The 5G Standard

3GPP TDocs (written contributions) at meeting

Meeting: R5-50b - 2011-04-06 to 2011-04-07, Munich

meeting id: R5-50b (click id for more info on this meeting)

Click on the Tdoc to open its file.

TDoc Title Source Remarks
R5‑111000 Agenda Rapporteur (Spirent) imported from 3GU
R5‑111001 RAN5#50bis Session Programme Rapporteur imported from 3GU
R5‑111002 RAN#51 Meeting - UE Application Layer Data Throughput Performance Status Report (Copy of RP-110104) Rapporteur imported from 3GU
R5‑111003 RAN5 Status Report to previous Plenary WG Chairman imported from 3GU
R5‑111004 Meeting Schedule RAN5 WG Chairman imported from 3GU
R5‑111005 Work Plan for FS_UE_App_Data_Perf (UE Application Layer Data Throughput Performance) Rapporteur (Spirent) imported from 3GU
R5‑111006 Work Plan for FS_UE_App_Data_Perf (UE Application Layer Data Throughput Performance) after RAN5 #50bis Rapporteur (Spirent) imported from 3GU
R5‑111007 A-GNSS test model MCC TF160 imported from 3GU
R5‑111008 Test system uncertainties and test tolerances in application layer data throughput testers Renesas Electronics Europe imported from 3GU
R5‑111009 TP for TR 37.901 on test system uncertainties and test tolerances Renesas Electronics Europe imported from 3GU
R5‑111010 TP for TR 37.901 on Impact of Modem Performance on UE Data Throughput Testing Renesas Electronics Europe imported from 3GU
R5‑111011 TP for TR 37.901 on UTRA/UTRAN Test Procedure Structure and Content for Tethered Operation Spirent Communications imported from 3GU
R5‑111012 TP for TR 37.901 on E-UTRA/E-UTRAN Test Procedure Structure and Content for Tethered Operation for UDP Downlink Tests Spirent Communications imported from 3GU
R5‑111013 TR 37.901 after RAN5 #50bis Rapporteur (Spirent) imported from 3GU
R5‑111014 Test conditions for the UE application-layer data throughput measurements Ericsson, ST-Ericsson imported from 3GU
R5‑111015 Discussion on RF/modem Conditions for Performance Testing Panasonic imported from 3GU
R5‑111016 Discussion on the sub-title of test procedure in TR 37.901 Panasonic imported from 3GU
R5‑111017 Discussion and text proposal for TR 37.901 on specification of test environment and test configurations for UE application-layer data throughput measurements Ericsson, ST-Ericsson imported from 3GU
R5‑111018 Consideration of MAC-hs scheduler for UE Application Layer Data Throughput Performance Korea Testing Laboratory imported from 3GU
R5‑111019 Discussion and text proposal for E-UTRA/E-UTRAN Test Procedures NTT DOCOMO, INC. imported from 3GU
R5‑111020 MAC-(e)hs scheduler for UE Application Layer Data Throughput Korea Testing Laboratory imported from 3GU
R5‑111021 Discussion Paper on Test Integration of UE supporting non-tethered mode only Rohde & Schwarz imported from 3GU
R5‑111022 Invitation to RAN5 #51 meeting WG Chairman imported from 3GU
R5‑111023 Adding information for MIMO throughput measurement KTL, MTCC imported from 3GU
R5‑111024 TP for TR 37.901 on Definition of UE Application Layer Data Throughput Spirent Communications imported from 3GU
R5‑111025 TP for TR 37.901 on Parameters for Measurement Spirent Communications imported from 3GU
R5‑111026 TP for TR 37.901 on Test Configurations Spirent Communications imported from 3GU
R5‑111027 TP for TR 37.901 on Transport and Application Layer Protocols Spirent Communications imported from 3GU
R5‑111028 TP for TR 37.901 on Test Environment Spirent Communications imported from 3GU
R5‑111029 TP for TR 37.901 on Data Transfer Scenarios Spirent Communications imported from 3GU
R5‑111030 Discussion and text proposal on Uplink configuration for UTRA FTP Downlink test cases Qualcomm Incorporated imported from 3GU
R5‑111031 Discussion and text proposal on test configuration for UE Application Layer Data Throughput Performance testing Qualcomm Incorporated imported from 3GU
R5‑111032 Criteria for Study Item Completion Nokia imported from 3GU
R5‑111033 MAC-(e)hs scheduler for UE Application Layer Data Throughput Korea Testing Laboratory imported from 3GU
R5‑111034 draft ETSI TR on concepts & terminology of performance test MCC TF160 imported from 3GU
R5‑111035 Test system uncertainties and test tolerances in application layer data throughput testers Renesas Electronics Europe -
R5‑111036 Meeting Schedule RAN5 WG Chairman -
R5‑111037 Consideration of MAC-hs scheduler for UE Application Layer Data Throughput Performance Korea Testing Laboratory -
R5‑111038 Adding information for MIMO throughput measurement KTL, MTCC -
R5‑111039 TP for TR 37.901 on Parameters for Measurement Spirent Communications -
R5‑111040 Discussion and text proposal on Uplink configuration for UTRA FTP Downlink test cases Qualcomm Incorporated -
R5‑111041 Test conditions for the UE application-layer data throughput measurements Ericsson, ST-Ericsson -
R5‑111042 Discussion and text proposal for TR 37.901 on specification of test environment and test configurations for UE application-layer data throughput measurements Ericsson, ST-Ericsson -
R5‑111043 Discussion and text proposal on test configuration for UE Application Layer Data Throughput Performance testing Qualcomm Incorporated -
R5‑111044 TP for TR 37.901 on Definition of UE Application Layer Data Throughput Spirent Communications -
R5‑111045 TP for TR 37.901 on Test Configurations Spirent Communications -
R5‑111046 TP for TR 37.901 on Impact of Modem Performance on UE Data Throughput Testing Renesas Electronics Europe -
R5‑111047 TP for TR 37.901 on Test Environment Spirent Communications -
R5‑111048 Discussion and text proposal for E-UTRA/E-UTRAN Test Procedures NTT DOCOMO, INC. -
R5‑111049 TP for TR 37.901 on test system uncertainties and test tolerances Renesas Electronics Europe -
R5‑111050 TP for TR 37.901 on Transport and Application Layer Protocols Spirent Communications -
R5‑111051 TP for TR 37.901 on UTRA/UTRAN Test Procedure Structure and Content for Tethered Operation Spirent Communications -
R5‑111052 draft RAN5#50bis meeting report ETSI Secretary -

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