HiSilicon imported from 3GU
R5‑211892 Correct 6.3.1.1 TT analysis ROHDE & SCHWARZ imported from 3GU
R5‑211893 Update of test point analysis for FR2 MPR, SEM and ACLR test cases Keysight Technologies UK Ltd, Ericsson, CAICT imported from 3GU
R5‑211894 Addition of reference sensitivity test point analyses for FR1 NR CA and EN-DC Ericsson, Huawei, Hisilicon imported from 3GU
R5‑211895 Moving of principles for reference sensitivity test point selection from attachments to annexes Ericsson imported from 3GU
R5‑211896 TP analysis update for EN_DC refsens Ericsson imported from 3GU
R5‑211897 TP analysis for DC_8A_n77A Ericsson imported from 3GU
R5‑211898 TP analysis for DC_11A_n79A Ericsson imported from 3GU
R5‑211899 TP analysis for DC_26A_n41A Ericsson imported from 3GU
R5‑211900 TP analysis for DC_26A_n77A and DC_26A_n78A Ericsson imported from 3GU
R5‑211901 TP analysis for DC_26A_n79A Ericsson imported from 3GU
R5‑211902 TP analysis for DC_41A_n77A and DC_41A_n78A Ericsson imported from 3GU
R5‑211903 Addition of new test case 6.6.2.2_s A-SEM for sTTI Huawei, HiSilicon imported from 3GU
R5‑211904 Updating UE capability for Rel-16 NR inter-band CA configurations for band n1 DOCOMO Communications Lab. imported from 3GU
R5‑211905 Introduction of DC_1A-28A_n3A to reference sensitivity test Ericsson imported from 3GU
R5‑211906 Reference sensitivity TP analysis for DC_1A-28A_n3A Ericsson imported from 3GU
R5‑211907 Reference sensitivity analysis for DC_3A-7A_n1A Ericsson imported from 3GU
R5‑211908 Reference sensitivity TP analysis for DC_7A-20A_n1A Ericsson imported from 3GU
R5‑211909 Reference sensitivity TP analysis for DC_7A-28A_n3A Ericsson imported from 3GU
R5‑211910 Adding PICS for UL switching Huawei, HiSilicon imported from 3GU
R5‑211911 Adding NR test case-Time mask for Uplink carriers switching Huawei, Hisilicon imported from 3GU
R5‑211912 Adding MU and TT for Uplink carriers switching testing Huawei, Hisilicon imported from 3GU
R5‑211913 Adding test applicability for switching test case Huawei, HiSilicon imported from 3GU
R5‑211914 Adding TP analysis for NR test case-Time mask for UL carrier switching Huawei, Hisilicon imported from 3GU
R5‑211915 Adding additional TP for half Pi BPSK DMRS to MPR test case for SUL Huawei, HiSilicon imported from 3GU
R5‑211916 Adding new test case 6.3.2.2.4, 2Rx TDD FR1 Single PMI with 32Tx Type1 - SinglePanel codebook for both SA and NSA Ericsson imported from 3GU
R5‑211917 Addition of new RRM test cases to the applicability table in 4.2 Ericsson imported from 3GU
R5‑211918 Applicability for RRM NR HST test case 6.1.1.7 and 6.6.1.7 CMCC imported from 3GU
R5‑211919 Introduction of FR2 DL 256QAM Nokia, Nokia Shanghai Bell imported from 3GU
R5‑211920 Correction to A-MPR test requirement of NS_22 in TC 6.2.4 Anritsu imported from 3GU
R5‑211921 Correction to ACLR relaxation value in TC 6.5.2.3 Anritsu imported from 3GU
R5‑211922 MU and TT definition for REFSENS FR2 CA test cases Keysight Technologies UK Ltd imported from 3GU
R5‑211923 Update FR2 MU and TT in 38.521-2 Anritsu imported from 3GU
R5‑211924 CR to 38.521-2 on PC1 Measurement Grid MUs Keysight Technologies UK Ltd imported from 3GU
R5‑211925 Update of ETC MTSU ROHDE & SCHWARZ imported from 3GU
R5‑211926 MU definition for UE MOP for Inter-Band EN-DC including FR2 (3CCs) Keysight Technologies UK Ltd imported from 3GU
R5‑211927 MU and TT defintion for REFSENS EN-DC including FR2 up to 5CCs Keysight Technologies UK Ltd imported from 3GU
R5‑211928 Update FR2 MU and TT in 38.521-3 Anritsu imported from 3GU
R5‑211929 Update of FR2 demod test cases ROHDE & SCHWARZ imported from 3GU
R5‑211930 Adjacent Channel Selectivity FR2 MU definition in 38.903 Keysight Technologies UK Ltd imported from 3GU
R5‑211931 In-band Blocking FR2 MU definition in 38.903 Keysight Technologies UK Ltd imported from 3GU
R5‑211932 Update on FR2 Blocking Test MU Anritsu imported from 3GU
R5‑211933 Update MU for FR2 RRM Anritsu imported from 3GU
R5‑211934 Update FR2 MU and TT in 38.903 Anritsu imported from 3GU
R5‑211935 CR to 38.903 on ETC Testing Keysight Technologies UK Ltd imported from 3GU
R5‑211936 Update of demod SNR testability ROHDE & SCHWARZ imported from 3GU
R5‑211937 Discussion on equal PSD and PCC prioritization for UL CA test Guangdong OPPO Mobile Telecom. imported from 3GU
R5‑211938 Discussion on the uplink power configuration for EN-DC RF cases Huawei, HiSilicon imported from 3GU
R5‑211939 Discussion on test coverage for reference sensitivity for EN-DC configs with exceptions Huawei, HiSilicon imported from 3GU
R5‑211940 Discussion on test points for EN-DC refsens with exception avoiding Ericsson imported from 3GU
R5‑211941 Discussion on PCC prioritization for FR1 and FR2 UL CA testing Qualcomm Finland RFFE Oy imported from 3GU
R5‑211942 Test case structure updates for CA PDSCH Demodulation test cases Qualcomm Wireless GmbH imported from 3GU
R5‑211943 On ACS and IBB FR2 MU definition Keysight Technologies UK Ltd imported from 3GU
R5‑211944 On the QoQZ standard deviation for ETC testing ROHDE & SCHWARZ imported from 3GU
R5‑211945 On MU for FR2 Blocker Test Anritsu imported from 3GU
R5‑211946 On FR2 OBW MU Anritsu imported from 3GU
R5‑211947 Input on fading crest factor margin for FR2 Demodulation test cases Qualcomm Wireless GmbH imported from 3GU
R5‑211948 On Additional Spurious emissions Keysight Technologies UK Ltd imported from 3GU
R5‑211949 On Larger Quiet Zone Sizes with Grey Box Keysight Technologies UK Ltd imported from 3GU
R5‑211950 On the achievable SNR for demod test cases ROHDE & SCHWARZ imported from 3GU
R5‑211951 Discussion about n259 OBW relaxation DOCOMO Communications Lab. imported from 3GU

page generated from database: 2025-11-03 03:11:01

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